SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

NOVASTAR METROLOGY
35200 Plymouth Road
Livonia, MI 48150
Guy Howe Phone: 734 453 8003

CALIBRATION

Valid To: March 31, 2021 Certificate Number: 1277.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1, 9:

I. Acoustical Quantities

Parameter/Range Frequency CMC2 (±) Comments

Microphone Acoustic
Level –

Sensitivity:
¼ in 114 dB @ 250 Hz 0.20 dB 2900 B Larson Davis
½ in 114 dB @ 250 Hz 0.22 dB sound level calibration
1 in 114 dB @ 250 Hz 0.22 dB system (comparison
method)
Frequency Response:
¼ in 20 Hz to 126 kHz 0.49 dB
½ in 20 Hz to 20 kHz 0.21 dB
1 in 20 Hz to 20 kHz 0.20 dB

Sound Level Calibrators –

(94 to 114) dB (0.25 to 1) kHz 0.27 dB 2900 B Larson Davis

sound level calibration
system (comparison
method)

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 1 of 24

 Parameter/Range Frequency CMC2 (±) Comments

Sound Level Meters –

(94 to 114) dB (0.125 to 2) kHz 0.64 dB Acoustic method

(0.02 to 20) kHz 0.12 dB Electrical method

II. Chemical

Parameter/Equipment Range CMC2, 6, 10 (±) Comments

pH – Measuring 4.01 pH unit 0.012 pH unit + 0.6R Accredited solutions

Equipment 7.01 pH unit 0.016 pH unit + 0.6R
10.01 pH unit 0.018 pH unit + 0.6R

Conductance – 1.015 mS/cm 0.0058 mS/cm + 0.6R Accredited solutions

Measuring Equipment 1.408 mS/cm 0.010 mS/cm + 0.6R
12.85 mS/cm 0.087 mS/cm + 0.6R
111.3 mS/cm 0.88 mS/cm + 0.6R

III. Dimensional

Parameter/Equipment Range CMC2, 6 (±) Comments

Micrometers3 Up to 36 in (4.6 + 5.0L) μin + 0.6R Gage blocks

Tri-Bore Up to 5 in (6.4 + 4.4L) μin/in Ring gage set

Calipers3 Up to 36 in (2.9 + 11L) μin + 0.6R Gage blocks

Angle Up to ±90° 3.7' Optical protractor

Up to 60° 0.000 048 °/° Sine bar/gage blocks

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 2 of 24

 Parameter/Equipment Range CMC2, 6 (±) Comments

Optical Comparators3–
Magnification 10× to 100× 420 μin Magnification scale

Linear Accuracy (0.001 to 6) in 150 μin + 0.6R Glass scale

Angle (30/60/90/120/150)° 0.0048° + 0.6R

Cylindrical Gages –

Pins, Plugs, Discs (0.003 to 4.0) in (13 + 1.1L) μin ULM and gage blocks

Height Gages3, 8 Up to 48 in (25 + 4.9L) µin Gage blocks

Indicators3 – Dial and Up to 4 in (1.4 + 4.5L) µin + 0.6R Gage blocks

Digital Up to 100 mm (54 + 7.6L) nm + 0.6R

Gage Blocks (0.01 to 4) in (1.6 + 3.7L) µin Twin head comparison

(0.5 to 100) mm (89 + 3.4L) nm
(4 to 8) in (16 + 2L) μin ULM

Linear Displacement Up to 1600 in (23 + 1.1L) µin Renishaw laser system

Radius Gage (0.005 to 5) in 0.0031 in Optical comparator

Threaded Plug Gages –

Pitch Diameter Up to 8 in (31 + 1.3L) μin ULM, thread wires

(5 to 80 TPI)

Major Diameter Up to 4 in (13 + 1.1L) μin ULM and gage blocks

Thread rings –

Pitch Diameter Up to 6.5 in (30 + 4.6L) µin ULM, tee ball probes
(5 to 80 TPI)

