"Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among ..."

Yanjun Li et al. (2019)

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DOI: 10.1145/3308566

access: closed

type: Journal Article

metadata version: 2019-08-07

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Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev:
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements. ACM Trans. Design Autom. Electr. Syst. 24(4): 45:1-45:16 (2019)

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