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Jihun Jung
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2020 – today
- 2020
- [j5]Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park:
CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience. IEEE Access 8: 22400-22410 (2020)
2010 – 2019
- 2018
- [j4]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(8): 1681-1691 (2018) - [j3]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Erratum to "Time-Multiplexed-Network for Test Cost Reduction". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1912 (2018) - [c7]Min-Kook Choi, Jaehyeong Park, Jihun Jung, Heechul Jung, Jin-Hee Lee, Woong-Jae Won, Woo Young Jung, Jincheol Kim, Soon Kwon:
Co-Occurrence Matrix Analysis-Based Semi-Supervised Training for Object Detection. ICIP 2018: 1333-1337 - [c6]Soon Kwon, Jaehyeong Park, Heechul Jung, Jihun Jung, Min-Kook Choi, Iman Rahmansyah Tayibnapis, Jin-Hee Lee, Woong-Jae Won, Sung-Hoon Youn, Kwang-Hoe Kim, Tae Hun Kim:
Framework for Evaluating Vision-based Autonomous Steering Control Model. ITSC 2018: 1310-1316 - [i1]Min-Kook Choi, Jaehyeong Park, Jihun Jung, Heechul Jung, Jin-Hee Lee, Woong-Jae Won, Woo Young Jung, Jincheol Kim, Soon Kwon:
Co-occurrence matrix analysis-based semi-supervised training for object detection. CoRR abs/1802.06964 (2018) - 2017
- [j2]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017) - [c5]Heechul Jung, Min-Kook Choi, Jihun Jung, Jin-Hee Lee, Soon Kwon, Woo Young Jung:
ResNet-Based Vehicle Classification and Localization in Traffic Surveillance Systems. CVPR Workshops 2017: 934-940 - 2016
- [j1]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-multiplexed test access architecture for stacked integrated circuits. IEICE Electron. Express 13(14): 20160314 (2016) - 2015
- [c4]Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park:
Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. ATS 2015: 121-126 - [c3]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS 2015: 1-2 - 2011
- [c2]Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park:
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. Asian Test Symposium 2011: 335-340
2000 – 2009
- 2008
- [c1]Jihun Jung, Mohammad Abaii, Rahim Tafazolli:
Load Matrix Optimization in Mobile Cellular Networks. VTC Spring 2008: 2016-2020
Coauthor Index
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