Inductive Frequency Selective Surface An Applicati
Inductive Frequency Selective Surface An Applicati
Inductive Frequency Selective Surface An Applicati
fully edited. Content may change prior to final publication. Citation information: DOI
10.1109/ACCESS.2020.2970271, IEEE Access
Date of publication xxxx 00, 0000, date of current version xxxx 00, 0000.
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ABSTRACT
An Inductive Frequency Selective Surface (IFSS) self-standing dichroic sub-reflector is presented, which
allows the transmission of two frequency bands and reflection of a third band. The operating frequency
of the sub-reflector is designed to work at Ku, K and Ka frequency bands, intended for earth to space
and space to earth satellite communications. The proposed unit cell is a Jerusalem cross intertwined with
an Brigid’s cross. The IFSS is investigated using transmission line theory, along with equivalent-circuit
model technique. It has been designed, and simulated using CST Microwave Studio and Advance Design
Simulator (ADS). The cascade configuration of the IFSS is also investigated to improve frequency roll-
off and bandwidth of the reflection and transmission coefficients. The IFSS has been manufactured using
two-sided Photo Chemical Machining (PCM) technique, and has been experimentally characterized using
an optical configuration, comprising two double ridged horn antennas connected to a VNA and a rotation
system. Measured results are in good agreement with theoretical and simulation data, which validates the
reliability of the design and manufacturing process.
I. INTRODUCTION the E- and H-Fields at each point of the surface. This method
NDUCTIVE Frequency Selective Surfaces (IFSSs) are takes less computational resources than others, and gives a
I electromagnetic filters capable of working as high-pass
filters or band-pass filters depending on the resonant element
good approximation to real results, even though the FSS
is embedded in a stratified medium [4]. The drawbacks of
etched in a conductive surface [1]. The main advantage of this method are its accuracy, it cannot describe the operation
this type of FSS is the self-standing capability, that is, it can of the FSS at the grating lobe region, and it cannot be
be implemented without a dielectric substrate. Therefore, it used in certain structures like meandered dipole, quadrifilar
will not have frequency shifts due to change of mediums. spiral, and genetically optimized shapes [7]. The second are
Additionally, if the conducting surface is thick enough, and computational methods, which are the most accurate, and
manufactured with high hardness metal sheet, it will have complex methods of both. These offer good approximation
mechanical stability [2]. The drawback of dispensing with the at different scenarios, for example, in the case of an FSS
substrate are: reduced angular stability, reduced mechanical with multiple resonant shapes embedded within dielectric
stability, and increased manufacturing complexity compared loading, the case of an FSS illuminated at different incident
with a conventional FSS. angles, and the case of a multi-layer FSS configuration, just
Two methods have been proposed to analyze FSS reflection to mention a few. Some of those computational methods are:
and transmission coefficients. The first is equivalent circuit periodic method of moments (PMM) and finite difference
method, which was proposed in [3]–[7]. It uses a quasi-static time domain method (FDTD), which are the most used for
approximation, that is, it considers a uniform distribution of these matters [8].
VOLUME 0, 0000 1
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
Reducing the weight on a spacecraft, and reducing the area The main difference between our work, and previous
in a satellite is critical, and involves many engineer fields works on dichroic surfaces for satellite antennas is the use
[2]. The satellite dish antenna design challenges comprise an a completely inductive frequency selective surface, which
effective reflector design, an optimum multifrequency feed means that this structure does not need a substrate to have
system, and frequency feed segregation. Each of those will mechanical stability.
be addressed in the following paragraph. First, an effective This paper is organized as follows: Section II comprises
reflector design can be done using a Cassegrain reflector sys- the unit cell design steps. It involves frequency requirements,
tem with an FSS as dichroic sub-reflector. Second, the FSS unit cell design of both Brigid’s and Jerusalem cross, and the
allows, for example, using X band and Ku or K frequency combination of both shapes. In addition, reflection and trans-
bands with the same antenna structure giving multifrequency mission coefficients of TE mode are presented for single and
operation. Finally, the feeds will be isolated due to the double layer IFSS. Section III comprises equivalent circuit
dichroic capability. Fig. 1 shows a ray analysis highlighting analysis of the designed FSS, as well as its mathematical
the antenna design challenges in a satellite. background. In addition, the reflection coefficient obtained
For satellite communications, several works have been done will be compared with the full wave simulation. Section IV
on dichroic sub-reflectors [9]–[19]. Most of these works comprises the parametric study of the IFSS. Section V com-
offers two, three, and even four operation bands, where the prises the experimental verification of our proposed IFSS. It
dichroic surface acts as a band pass filter or a band stop involves the effects of the PCM manufacturing process, the
filter. This allows working in the satellite with four frequency measurement setup, and a comparison between simulated and
bands using one parabolic dish, thus reducing the number of measurement results.
parabolic dishes in the satellite.
