"Test generation for open and delay faults in CMOS circuits."

Cheng-Hung Wu, Kuen-Jong Lee, Sudhakar M. Reddy (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097104

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-13

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Cheng-Hung Wu, Kuen-Jong Lee, Sudhakar M. Reddy:
Test generation for open and delay faults in CMOS circuits. ITC-Asia 2017: 21-26

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