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2020 – today
- 2024
[c54]Rajarshi Roy Chaudhuri, Vipin Joshi, Saniya S. Wani, Simran R. Karthik, Rasik Rashid Malik, Mayank Shrivastava:
Experimental Insights into the Role of Inter-valley and Defect Transitions of Hot Electrons in Determining Self-heating in AlGaN/GaN HEMTs. IRPS 2024: 1-6- [c53]Mitesh Goyal, Mukesh Chaturvedi, Raju Kumar, Mahesh Vaidya, Mayank Shrivastava:
Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices. IRPS 2024: 1-6 - [c52]Mitesh Goyal, Mukesh Chaturvedi, Raju Kumar, Mahesh Vaidya, Mayank Shrivastava:
Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. IRPS 2024: 1-6 - [c51]Jeevesh Kumar, Aadil Bashir Dar, Asif A. Shah, K. M. Amogh, Sumana Chattaraj, Utpreksh Patbhaje, Anand Kumar Rai, Rupali Verma, Mayank Shrivastava:
Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders. IRPS 2024: 1-5 - [c50]Mehak Ashraf Mir, A. Thakare, Mohammad Ateeb Munshi, V. Avinash, Saniya S. Wani, Zubear Khan, Rajarshi Roy Chaudhuri, Simran R. Karthik, Rasik Rashid Malik, Vipin Joshi, Mayank Shrivastava:
On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN/GaN HEMTs. IRPS 2024: 1-5 - [c49]Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Aadil Bashir Dar, Mayank Shrivastava:
Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs. IRPS 2024: 1-7 - [c48]Asif A. Shah, Rupali Verma, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Jeevcsh Kumar, Anand Kumar Rai, Sumana Chattaraj, Mayank Shrivastava:
Electric Field Coupled Molecular Dynamic Insights into Anisotropic Reliability Issues of Monolayer MoS2 Based 2D FETs. IRPS 2024: 1-4 - [c47]Rupali Verma, Utpreksh Patbhaje, Asif Altaf Shah, Jeevesh Kumar, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Mayank Shrivastava:
Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs. IRPS 2024: 74 - 2023
- [c46]Ivan Lau, Yan Hao Ling, Mayank Shrivastava, Jonathan Scarlett:
Max-Quantile Grouped Infinite-Arm Bandits. ALT 2023: 909-945 - [c45]Pradumn Mishra
, Mayank Shrivastava, Urja Jain, Abhisek Omkar Prasad, Suresh Chandra Satapathy:
Multi-attention TransUNet - A Transformer Approach for Image Description Generation. FICTA (1) 2023: 21-34 - [c44]Rajarshi Roy Chaudhuri, Vipin Joshi, Amratansh Gupta, Tanmay Joshi, Rasik Rashid Malik, Mehak Ashraf Mir, Sayak Dutta Gupta, Mayank Shrivastava:
Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences. IRPS 2023: 1-5 - [c43]Satendra Kumar Gautam, Harsha B. Variar, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava:
3D Approaches to Engineer Holding Voltage of SCR. IRPS 2023: 1-4 - [c42]Jatin, M. Monishmurali, Mayank Shrivastava:
Multi-finger turn-on: A potential cause of premature failure in Drain Extended HV Nanosheet Devices. IRPS 2023: 1-4 - [c41]Vipin Joshi, Sayak Dutta Gupta, Rajarshi Roy Chaudhuri, Mayank Shrivastava:
Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer. IRPS 2023: 1-4 - [c40]Jeevesh Kumar, Hemanjaneyulu Kuruva, Harsha B. Variar, Utpreksh Patbhaje, Mayank Shrivastava:
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. IRPS 2023: 1-6 - [c39]Rasik Rashid Malik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mehak Ashraf Mir, Zubear Khan, Avinas N. Shaji, Madhura Bhattacharya, Anup T. Vitthal, Mayank Shrivastava:
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. IRPS 2023: 1-4 - [c38]Mehak Ashraf Mir, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Rasik Rashid Malik, Mayank Shrivastava:
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. IRPS 2023: 1-6 - [c37]Aakanksha Mishra, Boeila Sampath Kumar, M. Monishmurali, Shaik Ahamed Suzaad, Shubham Kumar, Kiran Pote Sanjay, Amit Kumar Singh, Ankur Gupta, Mayank Shrivastava:
Extremely Large Breakdown to Snapback Voltage Offset $(\mathrm{V}_{\mathrm{t}1} > > \mathrm{V}_{\text{BD}})$: Another Way to Improve ESD Resilience of LDMOS Devices. IRPS 2023: 1-5 - [c36]M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava:
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. IRPS 2023: 1-5 - [c35]Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava:
Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs. IRPS 2023: 1-6 - [c34]Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava:
Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors. IRPS 2023: 1-4 - [c33]Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava:
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes. IRPS 2023: 1-4 - [c32]Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava:
Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. IRPS 2023: 1-5 - [c31]Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava:
OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State. IRPS 2023: 1-5 - [c30]Susheel Suresh, Mayank Shrivastava, Arko Mukherjee, Jennifer Neville, Pan Li:
