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"Low-Cost Scan Test for IEEE-1500-Based SoC."
Hyunbean Yi, Jaehoon Song, Sungju Park (2008)
- Hyunbean Yi, Jaehoon Song, Sungju Park:
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57(5): 1071-1078 (2008)
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