Transmission Line Analysis of Aperture-Coupled Reflectarrays
Transmission Line Analysis of Aperture-Coupled Reflectarrays
4, 1–12, 2008
1. INTRODUCTION
2. FORMULATION
∆y Unit cell
Lm Ls
∆x
La
∆x
W
Wm
(b)
patch z
εr1 Slot t
εr2 h y
x y
Phase tuning line
(a) (c)
where E Spatch and E Sgrp give the fields scattered by the isolated
microstrip patch and the finite ground plane, respectively. These two
contributions can be evaluated separately. In this work, the term
E Spatch is derived from a proper transmission line model of the single
radiator, while the term E Sgrp is computed with the Physical Optics
theory [20].
4 Venneri, Costanzo, and Di Massa
L/2 L/2
Ys Ys
A A'
n1:1
Ya
B B'
1:n2
C C'
Lm Ls
(a)
B
Zoa,koa Ya Zoa,koa
B'
La/2 La/2
(b)
of the induced electric field across the slot and the knowledge of
the magnetic-field eigenvectors on both sides of the ground plane.
As reported in [24], the transformation ratios can be computed by
assuming the following expression of the normalized electric field ea on
the aperture:
1 π
ea = y · 2 cos x (2)
Wa La
π − y2
2
where Wa and La give the width and the length of the aperture (Fig. 1),
respectively.
The magnetic-field components on the ground plane are derived
from the Fourier transforms of the surface current densities on the feed
and the patch conductor [24], respectively. These current densities are
approximated by the following closed form expression [30], accurate
enough for both narrow and wide microstrip lines:
Jyi (x) = Ai 1 + B i M i (x) − 1 (3)
where:
1 1
Ai =
· (4)
Zoi W i 1 + B i π − 1
2
2xc
1− i
B i = 10 · i W (5)
M (xc ) − 1
Wi
M i (x) =
2 (6)
i 2
W
− x2
2
The apex i into Equations (3)–(6) can assume two distinct values,
namely i = 0 and i = 1. The case i = 0 is associated to the
values Zoi = Zof and W i = Wm , where Zof and Wm represent the
characteristic impedance and the width of the feeding line, respectively.
Analogously, the case i = 1 is associated to the values Zoi = Zop and
W i = W , where Zop and W give the characteristic impedance and the
width of the patch. The dependence of the term 2x Wi
c
into Equation (5)
i
versus the ratio of the length W with respect to the relative height
substrate is reported in [30].
6 Venneri, Costanzo, and Di Massa
(a) (b)
180
TLM
120 MoM
Reflection phase [deg]
60
-60
-120
-180
0.1 0.2 0.3 0.4 0.5
L /λ
m g
180
TLM
120 MoM
-60
-120
-180
0.1 0.2 0.3 0.4 0.5
L /λ
m g
L/2 L/2
short Ys
Ys
A A'
Lm
∆y n1:1
L
Ya
Lm La B B'
y 1:n2
W
x C C'
∆x
Lm Lm
(a) (b)
180
Measurements
120 TLM
-60
-120
-180
0.1 0.15 0.2 0.25 0.3
Lm/λg
4. CONCLUSIONS
REFERENCES