"A Failure Prediction Strategy for Transistor Aging."

Hyunbean Yi et al. (2012)

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DOI: 10.1109/TVLSI.2011.2165304

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/YiYISKF12
Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
A Failure Prediction Strategy for Transistor Aging. IEEE Trans. Very Large Scale Integr. Syst. 20(11): 1951-1959 (2012)

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