"Fault simulation and test algorithm generation for random accessmemories."

Chi-Feng Wu et al. (2002)

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DOI: 10.1109/43.992771

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu:
Fault simulation and test algorithm generation for random accessmemories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(4): 480-490 (2002)

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