Gage Balls Up to 4 in (11 + 3.9L) μin ULM

Ring Gages Up to 8 in (16 + 1.6L) μin ULM, master rings and

gage blocks

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 3 of 24

 Parameter/Equipment Range CMC2, 6 (±) Comments

Foils and Thickness Up to 8 in (16 + 1.9L) μin ULM

Gages

Linear Scales/Reticles Up to 12 in 0.000 63 in Optical comparator

and Stage Micrometers

Durometers – Types A, B, C, D, E, ASTM D2240

O, OO, and DO

Indenter Shape and Indenter extension 12 μm Optical comparator

Extension: length

Tip radius 12 μm Optical comparator

Spring Force All scales 0.0047 N Dual pan balance and

weights

IV. Dimensional Testing/Calibration

Parameter/Equipment Range CMC2 (±) Comments

Linear Accuracy11 –

X Axis Up to 900 mm 2.0 µm + 0.0045 µm/mm CMM

Y Axis Up to 1000 mm 2.0 µm + 0.0045 µm/mm

Z Axis Up to 600 mm 2.0 µm + 0.0044 µm/mm

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 4 of 24

V. Electrical – DC/Low Frequency

Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Current3 – Generate

(0 to 220) µA (10 to 20) Hz 0.082 % + 25 nA Fluke 5700A

(20 to 40) Hz 0.041 % + 20 nA
(40 to 1000) Hz 0.017 % + 16 nA
(1 to 5) kHz 0.073 % + 40 nA
(5 to 10) kHz 0.19 % + 80 nA

(0.22 to 2.2) mA (10 to 20) Hz 0.082 % + 40 nA

(20 to 40) Hz 0.041 % + 20 nA
(40 to 1000) Hz 0.017 % + 35 nA
(1 to 5) kHz 0.068 % + 400 nA
(5 to 10) kHz 0.19 % + 800 nA

(2.2 to 22) mA (10 to 20) Hz 0.082 % + 400 nA

(20 to 40) Hz 0.041 % + 350 nA
(40 to 1000) Hz 0.017 % + 350 nA
(1 to 5) kHz 0.068 % + 4 µA
(5 to 10) kHz 0.19 % + 8 µA

(22 to 220) mA (10 to 20) Hz 0.082 % + 4 µA

(20 to 40) Hz 0.041 % + 3.5 µA
(40 to 1000) Hz 0.017 % + 3.5 µA
(1 to 5) kHz 0.068 % + 40 µA
(5 to 10) kHz 0.19 % + 80 µA

(0.22 to 2.2) A (20 to 1000) Hz 0.077 % + 35 µA

(1 to 5) kHz 0.087 % + 80 µA
(5 to 10) kHz 1 % + 160 µA

(1.1 to 3) A (10 to 45) Hz 0.19 % + 0.1 mA Fluke 5520A

45 Hz to 1 kHz 0.062 % + 0.1 mA
(1 to 5) kHz 0.62 % + 1 mA
(5 to 10) kHz 2.6 % + 5 mA

(3 to 11) A (45 to 100) Hz 0.062 % + 2 mA

(0.1 to 1) kHz 0.1 % + 2 mA
(1 to 5) kHz 2.6 % + 2 mA

(11 to 20.5) A (45 to 100) Hz 0.12 % + 5 mA

(0.1 to 1) kHz 0.15 % + 5 mA
(1 to 5) kHz 3.1 % + 5 mA

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 5 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Current3 – Generate
(cont)

(> 20.5 to 1025) A (45 to 65) Hz 0.67 % + 0.9 A Fluke 552XA with
(65 to 440) Hz 1.2 % + 0.9 A Fluke 5500A/coil

AC Current3 – Measure

(0 to 100) µA (10 to 20) Hz 0.51 % + 3 nA HP 3458A, option II

(20 to 45) Hz 0.21 % + 3 nA
(45 to 100) Hz 0.13 % + 3 nA
100 Hz to 1 kHz 0.13 % + 3 nA

(0.1 to 1) mA (10 to 20) Hz 0.49 % + 0.2 µA

(20 to 45) Hz 0.21 % + 0.2 µA
(45 to 100) Hz 0.1 % + 0.2 µA
100 Hz to 5 kHz 0.061 % + 0.2 µA
(5 to 20) kHz 0.085 % + 0.2 µA

(1 to 10) mA (10 to 20) Hz 0.49 % + 2 µA

(20 to 45) Hz 0.17 % + 2 µA
(45 to 100) Hz 0.085 % + 2 µA
100 Hz to 5 kHz 0.061 % + 2 µA
(5 to 20) kHz 0.069 % + 2 µA

(10 to 100) mA (10 to 20) Hz 0.49 % + 20 µA

(20 to 45) Hz 0.18 % + 20 µA
(45 to 100) Hz 0.078 % + 20 µA
100 Hz to 5 kHz 0.061 % + 20 µA
(5 to 20) kHz 0.085 % + 20 µA

