High Performance,

Wide Bandwidth Accelerometer

ADXL001
FEATURES Using the Analog Devices, Inc. proprietary fifth-generation
High performance accelerometer iMEMs® process enables the ADXL001 to provide the desired
±70 g, ±250 g, and ±500 g wideband ranges available dynamic range that extends from ±70 g to ±500 g in combin-
22 kHz resonant frequency structure ation with 22 kHz of bandwidth. The accelerometer output
High linearity: 0.2% of full scale channel passes through a wide bandwidth differential-to-single-
Low noise: 4 mg/√Hz ended converter, which allows access to the full mechanical
Sensitive axis in the plane of the chip performance of the sensor.
Frequency response down to dc The part can operate on voltage supplies from 3.3 V to 5 V.
Full differential signal processing

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The ADXL001 also has a self-test (ST) pin that can be asserted to
High resistance to EMI/RFI
verify the full electromechanical signal chain for the accelerometer
Complete electromechanical self-test
channel.
Output ratiometric to supply
Velocity preservation during acceleration input overload The ADXL001 is available in the industry-standard 8-terminal
Low power consumption: 2.5 mA typical LCC and is rated to work over the extended industrial temperature
8-terminal, hermetic ceramic, LCC package range (−40°C to +125°C).
15

APPLICATIONS
Vibration monitoring
Shock detection
Sports diagnostic equipment
LE RESPONSE (dB)
12

3
Medical instrumentation
0
Industrial monitoring
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–3

GENERAL DESCRIPTION –6

The ADXL001 is a major advance over previous generations of –9

accelerometers providing high performance and wide bandwidth.

07510-102
–12
This part is ideal for industrial, medical, and military applications –15
1 10 100 1k 10k 100k
where wide bandwidth, small size, low power, and robust
FREQUENCY (Hz)
performance are essential.
Figure 1. Sensor Frequency Response
B

FUNCTIONAL BLOCK DIAGRAM

VS

VDD
ADXL001
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TIMING
GENERATOR
VDD2

DIFFERENTIAL DEMOD OUTPUT

MOD SENSOR AMPLIFIER XOUT
AMP

SELF-TEST
07510-001

ST COM

Figure 2.

Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Tel: 781.329.4700 www.analog.com
Trademarks and registered trademarks are the property of their respective owners. Fax: 781.461.3113 ©2010 Analog Devices, Inc. All rights reserved.
ADXL001

TABLE OF CONTENTS
Features .............................................................................................. 1  Design Principles........................................................................ 11 
Applications ....................................................................................... 1  Mechanical Sensor ..................................................................... 11 
General Description ......................................................................... 1  Applications Information .............................................................. 12 
Functional Block Diagram .............................................................. 1  Application Circuit..................................................................... 12 
Revision History ............................................................................... 2  Self-Test ....................................................................................... 12 
Specifications..................................................................................... 3  Acceleration Sensitive Axis ....................................................... 12 
Specifications for 3.3 V Operation ............................................. 3  Operating Voltages Other Than 5 V ........................................ 12 
Specifications for 5 V Operation ................................................ 4  Layout, Grounding, and Bypassing Considerations .................. 13 
Recommended Soldering Profile ............................................... 5  Clock Frequency Supply Response .......................................... 13 

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Absolute Maximum Ratings............................................................ 6  Power Supply Decoupling ......................................................... 13 
ESD Caution .................................................................................. 6  Electromagnetic Interference ................................................... 13 
Pin Configuration and Function Descriptions ............................. 7  Outline Dimensions ....................................................................... 14 
Typical Performance Characteristics ............................................. 8  Ordering Guide .......................................................................... 14 
Theory of Operation ...................................................................... 11 

REVISION HISTORY
2/10—Rev. 0 to Rev. A
Added -250 and -500 models ............................................ Universal
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Changes to Table 1 ............................................................................ 3
Changes to Table 2 ............................................................................ 4
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Added Figure 9 through Figure 18 ................................................. 8
Changes to Ordering Guide .......................................................... 14

1/09—Revision 0: Initial Version

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Rev. A | Page 2 of 16
 ADXL001

SPECIFICATIONS
SPECIFICATIONS FOR 3.3 V OPERATION
TA = −40°C to +125°C, VS = 3.3 V ± 5% dc, acceleration = 0 g, unless otherwise noted.

