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2020 – today
- 2024
[j10]Sookeun Song
, Taegeun Kang, Kyungtae Lim, Konmin Kim, Hyunbean Yi:
Sow Posture Analysis and Estrus Prediction Using Closed-Circuit Television Cameras. IEEE Access 12: 17460-17466 (2024)
2010 – 2019
- 2017
- [j9]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017) - 2015
- [c10]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS 2015: 1-2 - 2012
- [j8]Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
A Failure Prediction Strategy for Transistor Aging. IEEE Trans. Very Large Scale Integr. Syst. 20(11): 1951-1959 (2012) - 2010
- [j7]Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park:
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs 57-II(7): 561-565 (2010) - [j6]Hyunbean Yi, Sungju Park, Sandip Kundu:
On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(7): 1608-1617 (2010) - [c9]Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
Aging test strategy and adaptive test scheduling for SoC failure prediction. IOLTS 2010: 21-26
2000 – 2009
- 2009
- [j5]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(1): 56-60 (2009) - [j4]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(3): 554-565 (2009) - [j3]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(5): 419-423 (2009) - 2008
- [j2]Hyunbean Yi, Jaehoon Song, Sungju Park:
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57(5): 1071-1078 (2008) - [c8]Hyunbean Yi, Sungju Park, Sandip Kundu:
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS 2008: 289-294 - [c7]Hyunbean Yi, Sandip Kundu:
Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. DFT 2008: 412-420 - 2007
- [c6]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference 2007: 139-150 - [c5]Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS 2007: 193-198 - [c4]Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park:
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS 2007: 375-380 - 2006
- [j1]Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2605-2608 (2006) - [c3]Hyunbean Yi, Jaehoon Song, Sungju Park:
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC 2006: 1-7 - 2005
- [c2]Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park:
Hybrid test data compression technique for SOC scan testing. SoCC 2005: 69-72 - 2003
- [c1]Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon:
An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. Human.Society@Internet 2003 2003: 272-281
Coauthor Index
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last updated on 2024-04-24 22:51 CEST by the dblp team
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