"A novel stability and process sensitivity driven model for optimal sized ..."

Nandakishor Yadav et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.05.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nandakishor Yadav, Shikha Jain, Manisha Pattanaik, G. K. Sharma:
A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectron. Reliab. 55(8): 1131-1143 (2015)

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