Table 1.
ADXL001-70 ADXL001-250 ADXL001-500
Parameter Conditions Min Typ Max Min Typ Max Min Typ Max Unit
SENSOR
Nonlinearity 0.2 2 0.2 2 0.2 2 %
Cross-Axis Sensitivity Includes package 2 2 2 %
alignment
Resonant Frequency 22 22 22 kHz
Quality Factor 2.5 2.5 2.5

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SENSITIVITY
Full-Scale Range IOUT ≤ ±100 μA −70 +70 −250 +250 −500 +500 g
Sensitivity 100 Hz 16.0 4.4 2.2 mV/g
OFFSET Ratiometric
Zero-g Output 1.35 1.65 1.95 1.35 1.65 1.95 1.35 1.65 1.95 V
NOISE
Noise
Noise Density
FREQUENCY RESPONSE
−3 dB Frequency
−3 dB Frequency Drift
10 Hz to 400 Hz
10 Hz to 400 Hz LE 85
3.3

32
2
95
3.65

32
2
105
4.25

32
2
mg rms
mg/√Hz

kHz
%
Over Temperature
SELF-TEST
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Output Voltage Change 400 125 62 mV
Logic Input High 2.1 2.1 2.1 V
Logic Input Low 0.66 0.66 0.66 V
Input Resistance To ground 30 50 30 50 30 50 kΩ
OUTPUT AMPLIFIER
Output Swing IOUT = ±100 μA 0.2 VS − 0.2 0.2 VS − 0.2 0.2 VS − 0.2 V
Capacitive Load 1000 1000 1000 pF
PSRR (CFSR) DC to 1 MHz 0.9 0.9 0.9 V/V
B

POWER SUPPLY (VS)

Functional Range 3.135 6 3.135 6 3.135 6 V
ISUPPLY 2.5 5 2.5 5 2.5 5 mA
Turn-On Time 10 10 10 ms
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Rev. A | Page 3 of 16
ADXL001
SPECIFICATIONS FOR 5 V OPERATION
TA = -40°C to +125°C, VS = 5 V ± 5% dc, acceleration = 0 g, unless otherwise noted.

Table 2.
ADXL001-70 ADXL001-250 ADXL001-500
Parameter Conditions Min Typ Max Min Typ Max Min Typ Max Unit
SENSOR
Nonlinearity 0.2 2 0.2 2 0.2 2 %
Cross-Axis Sensitivity Includes package 2 2 2 %
alignment
Resonant Frequency 22 22 22 kHz
Quality Factor 2.5 2.5 2.5
SENSITIVITY

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Full-Scale Range IOUT ≤ ±100 μA −70 +70 −250 +250 −500 +500 g
Sensitivity 100 Hz 24.2 6.7 3.3 mV/g
OFFSET Ratiometric
Zero-g Output 2.00 2.5 3.00 2.00 2.5 3.00 2.00 2.5 3.00 V
NOISE
Noise 10 Hz to 400 Hz 55 60 70 mg rms
Noise Density 10 Hz to 400 Hz 2.15 2.35 2.76 mg/√Hz
FREQUENCY RESPONSE
−3 dB Frequency
−3 dB Frequency Drift
Over Temperature
SELF-TEST
2
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32 32
2
32
2
kHz
%

Output Voltage Change 1435 445 217 mV

Logic Input High 3.3 3.3 3.3 V
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Logic Input Low 0.66 0.66 0.66 V
Input Resistance To ground 30 50 30 50 30 50 kΩ
OUTPUT AMPLIFIER
Output Swing IOUT = ±100 μA 0.2 VS − 0.2 0.2 VS − 0.2 0.2 VS − 0.2 V
Capacitive Load 1000 1000 1000 pF
PSRR (CFSR) DC to 1 MHz 0.9 0.9 0.9 V/V
POWER SUPPLY (VS)
Functional Range 3.135 6 3.135 6 3.135 6 V
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ISUPPLY 4.5 9 4.5 9 4.5 9 mA

