"Symptom reliability: S-parameters evaluation of power laterally ..."

Mohamed Ali Belaïd (2018)

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DOI: 10.1049/IET-CDS.2018.0005

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type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd:
Symptom reliability: S-parameters evaluation of power laterally diffused-metal-oxide-semiconductor field-effect transistor after pulsed-RF life tests for a radar application. IET Circuits Devices Syst. 12(5): 571-578 (2018)

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