"Code-width testing-based compact ADC BIST circuit."

Dongmyung Lee et al. (2004)

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DOI: 10.1109/TCSII.2004.836034

access: closed

type: Journal Article

metadata version: 2020-05-27

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Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang:
Code-width testing-based compact ADC BIST circuit. IEEE Trans. Circuits Syst. II Express Briefs 51-II(11): 603-606 (2004)

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