Turn-On Time 10 10 10 ms
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Rev. A | Page 4 of 16
 ADXL001
RECOMMENDED SOLDERING PROFILE
Table 3. Soldering Profile Parameters
Profile Feature Sn63/Pb37 Pb-Free
Average Ramp Rate (TL to TP) 3°C/sec maximum 3°C/sec maximum
Preheat
Minimum Temperature (TSMIN) 100°C 150°C
Maximum Temperature (TSMAX) 150°C 200°C
Time (TSMIN to TSMAX), ts 60 sec to 120 sec 60 sec to 150 sec
TSMAX to TL
Ramp-Up Rate 3°C/sec 3°C/sec
Time Maintained Above Liquidous (tL)
Liquidous Temperature (TL) 183°C 217°C
Liquidous Time (tL) 60 sec to 150 sec 60 sec to 150 sec

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Peak Temperature (TP) 240°C + 0°C/−5°C 260°C + 0°C/−5°C
Time Within 5°C of Actual Peak Temperature (tP) 10 sec to 30 sec 20 sec to 40 sec
Ramp-Down Rate 6°C/sec maximum 6°C/sec maximum
Time 25°C to Peak Temperature (tPEAK) 6 minute maximum 8 minute maximum

Soldering Profile Diagram

TP
LE RAMP-UP
tP
CRITICAL ZONE
TL TO TP
TEMPERATURE (T)

TL
TSMAX tL

TSMIN
SO
tS
PREHEAT RAMP-DOWN

07510-022

tPEAK
TIME (t)

Figure 3. Soldering Profile Diagram

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ADXL001

ABSOLUTE MAXIMUM RATINGS

Table 4.
Drops onto hard surfaces can cause shocks of greater than
Parameter Rating
4000 g and can exceed the absolute maximum rating of the
Acceleration (Any Axis, Unpowered and 4000 g
Powered) device. Exercise care during handling to avoid damage.
Supply Voltage, VS −0.3 V to +7.0 V
Output Short-Circuit Duration (VOUT to GND) Indefinite
ESD CAUTION
Storage Temperature Range −65°C to +150°C
Operating Temperature Range −55°C to +125°C
Soldering Temperature (Soldering, 10 sec) 245°C

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

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rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

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 ADXL001

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

VDD2
8
DNC 1 7 VDD
DNC 2 6 XOUT

07510-004
COM 3 5 DNC
4

ST
DNC = DO NOT CONNECT

ADXL001
TOP VIEW
(Not to Scale)

Figure 4. Pin Configuration

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Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1, 2, 5 DNC Do Not Connect.
3 COM Common.
4 ST Self-Test Control (Logic Input).
6
7
8
XOUT
VDD
VDD2
X-Axis Acceleration Output.
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3.135 V to 6 V. Connect to VDD2.
3.135 V to 6 V. Connect to VDD.
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Rev. A | Page 7 of 16
 PERCENT OF POPULATION PERCENT OF POPULATION PERCENT OF POPULATION

10
15
20
25
10
15
20
25
30
35
40
45
10
20
30
40
50
60

0
5
0
5
0
15.2 –0.07 –0.07
ADXL001

15.3 –0.06 –0.06

15.4
–0.05 –0.05
15.5
–0.04 –0.04
15.6
–0.03 –0.03
15.7
–0.02 –0.02
15.8
15.9 –0.01 –0.01

16.0 0 0

(mV/g)
VOLTS
VOLTS
16.1 0.01 0.01
16.2
O 0.02 0.02
16.3
0.03 0.03
VS = 3.3 V, TA = 25°C, unless otherwise noted.

16.4
0.04 0.04
16.5

Figure 5. Zero-g Bias Deviation from Ideal

0.05 0.05

Figure 7. ADXL001-70, Sensitivity Distribution

16.6
16.7
B 0.06 0.06

Figure 6. Zero-g Bias Deviation from Ideal (TA = 125°C)

16.8 0.07 0.07
07510-007 07510-006 07510-005
TYPICAL PERFORMANCE CHARACTERISTICS

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Rev. A | Page 8 of 16
PERCENT OF POPULATION PERCENT OF POPULATION PERCENT OF POPULATION

