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Stanford Advanced Materials {{item.label}}
Stanford Advanced Materials
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Stanford Advanced Materials {{item.label}}
Analytical Services

Stanford Advanced Materials (SAM) offers comprehensive Analytical Services, including Dimensional Inspection, Electrical Conductance Testing, and Grain Size Determination. Our advanced lab is equipped with cutting-edge instruments for tests like GDMS, ICP-MS, and ICP-OES.

We also provide Mechanical Properties testing using SEM, TEM, and X-Ray Diffraction (XRD) Analysis, delivering precise insights into material behavior. With a commitment to quality and accuracy, SAM is your trusted partner for reliable testing and analysis services.

FULL LIST OF SERVICES

Dimensional Inspection
Dimensional Inspection ensures precise measurement and verification of component dimensions to meet exact specifications.
Electrical Conductance Testing
Electrical Conductance Testing measures the ability of materials to conduct electrical current, ensuring optimal performance in electrical applications.
GDMS
GDMS (Glow Discharge Mass Spectrometry) provides precise elemental analysis of solid materials, detecting trace and bulk elements for quality control and material verification.
Grain Size Determination
Grain Size Determination analyzes the microstructure of materials to assess grain size, impacting material strength and performance.
ICP-MS
ICP-MS (Inductively Coupled Plasma Mass Spectrometry) is a highly sensitive technique used to detect and quantify trace elements in various materials.
ICP-OES
ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy) is a technique used for the precise detection and analysis of multiple elements in a sample through light emission.
Mechanical Properties
Mechanical Properties testing evaluates a material's strength, elasticity, hardness, and durability to ensure it meets performance requirements.
SEM
SEM (Scanning Electron Microscopy) provides detailed imaging of material surfaces at high magnifications for precise structural analysis.
TEM
TEM (Transmission Electron Microscopy) offers high-resolution imaging of material structures at the atomic level for in-depth analysis.
X-Ray Diffraction (XRD) Analysis
X-Ray Diffraction (XRD) Analysis identifies the crystalline structure of materials, providing insights into phase composition and material properties.
*Customers who purchase our products can enjoy 1. Discounted pricing 2. Expedited service.
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KEY MATERIALS (NOT LIMITED TO)

*Customers who purchase our products can enjoy 1. Discounted pricing 2. Expedited service.

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