"Backside Flip-Chip testing by means of high-bandwidth luminescence detection."

Alberto Tosi et al. (2003)

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DOI: 10.1016/S0026-2714(03)00302-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova:
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. Microelectron. Reliab. 43(9-11): 1669-1674 (2003)

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