10
15
20
25
30
10
15
20
25
30
35
10
15
20
25

0
5
0
5
0
5

4.30 4.30 15.2

4.32 15.3
4.32
15.4
4.34 4.34
15.5
4.36
4.36 15.6
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4.38 15.7
4.38
4.40 15.8
4.40
15.9
4.42
4.42 16.0

(mV/g)
(mV/g)
(mV/g)

4.44
16.1
4.44
4.46 16.2
4.46
4.48 16.3
4.48 16.4
4.50
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4.50 16.5
4.52

Figure 9: ADXL001-250, Sensitivity Distribution

16.6
4.54 4.52
16.7
Figure 8. ADXL001-70, Sensitivity Distribution (TA = 125°C)

4.56 4.54

Figure 10: ADXL001-250, Sensitivity Distribution (TA = 125°C)

16.8
07510-025 07510-024 07510-008
 PERCENT OF POPULATION PERCENT OF POPULATION PERCENT OF POPULATION

10
15
20
25
10
15
20
25
30
10
15
20
25
30

0
5
0
5
0
5
360 2.17 2.17
365
2.18
370 2.18

375 2.19
2.19
380 2.20
385 2.20
2.21
390
2.21
395 2.22

400
O 2.23 2.22

(mV)
(mV/g)
(mV/g)
405
2.24 2.23
410
415 2.25
2.24
420 2.26
B 2.25

Figure 13. ADXL001-70, Self-Test Delta

425
2.27
430

Figure 11. ADXL001-500, Sensitivity Distribution

2.26
2.28
435
2.27

Figure 12. ADXL001-500, Sensitivity Distribution (TA = 125°C)

440 2.29
07510-009 07510-027 07510-026
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Rev. A | Page 9 of 16
PERCENT OF POPULATION PERCENT OF POPULATION PERCENT OF POPULATION

10
15
20
25
30
10
15
20
25
30
35
40
10
15
20
25
30

0
5
0
5
0
5

110

55
2.000
112

56
2.075
114

57
2.150
116
LE
118

58
2.225
120
2.300
59 122
2.375
60
124
2.450
61

126
(mV)
(mV)

(mA)
128
2.525
62

130
2.600
63

132
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Figure 16. ISUPPLY Distribution

2.675
64

134
Figure 15. ADXL001-500, Self-Test Delta
Figure 14. ADXL001-250, Self-Test Delta

2.750 136
65

138
2.825
66

140
2.900
67

142
07510-010 07510-029 07510-028
ADXL001
ADXL001
40

35
PERCENT OF POPULATION

30

25

20

15

10

07510-012
5

07510-011
0
CH1 500mV BW CH2 500mV BW M10.0µs A CH2 1.38V
2.100

2.175

2.250

2.325

2.400

2.475

2.550

2.625

2.700

2.775

2.850

2.925

3.000
T 42.80%

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(mA)

Figure 17. ISUPPLY at 125°C Figure 18. Turn-On Characteristic (10 μs per DIV)

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Rev. A | Page 10 of 16
 ADXL001

THEORY OF OPERATION
DESIGN PRINCIPLES MECHANICAL SENSOR
The ADXL001 accelerometer provides a fully differential sensor The ADXL001 is built using the Analog Devices SOI MEMS
structure and circuit path for excellent resistance to EMI/RFI sensor process. The sensor device is micromachined in-plane
interference. in the SOI device layer. Trench isolation is used to electrically
This latest generation SOI MEMS device takes advantage isolate, but mechanically couple, the differential sensing elements.
of mechanically coupled but electrically isolated differential Single-crystal silicon springs suspend the structure over the
sensing cells. This improves sensor performance and size handle wafer and provide resistance against acceleration forces.
because a single proof mass generates the fully differential
ANCHOR
signal. The sensor signal conditioning also uses electrical
feedback with zero-force feedback for improved accuracy MOVABLE
PLATE FRAME
and stability. This force feedback cancels out the electrostatic CAPACITORS

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forces contributed by the sensor circuitry. UNIT
FIXED

