"Random Beam Switching: A Physical Layer Key Generation Approach to ..."

Ying Ju et al. (2023)

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DOI: 10.1109/TCE.2023.3273125

access: closed

type: Journal Article

metadata version: 2023-08-31

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  - https://dblp.org/rec/journals/tce/JuZBLPWO23
Ying Ju, Guoxue Zou, Haowen Bai, Lei Liu, Qingqi Pei, Celimuge Wu, Sattam Al Otaibi:
Random Beam Switching: A Physical Layer Key Generation Approach to Safeguard mmWave Electronic Devices. IEEE Trans. Consumer Electron. 69(3): 594-607 (2023)

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