II. UNIT CELL DESIGN
First, to design a unit cell we need to know the frequency
bands of operation and the required bandwidth. This in-
formation can be found in Table 1. The frequency bands
presented are used in earth-to-satellite and satellite-to-earth
communications in Europe [20], and were chosen as a proof
of concept. Second, to fulfill the frequency operation and
bandwidth requirements, resonant shapes were chosen. Some
resonant shapes, and its frequency characteristics can be
found in [1]. Once the resonant shapes had been chosen,
the following characteristics must be obtained: dimensions,
periodicity, metal thickness, lattice type and material. Those
characteristics will dictate the resonant frequencies, band-
width, onset of grating lobes, angular stability and polariza-
tion independence.
The resonant shapes chosen, which best suit our require-
FIGURE 1. Ray analysis of a prime focus Cassegrain reflector using dichroic
sub-reflector. The dichroic surface will act as ground plane for one frequency
ments, are: the intertwined Brigid’s and Jerusalem cross
band, and will be transparent for two. apertures.
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
FIGURE 2. a) Intertwined Brigid’s cross unit cell aperture with its approximate
resonant frequency. b) Jerusalem cross unit cell aperture with its approximate
resonant frequency. (Shaded region represents metal).
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
The impedance generated by each of the inductors and The values computed are: Cp1 = 167.14 f F and Lp1 =
capacitor are: 180 pH. Full wave simulations and equivalent circuit model
−j simulations are shown in Fig. 8.
ZCp1 = (1)
ωCp1
Using (11) we can see that the IFSS will have a minimum
4d cos(φ) πg
Bp1 = ln csc( ) + G(p, g, λ, φ) (5) at ωz3 = 0 and a maximum at ωp3 , which in this case is
λ 2p our second resonance frequency. After applying the previous
where, formulas, we obtain, Lp3 = 1.27 nH and Cp3 = 55 f F . Full
wave simulation and equivalent circuit model simulation can
G(p, g, λ, φ) = be seen in Fig. 10.
1 2 2 β 2
2
The final equivalent circuit, which is shown in Fig. 11,
2 (1 − β ) [((1 − 4 )(C+ + C− ) + 4β C+ C− )]
(6) represents the intertwined Jerusalem cross IFSS. This circuit
2 2 4
1 − β4 + β 2 (1 + β2 − β8 )(C+ + C− ) + 2β 6 C+ C− consists on a series connection of branches Lp1 ||Cp1 , which
πw corresponds to the first resonance frequency of the Jerusalem
β = sin( ) (7) cross, with Lp3 ||Cp3 , which corresponds to the Brigid’s cross
2p
resonance frequency. This connection is possible because of
1 the band-pass nature of this structure. Equivalent circuit is
C± = q −1 (8) represented in the physical structure by drilling the Jerusalem
( p sin
λ
φ
± 1)2 − ( λp )2 cross structure into the Brigid’s cross, as shown in Fig. 3.
The previously calculated capacitances and inductances are
Z0
|S11 | = (9) affected by this combination, and new values were obtained
2Z + Z0
using the same curve fitting method. Basically, the previously
2Z calculated inductance Lp1 is lower than the new inductance
|S12 | = (10) LJC due to the magnetic field circulating in the plate between
2Z + Z0
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
FIGURE 12. Full wave and circuit approach simulation of the Jerusalem cross
aperture and intertwined Brigid’s cross aperture, at normal incidence of a
vertically polarized wave.
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
Brigid’s cross aperture is reduced; therefore, the first the two crosses increases; therefore, and using equa-
resonance frequency is increased. It should be noticed tion (4), the second resonance frequency is reduced, as
that tuning of this first resonance frequency is totally shown in Fig. 15. It should be mentioned that these
independent of the second resonant frequency, but af- variations do not affect the first resonance frequency, but
fects the total reflection band, which is reduced as G affect the total reflection band, increasing it.
increases.
0 0
-5 -5
-10 -10
[dB]
|R|TE [dB]
-15 -15
TE
-20
|R|
-20
-25 -25
G=0.1 mm D=0.35 mm
G=0.2 mm -30 D=0.3875 mm
-30
G=0.3 mm D=0.425 mm
G=0.4 mm D=0.4625 mm
-35 -35
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 13. Reflection coefficient of the proposed unit cell when G varies. FIGURE 15. Reflection coefficient of the proposed unit cell when the variated
The original value of G is 0.2 mm. parameter is H. The original value of H is 0.85 mm.