ACCELERATION
SENSING
CELL PLATES
Figure 19 is a simplified view of one of the differential sensor
cell blocks. Each sensor block includes several differential
capacitor unit cells. Each cell is composed of fixed plates attached UNIT
FORCING
MOVING
to the device layer and movable plates attached to the sensor PLATE
CELL

frame. Displacement of the sensor frame changes the differential

capacitance. On-chip circuitry measures the capacitive change.
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07510-019
ANCHOR

Figure 19. Simplified View of Sensor Under Acceleration

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Rev. A | Page 11 of 16
ADXL001

APPLICATIONS INFORMATION
APPLICATION CIRCUIT ACCELERATION SENSITIVE AXIS
Figure 20 shows the standard application circuit for the ADXL001. The ADXL001 is an x-axis acceleration and vibration-sensing
Note that VDD and VDD2 should always be connected together. device. It produces a positive-going output voltage for vibration
The output is shown connected to a 1000 pF output capacitor toward its Pin 8 marking.
for improved EMI performance and can be connected directly PIN 8
to an ADC input. Use standard best practices for interfacing
with an ADC and do not omit an appropriate antialiasing filter.
VS
CVDD

07510-002
0.1µF VDD2

8 VDD
DNC 1 7 Figure 21. XOUT Increases with Acceleration in the Positive X-Axis Direction

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ADXL001 XOUT
OPERATING VOLTAGES OTHER THAN 5 V
DNC 2 TOP VIEW 6 XOUT
(Not to Scale) COUT The ADXL001 is specified at VS = 3.3 V and VS = 5 V. Note that
COM 1nF
3 5 DNC some performance parameters change as the voltage is varied.
4
In particular, the XOUT output exhibits ratiometric offset and
ST
ST sensitivity with supply. The output sensitivity (or scale factor) scales
07510-023

proportionally to the supply voltage. At VS = 3.3 V, the output

DNC = DO NOT CONNECT

SELF-TEST
Figure 20. Application Circuit

The fixed fingers in the forcing cells are normally kept at the
same potential as that of the movable frame. When the digital
LE sensitivity is typically 16 mV/g. At VS = 5 V, the output sensitivity
is nominally 24.2 mV/g. XOUT zero-g bias is nominally equal to
VS/2 at all supply voltages.
3.5

self-test input is activated, the ADXL001 changes the voltage on 3.0

NOMINAL ZERO-g
the fixed fingers in these forcing cells on one side of the moving
SO
ZERO-g BIAS (V)

HIGH LIMIT
plate. This potential creates an attractive electrostatic force, causing 2.5
the sensor to move toward those fixed fingers. The entire signal
channel is active; therefore, the sensor displacement causes a
2.0
change in XOUT. The ADXL001 self-test function verifies proper
operation of the sensor, interface electronics, and accelerometer
LOW LIMIT
channel electronics. 1.5

07510-016
Do not expose the ST pin to voltages greater than VS + 0.3 V. If
B

this cannot be guaranteed due to the system design (for instance, if 1.0
3.2 3.7 4.2 4.7 5.2 5.7
there are multiple supply voltages), then a low VF clamping SUPPLY VOLTAGE (V)
diode between ST and VS is recommended. Figure 22. Typical Zero-g Bias Levels Across Varying Supply Voltages
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Self-test response in gravity is roughly proportional to the cube

of the supply voltage. For example, the self-test response for the
ADXL001-70 at VS = 5 V is approximately 1.4 V. At VS = 3.3 V,
the self-test response for the ADXL001-70 is approximately
400 mV. To calculate the self-test value at any operating voltage
other than 3.3 V or 5 V, the following formula can be applied:
(STΔ @ VX) = (STΔ @ VS) × (VX/VS)3
where:
VX is the desired supply voltage.
VS is 3.3 V or 5 V.