100 mA to 1 A (10 to 20) Hz 0.5 % + 0.2 mA

(20 to 45) Hz 0.24 % + 0.2 mA
(45 to 100) Hz 0.15 % + 0.2 mA
100 Hz to 5 kHz 0.18 % + 0.2 mA

(1 to 10) A (45 to 1000) Hz 0.03 % HP 3458A w/ Fluke

(1 to 5) kHz 0.08 % Y5020A current shunt

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 6 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage3 – Generate

(0 to 2.2) mV (10 to 20) Hz 0.095 % + 4.5 µV Fluke 5700A

(20 to 40) Hz 0.073 % + 4.5 µV
(40 to 20 000) Hz 0.073 % + 4.5 µV
(20 to 50) kHz 0.12 % + 4.5 µV
(50 to 100) kHz 0.15 % + 7 µV
(100 to 300) kHz 0.21 % + 13 µV
(300 to 500) kHz 0.3 % + 25 µV
(500 to 1000) kHz 0.54 % + 25 µV

(2.2 to 22) mV (10 to 20) Hz 0.064 % + 5 µV

(20 to 40) Hz 0.025 % + 5 µV
(40 to 20 000) Hz 0.015 % + 5 µV
(20 to 50) kHz 0.045 % + 5 µV
(50 to 100) kHz 0.1 % + 7 µV
(100 to 300) kHz 0.13 % + 12 µV
(300 to 500) kHz 0.2 % + 25 µV
(500 to 1000) kHz 0.41 % + 25 µV

(22 to 220) mV (10 to 20) Hz 0.064 % + 13 µV

(20 to 40) Hz 0.025 % + 8 µV
(40 to 20 000) Hz 0.013 % + 8 µV
(20 to 50) kHz 0.037 % + 8 µV
(50 to 100) kHz 0.1 % + 25 µV
(100 to 300) kHz 0.13 % + 25 µV
(300 to 500) kHz 0.2 % + 35 µV
(500 to 1000) kHz 0.4 % + 80 µV

(0.22 to 2.2) V (10 to 20) Hz 0.06 % + 80 µV

(20 to 40) Hz 0.019 % + 25 µV
(40 to 20 000) Hz 0.0091 % + 6 µV
(20 to 50) kHz 0.014 % + 16 µV
(50 to 100) kHz 0.029 % + 70 µV
(100 to 300) kHz 0.05 % + 130 µV
(300 to 500) kHz 0.12 % + 350 µV
(500 to 1000) kHz 0.26 % + 850 µV

(2.2 to 22) V (10 to 20) Hz 0.06 % + 800 µV

(20 to 40) Hz 0.019 % + 250 µV
(40 to 20 000) Hz 0.0091 % + 60 µV
(20 to 50) kHz 0.014 % + 160 µV
(50 to 100) kHz 0.029 % + 350 µV
(100 to 300) kHz 0.059 % + 1.5 mV
(300 to 500) kHz 0.15 % + 4.3 mV
(500 to 1000) kHz 0.32 % + 8.5 mV

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 7 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage3 – Fluke 5700A

Generate (cont)

(22 to 220) V* (10 to 20) Hz 0.059 % + 8 mV *220V range subject

(20 to 40) Hz 0.019 % + 2.5 mV to 2.2E7 V-Hz
(40 to 20 000) Hz 0.0096 % + 0.8 mV limitation
(20 to 50) kHz 0.025 % + 3.5 mV
(50 to 100) kHz 0.059 % + 8 mV

(220 to 1100) V** (15 to 50) Hz 0.046 % + 16 mV **1100 V range

(50 to 1000) Hz 0.0091 % + 3.5 mV subject to 250 V
limitation

AC Voltage3 – Measure

(0 to 10) mV (40 to 1000) Hz 0.023 % + 1.1 μV HP 3458A, option II

(1 to 20) kHz 0.035 % + 1.1 μV
(20 to 50) kHz 0.12 % + 1.1 μV
(50 to 100) kHz 0.58 % + 1.1 μV
(100 to 300) kHz 4.6 % + 2 μV

(10 to 100) mV (40 to 1000) Hz 0.0087 % + 2 μV

(1 to 20) kHz 0.017 % + 2 μV
(20 to 50) kHz 0.035 % + 2 μV
(50 to 100) kHz 0.093 % + 2 μV
(100 to 300) kHz 0.35 % + 10 μV
(300 to 1000) kHz 1.2 % + 10 μV
(1 to 2) MHz 1.7 % + 10 μV

