"Biometric perils and patches."

Ruud M. Bolle, Jonathan H. Connell, Nalini K. Ratha (2002)

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DOI: 10.1016/S0031-3203(01)00247-3

access: closed

type: Journal Article

metadata version: 2020-02-24

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Ruud M. Bolle, Jonathan H. Connell, Nalini K. Ratha:
Biometric perils and patches. Pattern Recognit. 35(12): 2727-2738 (2002)

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