Expressive and Efficient Representation Learning for Ranking Links in Temporal Graphs. WWW 2023: 567-577 - 2022
- [j1]Ankit Soni, Mayank Shrivastava:
Implications of Various Charge Sources in AlGaN/GaN Epi-Stack on the Drain & Gate Connected Field Plate Design in HEMTs. IEEE Access 10: 74533-74541 (2022) - [c29]Jeevesh Kumar, Mayank Shrivastava:
Are Argon and Nitrogen Gases Really Inert to Graphene Devices? DRC 2022: 1-2 - [c28]M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava:
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. IRPS 2022: 6 - [i3]Ivan Lau, Yan Hao Ling, Mayank Shrivastava, Jonathan Scarlett:
Max-Quantile Grouped Infinite-Arm Bandits. CoRR abs/2210.01295 (2022) - [i2]Susheel Suresh, Danny Godbout, Arko Mukherjee, Mayank Shrivastava, Jennifer Neville, Pan Li:
Federated Graph Representation Learning using Self-Supervision. CoRR abs/2210.15120 (2022) - [i1]Pin-Jung Chen, Sahil Bhatnagar, Sagar Goyal, Damian Konrad Kowalczyk, Mayank Shrivastava:
CASPR: Customer Activity Sequence-based Prediction and Representation. CoRR abs/2211.09174 (2022) - 2021
- [c27]M. Monishmurali, Mayank Shrivastava:
Peculiar Current Instabilities & Failure Mechanism in Vertically Stacked Nanosheet ggN-FET. IRPS 2021: 1-5 - [c26]M. Monishmurali, Mayank Shrivastava:
A Novel High Voltage Drain Extended FinFET SCR for SoC Applications. IRPS 2021: 1-4 - 2020
- [c25]Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava:
Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight. DRC 2020: 1-2 - [c24]Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava:
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. IRPS 2020: 1-4 - [c23]Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava:
On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. IRPS 2020: 1-4 - [c22]Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. IRPS 2020: 1-6 - [c21]Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS 2020: 1-5 - [c20]Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava:
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. IRPS 2020: 1-4 - [c19]M. Monishmurali, Milova Paul, Mayank Shrivastava:
Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs. IRPS 2020: 1-6 - [c18]Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava:
Threshold Voltage Shift in a-Si: H Thin film Transistors under ESD stress Conditions. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c17]Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava:
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. IRPS 2019: 1-5 - [c16]Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. IRPS 2019: 1-5 - [c15]Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. IRPS 2019: 1-5 - [c14]Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava:
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. IRPS 2019: 1-6 - 2018
- [c13]Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava:
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS 2018: 3 - [c12]Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS 2018: 3 - [c11]Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava:
On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications. IRPS 2018: 3 - [c10]Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava:
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. IRPS 2018: 4 - [c9]Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, Heena Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava:
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS 2018: 4 - [c8]Jean-François Im, Kishore Gopalakrishna, Subbu Subramaniam, Mayank Shrivastava, Adwait Tumbde, Xiaotian Jiang, Jennifer Dai, Seunghyun Lee, Neha Pawar, Jialiang Li, Ravi Aringunram:
Pinot: Realtime OLAP for 530 Million Users. SIGMOD Conference 2018: 583-594 - [c7]Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava:
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. VLSID 2018: 469-470 - 2017
- [c6]Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava:
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSID 2017: 361-365 - [c5]Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSID 2017: 391-394 - [c4]Adil Meersha, B. Sathyajit, Mayank Shrivastava:
A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET. VLSID 2017: 437-440 - 2016
- [c3]Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao:
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSID 2016: 156-161 - 2015
- [c2]Mayank Shrivastava, Maitreya Natu, Vaishali P. Sadaphal:
Towards predictable and risk-free enterprise systems. DSAA 2015: 1-7 - 2011
- [c1]Jitendra Ajmera, Anupam Joshi, Sougata Mukherjea, Nitendra Rajput, Shrey Sahay, Mayank Shrivastava, Kundan Srivastava:
Two-stream indexing for spoken web search. WWW (Companion Volume) 2011: 503-512
Coauthor Index
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