2) Parameter H (Brigid’s cross arms width) 4) Parameter B (Jerusalem cross loading arm width)
When increasing H the value of E is reduced to keep By varying the loading aperture B of the Jerusalem
the same period. Increasing H and reducing E, the cross we can control both the second resonance fre-
associated capacitance is reduced while the associated quency and the reflection band. When increasing B,
inductance increases; therefore, the quality factor Q F is reduced to keep the same period. This variation
is reduced, thus increasing the bandwidth of the first entails that the metallic strip placed above the loading
resonance frequency. This effect can be seen in Fig. 14. arm gets thinner, increasing the inductance associated;
It is worth mentioning that these variations do not affect therefore, the Q factor is reduced; thus, increasing band-
the second resonance frequency, but they do affect the width. On the other hand, as the aperture gets thicker
total reflection band, increasing it as H increases. the capacitance associated gets bigger, decreasing the
resonant frequency. Fig. 16 show that as B gets bigger,
the second resonance frequency is reduced, and the
0 bandwidth increases. Finally, as we mention earlier;
as B increases the reflective frequency band, and the
-5 bandwidth decreases.
-10
V. EXPERIMENTAL VERIFICATION
The proposed concept of an IFSS using intertwined shapes
|R|TE [dB]
-15
has been validated through experimentation. The material
-20 used for the manufacturing was stainless steel 304 with thick-
ness of 0.2 mm and σ =720 nΩ. Even though this material
-25
E=0.2 mm, H=0.4 mm
has less conductivity than copper, it has high strength, and
-30 E=0.25 mm, H=0.3 mm corrosion resistance. If we want to improve the conductivity,
E=0.3 mm, H=0.2 mm we could consider to metallize the structure with cooper. Two
E=0.35 mm, H=0.1 mm
-35 prototypes were designed using 36-unit cells with an overall
15 20 25 30 35
Frequency [GHz] dimension of 200x200 mm. Near the sided edges of the
structure 8 holes were placed to hold a frame for measuring
FIGURE 14. Reflection coefficient of the proposed unit cell when the variated
parameter are D and C. Original value of H is 0.3 mm and E is 0.2 mm.
purposes.
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
-5
-10
|R|TE [dB]
-15
-20
-25
B=0.2 mm, F=0.4 mm
-30 B=0.3 mm, F=0.3 mm FIGURE 17. a) Cross sectional view of a prototyped metal sheet using
B=0.4 mm, F=0.2 mm two-sided PCM. b) Cross sectional view of a prototyped metal sheet using
B=0.5 mm, F=0.1 mm one-sided PCM. c) Front view of the unit cell after etching using PCM.
-35
15 20 25 30 35 40
Frequency [GHz]
FIGURE 16. Reflection coefficient of the proposed unit cell when the variated
parameter are B and F . The original value of B is 0.3 mm and F 0.3 mm.
1) PhotoChemical Machining
This method follows the same principle as PCB manufac-
turing. It has an accuracy of 13 µm and the sheet thickness
varies from 0.013 to 2.032 mm. It has a major limitation
represented by non-uniform etching through apertures. That
FIGURE 18. IFSS prototyped using a 0.2 mm thick sheet of stainless steel
is, the etchant will not attack the metal perpendicularly to 304 and a zoomed view of a unit cell.
the resistive sheet; instead, it will attack sidewalls and under
the resistive film. Depending on the manufacturer, there are dations of the manufacturer for both etching methods are:
a variety of etching techniques, which offers different bevel inner radius r=t, outer radius R=0.5t, bevel for one-sided
finishing at the edges. The most common PCM techniques etching d=0.4t and for two-sided etching D=0.2t. Stainless
are: one and two-sided etching. On One-sided etching, the steel 304 was selected as material for the IFSS unit cell. S-
resistive stencil is placed over the upper face of the metal Parameters comparison between those two etching methods
sheet and a complete resistive sheet over the other face, as and the original unit cell design are shown in Fig. 19.
