default search action
"Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC ..."
Hongbin Sun et al. (2016)
- Hongbin Sun, Wenzhe Zhao, Minjie Lv, Guiqiang Dong, Nanning Zheng, Tong Zhang:
Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC Decoding for MLC NAND Flash-Based Storage in Mobile Device. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2654-2664 (2016)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.