"A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices."

Binbin Zhao et al. (2022)

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DOI: 10.1109/TDSC.2020.3037908

access: closed

type: Journal Article

metadata version: 2024-06-20

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Binbin Zhao, Shouling Ji, Wei-Han Lee, Changting Lin, Haiqin Weng, Jingzheng Wu, Pan Zhou, Liming Fang, Raheem Beyah:
A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices. IEEE Trans. Dependable Secur. Comput. 19(3): 1826-1840 (2022)

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