Rev. A | Page 12 of 16
 ADXL001

LAYOUT, GROUNDING, AND BYPASSING CONSIDERATIONS

CLOCK FREQUENCY SUPPLY RESPONSE The clock frequency supply response (CFSR) is the ratio of the
In any clocked system, power supply noise near the clock response at the output to the noise on the power supply near the
frequency may have consequences at other frequencies. An accelerometer clock frequency or its harmonics. A CFSR of 0.9 V/V
internal clock typically controls the sensor excitation and the means that the signal at the output is half the amplitude of the
signal demodulator for micromachined accelerometers. supply noise. This is analogous to the power supply rejection
ratio (PSRR), except that the stimulus and the response are at
If the power supply contains high frequency spikes, they may be different frequencies.
demodulated and interpreted as acceleration signals. A signal
appears at the difference between the noise frequency and the POWER SUPPLY DECOUPLING
demodulator frequency. If the power supply noise is 100 Hz For most applications, a single 0.1 μF capacitor, CDC, adequately
away from the demodulator clock, there is an output term at decouples the accelerometer from noise on the power supply.
100 Hz. If the power supply clock is at exactly the same frequency However, in some cases, particularly where noise is present at

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as the accelerometer clock, the term appears as an offset. If the the 1 MHz internal clock frequency (or any harmonic thereof),
difference frequency is outside the signal bandwidth, the output noise on the supply can cause interference on the ADXL001
filter attenuates it. However, both the power supply clock and output. If additional decoupling is needed, a 50 Ω (or smaller)
the accelerometer clock may vary with time or temperature, resistor or ferrite bead can be inserted in the supply line.
which can cause the interference signal to appear in the output Additionally, a larger bulk bypass capacitor (in the 1 μF to
filter bandwidth. 4.7 μF range) can be added in parallel to CDC.
The ADXL001 addresses this issue in two ways. First, the high ELECTROMAGNETIC INTERFERENCE
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clock frequency, 125 kHz for the output stage, eases the task of
choosing a power supply clock frequency such that the difference
between it and the accelerometer clock remains well outside the
filter bandwidth. Second, the ADXL001 has a fully differential
The ADXL001 can be used in areas and applications with high
amounts of EMI or with components susceptible to EMI emissions.
The fully differential circuitry of the ADXL001 is designed to be
robust to such interference. For improved EMI performance,
signal path, including a pair of electrically isolated, mechanically especially in automotive applications, a 1000 pF output capacitor is
coupled sensors. The differential sensors eliminate most of the recommended on the XOUT output.
power supply noise before it reaches the demodulator. Good
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high frequency supply bypassing, such as a ceramic capacitor
close to the supply pins, also minimizes the amount of interference.
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Rev. A | Page 13 of 16
ADXL001

OUTLINE DIMENSIONS
0.031 (PLATING OPTION 1,
SEE DETAIL A
0.025 FOR OPTION 2)

0.208 0.094 0.019 0.030

0.055
0.197 SQ 0.22 0.078 0.020 DIA
0.050
0.188 0.15 0.062 0.010
0.045
0.08
7 1
(R 4 PLCS)
0.183 0.108
0.177 SQ 0.075 REF 0.100
0.171 R 0.008 0.092
(8 PLCS)
5 3
TOP VIEW 0.010 BOTTOM VIEW
R 0.008
(4 PLCS) 0.006
0.082
0.002 0.019 SQ
0.070
0.058

TE 111808-C
DETAIL A
(OPTION 2)

Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC]

(E-8-1)
Dimensions shown in inches

ORDERING GUIDE
Model 1
ADXL001-70BEZ
ADXL001-70BEZ-R7
ADXL001-250BEZ
Temperature Range
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
LE g Range
±70 g
±70 g
±250 g
Package Description
8-Terminal LCC
8-Terminal LCC
8-Terminal LCC
Package Option
E-8-1
E-8-1
E-8-1
ADXL001-250BEZ-R7 −40°C to +125°C ±250 g 8-Terminal LCC E-8-1
ADXL001-500BEZ −40°C to +125°C ±500 g 8-Terminal LCC E-8-1
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ADXL001-500BEZ-R7 −40°C to +125°C ±500 g 8-Terminal LCC E-8-1
EVAL-ADXL001-250Z Evaluation Board
EVAL-ADXL001-500Z Evaluation Board
EVAL-ADXL001-70Z Evaluation Board
1
Z = RoHS Compliant Part.
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Rev. A | Page 14 of 16
 ADXL001

NOTES

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Rev. A | Page 15 of 16
ADXL001

NOTES

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©2010 Analog Devices, Inc. All rights reserved. Trademarks and

registered trademarks are the property of their respective owners.
D07510-0-2/10(A)

Rev. A | Page 16 of 16