A new analog-to-digital converter BIST considering a transient zone
A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed
method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity)
errors with a low hardware overhead. Moreover, it can solve a transient zone problem which
is derived from the ADC noise in real test environments.
method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity)
errors with a low hardware overhead. Moreover, it can solve a transient zone problem which
is derived from the ADC noise in real test environments.
A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.
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