"Modeling of Machining Errors' Accumulation Driven by RFID Graphical ..."

Pulin Li, Pingyu Jiang, Wei Guo (2021)

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DOI: 10.1109/TII.2020.3014950

access: closed

type: Journal Article

metadata version: 2021-10-14

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Pulin Li, Pingyu Jiang, Wei Guo:
Modeling of Machining Errors' Accumulation Driven by RFID Graphical Deduction Computing in Multistage Machining Processes. IEEE Trans. Ind. Informatics 17(6): 3971-3981 (2021)

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