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Computer Science > Computer Vision and Pattern Recognition

arXiv:2211.08030 (cs)
[Submitted on 15 Nov 2022]

Title:State of the Art of Quality Assessment of Facial Images

Authors:Johannes Merkle (1), Christian Rathgeb (1), Benjamin Tams (1), Dhay-Parn Lou (1), André Dörsch (1), Pawel Drozdowski (1) ((1) secunet Security Networks AG)
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Abstract:The goal of the project "Facial Metrics for EES" is to develop, implement and publish an open source algorithm for the quality assessment of facial images (OFIQ) for face recognition, in particular for border control scenarios.1 In order to stimulate the harmonization of the requirements and practices applied for QA for facial images, the insights gained and algorithms developed in the project will be contributed to the current (2022) revision of the ISO/IEC 29794-5 standard. Furthermore, the implemented quality metrics and algorithms will consider the recommendations and requirements from other relevant standards, in particular ISO/IEC 19794-5:2011, ISO/IEC 29794-5:2010, ISO/IEC 39794-5:2019 and Version 5.2 of the BSI Technical Guideline TR-03121 Part 3 Volume 1. In order to establish an informed basis for the selection of quality metrics and the development of corresponding quality assessment algorithms, the state of the art of methods and algorithms (defining a metric), implementations and datasets for quality assessment for facial images is surveyed. For all relevant quality aspects, this document summarizes the requirements of the aforementioned standards, known results on their impact on face recognition performance, publicly available datasets, proposed methods and algorithms and open source software implementations.
Comments: This report has been created as part of the Project P 527 - Facial Metrics for EES (EESFM) of the Federal Office for Information Security
Subjects: Computer Vision and Pattern Recognition (cs.CV)
Cite as: arXiv:2211.08030 [cs.CV]
  (or arXiv:2211.08030v1 [cs.CV] for this version)
  https://doi.org/10.48550/arXiv.2211.08030

Submission history

From: Johannes Merkle [view email]
[v1] Tue, 15 Nov 2022 10:30:58 UTC (4,916 KB)
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