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2020 – today
- 2023
[c4]Giovanni Di Nuzzo
, Horst Lewitschnig, Marc Tuellmann, Sven Rzepka, Alexander Otto:
A Data-driven Condition Monitoring method to predict the Remaining Useful Life of SiC Power Modules for Traction Inverters. ICPHM 2023: 312-319- 2021
- [j8]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Flexible time reduction method for burn-in of high-quality products. Qual. Reliab. Eng. Int. 37(6): 2900-2915 (2021) - [c3]Franz Wotawa, Horst Lewitschnig:
Monitoring Hierarchical Systems for Safety Assurance. IDC 2021: 331-340 - 2020
- [c2]Wolfgang Granig, Stefan Jaksic, Horst Lewitschnig, Cristinel Mateis, Dejan Nickovic:
Weakness Monitors for Fail-Aware Systems. FORMATS 2020: 283-299
2010 – 2019
- 2019
- [j7]Horst Lewitschnig, Armin Fanzott:
Fractional Failures Sampling - An Alternative to Zero Failures Sampling Plans. IEEE Trans. Reliab. 68(2): 609-619 (2019) - 2017
- [j6]Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak:
Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Qual. Reliab. Eng. Int. 33(8): 2673-2683 (2017) - 2015
- [j5]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
An advanced area scaling approach for semiconductor burn-in. Microelectron. Reliab. 55(1): 129-137 (2015) - [j4]Horst Lewitschnig:
Advances on the Stress Interaction Model. IEEE Trans. Reliab. 64(1): 528-534 (2015) - 2014
- [j3]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Qual. Reliab. Eng. Int. 30(3): 363-373 (2014) - [j2]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. IEEE Trans. Reliab. 63(2): 583-592 (2014) - [c1]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. WSC 2014: 2600-2608 - 2011
- [j1]Verena Müller, Horst Lewitschnig, Nicoleta Kortik, Werner Kanert:
Quality assurance in automotive electronics. Elektrotech. Informationstechnik 128(10): 371-374 (2011)
Coauthor Index
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