"Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations ..."

Menghua Jia et al. (2022)

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DOI: 10.1109/TCAD.2021.3134900

access: closed

type: Journal Article

metadata version: 2022-11-13

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Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen:
Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4797-4807 (2022)

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