illustrated in Fig. 17b. The bevel in one-sided etching is
0
approximate d = 0.4 t, being t the thickness of the metal
sheet. In Two-sided etching, the resistive stencils are placed -5
over both faces of the metal sheet, as illustrated in Fig. 17a. -10
The bevel in two-sided etching is approximate D = 0.2 t
Magnitude [dB]
-15
to D = 0.1 t and the bevel is uniform in both faces. Both
etching techniques have an under etching in the resistive film -20
that is approximate to g = 0.02 t. -25
In addition, rounded corners are created in both etching
-30
techniques. Depending on the corner, the radius could be
external R or internal r, as illustrated in Fig. 17c. External -35 |R| TE Original |T| TE original
radius is approximate R = 0.4 t to R = 0.6 t and internal |R| TE One side etching |T| TE one side etching
-40
radius is r = 0.8d to r = d [23]. |R| TE Two side etching |T| TE two side etching
-45
15 20 25 30 35
Frequency [GHz]
B. EFFECTS IN ROUNDED CORNERS AND BEVELED
EDGES. FIGURE 19. Reflection and transmission coefficients simulation of an original
designed IFSS, one-sided etching and two-sided etching method. Both
The manufacturer offered both one-sided and two-sided etch- methods use an inner radii r = t and outer radii R = 0.5t.
ing. To understand the effects of either, and to choose one
that better suits our research purposes, the original unit cell In the first resonance frequency the S-Parameters for the
was modified to simulate both etching methods. Recommen- original and one-sided etching are nearly the same, with a
8 VOLUME 0, 0000
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
C. MEASUREMENT SETUP
The manufactured IFSS has been characterized by measuring
transmission and reflection coefficients using an optical bed FIGURE 20. Schematic illustration of the measurement setup, which includes
configuration. The measurement setup shown in Fig. 20 was distance form antennas and from SUT.
configured as follows: Two double ridged horn antennas
model DRH40 were placed away form each other a distance
of 400 mm and 450 mm above a rail using a support sys-
tem. Although both antennas were placed at a distance that
warranties correct illumination, they are placed in the near-
field region to avoid using lents. At the middle, a motorized
rotation stage (MRS), model MOR-100-30 was placed over a
rail. This rotates the Surface Under Test (SUT) to a different
angles of incidence. The SUT was fastened using a 1 cm
thick frame made of a ROHACELL 31HF which has an r =
1.041. This frame was placed in the MRS fastening system. A
photo of the measurement setup can be seen in Fig. 21. Both
antennas outputs are connected through coaxial cable to a
Vector Network Analyzer (VNA) Rohde&Schwarz ZVA 67.
Surrounding the measurement setup absorbent material was
placed to reduce unwanted reflections. The VNA frequency
range was configured from 5 to 35 GHz with a step size
of 50 M Hz. The number of points was set to 1024 with a
frequency span of 13 GHz. To enhance measurements re- FIGURE 21. Photo of the measurement setup which includes both double
ridged horn antennas model DRH40, rail, motorized rotation stage, SUT, and a
sults, time gating was applied to the RAW data. This reduces VNA.
deceptive backscattering caused by multi-path propagation.
For reflection measurements, two stages were configured. In TE mode and for non-normal incidence angles, variations
Normal incident measurements were performed using one between measured and simulated results are seen in both
antenna. For angles above 0 degrees measurements were reflection and transmission coefficients. For the reflection
made using two antennas. The latter case, both antennas will coefficient, which is shown in Fig. 24, the first resonance
be separated by an angle centered in the middle of the IFSS. frequency position and bandwidth are in better accordance
with simulation, compared to the normal incidence results.
D. SINGLE LAYER IFSS Once more, this is due to the two antenna measurement
The prototype was characterized using the configuration pre- technique, which is more accurate. In addition, the measured
viously described. The S-Parameters measurements obtained reflection coefficients show a slight variation in bandwidth
to normal incidence illumination for both modes show accor- at the first resonance frequency, and a more pronounced
dance with simulations, with a slight variation in bandwidth variation at the second resonance frequency, compared to
and frequency displacement at the first resonance frequency, normal incidence case results because angular stability de-
as can be seen in Fig. 22 for TE mode, and Fig. 23 for TM creases for resonances above the first. On the other hand, for
mode. This variation in bandwidth is most likely due to: mea- transmission measurements, which are shown in Fig. 25, have
surement mismatches, one antenna measurement technique two nulls instead of one as for the case of normal incidence.
and manufacturing tolerances. This new null appears at 22 GHz and is present only for
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
0 0
-5 -5
-10 -10
Magnitude [dB]
-15 -15
|R| TE [dB]
-20 -20
-25 -25
-30 -30
|R|TE =0° Sim. |T|TE =0° Sim. =5° Sim. =10° Meas.
-35 -35 =5° Meas. =15° Sim.
|R|TE =0° Meas. |T|TE =0° Meas.
=10° Sim. =15° Meas.
-40 -40
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 22. TE mode measured and simulated reflection and transmission FIGURE 24. TE mode measured and simulated reflection coefficient of a
coefficient at normal incidence for a single layer IFSS. single layer IFSS at oblique incidence.
