"Scan to Nonscan Conversion via Test Cube Analysis."

Ozgur Sinanoglu (2013)

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DOI: 10.1109/TCAD.2012.2218603

access: closed

type: Journal Article

metadata version: 2020-12-29

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Ozgur Sinanoglu:
Scan to Nonscan Conversion via Test Cube Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 289-300 (2013)

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