"A New PUF Based Lock and Key Solution for Secure In-Field Testing of ..."

Aijiao Cui et al. (2021)

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DOI: 10.1109/TETC.2019.2903387

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type: Journal Article

metadata version: 2023-08-28

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Aijiao Cui, Chip-Hong Chang, Wei Zhou, Yue Zheng:
A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips. IEEE Trans. Emerg. Top. Comput. 9(2): 1095-1105 (2021)

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