0 0
-5 -5
-10 -10
Magnitude [dB]
-15 -15
|T| TE [dB]
-20 -20
-25 -25
-30 -30
=5° Sim. =10° Meas.
|R| TM =0 ° Sim. |T| TM =0 ° Sim.
-35 -35 =5° Meas. =15° Sim.
|R| TM =0 ° Meas. |T| TM =0 ° Meas. =10° Sim. =15° Meas.
-40 -40
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 23. TM mode measured and simulated reflection and transmission FIGURE 25. TE mode measured and simulated transmission coefficient of a
coefficient at normal angle of incidence for a single layer IFSS. single layer IFSS at oblique incidence.
TE mode at oblique angles of incidence, in this case angles shown in Fig. 28 and Fig. 29 respectively, and for TM mode
above 10 degrees. This null is generated by the so called in Fig. 30 and Fig. 31.
bend or crooked mode, which can be explained using a modal As is expected, for both modes the results show an increase
analysis, depicted in [1]. in bandwidth, flatter top, and faster roll-off compared with
For TM mode measured and simulation results, shown in single layer configuration. Some differences can be observed
Fig. 26 and Fig. 27, are almost the same as for TE mode with between simulated and measured results. First, for both TE
the difference that the crooked mode is not present anymore, and TM mode reflection coefficients, which are shown in
and the angular stability has been improved. This is because Fig. 28 and Fig. 30, the first resonance frequency measured
the surface rotation axis is not the same as the electric field bandwidth is slightly smaller than the simulated. This can be
orientation. explained by the mismatch alignment of both FSS. Second,
both reflection coefficient are shifted slightly to the left. This
E. DOUBLE LAYER IFSS is due to the addition of the foam that generates a frequency
As can be seen in the results for single layer IFSS, the shift. On the other hand, there are some slight variations
resonance frequencies and bandwidth are nearly at the limit between the measured results between different angles of
compared with the design requirements, shown in Table 1. To incidence. The bandwidth and reflection variation are still
improve the results we need to increase bandwidth, flatter the present due to the same reasons explained before in single
top, and faster roll-off. This can be done by placing two IFSS layer measurements. The crooked mode is still present at 23
in cascade, separated by a distance of 2 mm from each other. GHz, for TE mode. In TM mode the crooked mode is not
To have mechanical stability for measurement purposes, a present and the angular stability has been improved. Using
sheet of 2 mm ROHACELL 31HF was placed between both this cascade configuration we can see that the IFSS works
IFSS. Measured and simulated reflection and transmission fine over the frequency bands of interest.
coefficients at different angles of incidence for TE mode are
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Juan A. Vásquez-Peralvo et al.: Inductive Frequency Selective Surface: An applications for dichroic sub-reflectors
0 0
-5
-10
-10
|R| TM [dB]
|T| TE [dB]
-15 -20
-20
-30
-25
=5° Sim. =10° Meas. -40 =5° Sim. =10° Meas.
-30
=5° Meas. =15° Sim. =5° Meas. =15° Sim.
=10° Sim. =15° Meas. =10° Sim. =15° Meas.
-35 -50
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 26. TM mode measured and simulated reflection coefficient of a FIGURE 29. TE mode measured and simulated transmission coefficient of a
single layer IFSS at oblique incidence. double layer IFSS at oblique incidence.
0 0
-5 -5
-10
-10
-15
|R| TM [dB]
|T| TM [dB]
-15
-20
-20
-25
-25
-30
=5° Sim. =10° Meas. =5° Sim. =10° Meas.
-30 -35
=5° Meas. =15° Sim. =5° Meas. =15° Sim.
=10° Sim. =15° Meas. =10° Sim. =15° Meas.
-35 -40
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 27. TM mode measured and simulated transmission coefficient of a FIGURE 30. TM mode measured and simulated reflection coefficient of a
single layer IFSS at oblique incidence. double layer IFSS at oblique incidence.
0 0
-5
-10
-10
-15
|T| TM [dB]
|R| TE [dB]
-20
-20
-25 -30
-30
=5° Sim. =10° Meas. -40 =5° Sim. =10° Meas.
-35 =5° Meas. =15° Sim. =5° Meas. =15° Sim.
=10° Sim. =15° Meas. =10° Sim. =15° Meas.
-40 -50
15 20 25 30 35 15 20 25 30 35
Frequency [GHz] Frequency [GHz]
FIGURE 28. TE mode measured and simulated reflection coefficient of a FIGURE 31. TM mode measured and simulated transmission coefficient of a
double layer IFSS at oblique incidence. double layer IFSS at oblique incidence.
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