"Dependence of current match on back-gate bias in weakly inverted MOS ..."

Ming-Jer Chen, Jih-Shin Ho, Tzuen-Hsi Huang (1996)

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DOI: 10.1109/4.488004

access: closed

type: Journal Article

metadata version: 2022-07-18

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Ming-Jer Chen, Jih-Shin Ho, Tzuen-Hsi Huang:
Dependence of current match on back-gate bias in weakly inverted MOS transistors and its modeling. IEEE J. Solid State Circuits 31(2): 259-262 (1996)

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