100 mV to 1 V (40 to 1000) Hz 0.0081 % + 20 μV

(1 to 20) kHz 0.016 % + 20 μV
(20 to 50) kHz 0.035 % + 20 μV
(50 to 100) kHz 0.092 % + 20 μV
(100 to 300) kHz 0.35 % + 0.1 mV
(300 to 1000) kHz 1.2 % + 0.1 mV
(1 to 2) MHz 1.7 % + 0.1 mV

(1 to 10) V (40 to 1000) Hz 0.0081 % + 0.2 mV

(1 to 20) kHz 0.016 % + 0.2 mV
(20 to 50) kHz 0.035 % + 0.2 mV
(50 to 100) kHz 0.92 % + 0.2 mV
(100 to 300) kHz 0.35 % + 1 mV
(300 to 1000) kHz 1.2 % + 1 mV

(10 to 100) V (40 to 1000) Hz 0.023 % + 2 mV

(1 to 20) kHz 0.023 % + 2 mV
(20 to 50) kHz 0.040 % + 2 mV
(50 to 100) kHz 0.14 % + 2 mV

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 8 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage3 – Measure
(cont)

(100 to 1000) V (40 to 1000) Hz 0.51 % + 20 mV HP 3458A, option II

Capacitance3 – Generate
(0.19 to 0.4) nF 10 Hz to 10 kHz 0.58 % + 0.01 nF Fluke 5520A
(0.4 to 1.1) nF 10 Hz to 10 kHz 0.52 % + 0.01 nF
(1.1 to 3.3) nF 10 Hz to 3 kHz 0.52 % + 0.01 nF
(3.3 to 11) nF 10 Hz to 1 kHz 0.28 % + 0.01 nF
(11 to 33) nF 10 Hz to 1 kHz 0.26 % + 0.1 nF
(33 to 110) nF 10 Hz to 1 kHz 0.26 % + 0.1 nF
(110 to 330) nF 10 Hz to 1 kHz 0.26 % + 0.3 nF
(0.33 to 1.1) μF (10 to 600) Hz 0.26 % + 1 nF
(1.1 to 3.3) μF (10 to 300) Hz 0.26 % + 3 nF
(3.3 to 11) μF (10 to 150) Hz 0.26 % + 10 nF
(11 to 33) μF (10 to 120) Hz 0.41 % + 30 nF
(33 to 110) μF (10 to 80) Hz 0.46 % + 0.1 µF
(110 to 330) μF (10 to 50) Hz 0.47 % + 0.3 µF
(0.33 to 1.1) mF (0 to 20) Hz 0.46 % + 1 μF
(1.1 to 3.3) mF (0 to 6) Hz 0.47 % + 3 μF
(3.3 to 11) mF (0 to 2) Hz 0.47 % + 10 μF
(11 to 33) mF (0 to 0.6) Hz 0.76 % + 30 μF
(33 to 110) mF (0 to 0.2) Hz 1.1 % + 0.10 mF

Oscilloscopes –

Amplitude, DC Signal
50 Ω Load (-6.6 to 6.6) V 0.29 % IV + 40 µV Fluke 5522A/SC1100
1 MΩ Load (-130 to 130) V 0.058 % IV + 40 µV

Amplitude, Square
Wave
50 Ω Load ±1 mV to ±6.6 Vp-p 0.29 % IV + 40 µV
10 Hz to 10 kHz

1 MΩ Load ±1 mV to ±130 Vp-p 0.12 % IV + 40 µV

10 Hz to 1 kHz

Time Marker into 5 s to 50 ms 29 parts in 106 + 1000

50 Ω Load-Source parts in 106/s
20 ms to 2 ns 2.9 parts in 106

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 9 of 24

 Parameter/Range Frequency CMC2, 4 (±) Comments

Oscilloscopes – (cont)

Leveled Sine Wave 50 kHz to 100 MHz 2.0 % Fluke 9500B with
Relative to 50 kHz (100 to 300) MHz 2.5 % active head(s)
[5 mV to 5.5 V] p-p (300 to 600) MHz 4.7 %
(550 to 1100) MHz 4.3 %
(1.1 to 3.2) GHz 5.3 %
(3.2 to 6.0) GHz 5.3 %

Rise Time 10 Hz to 2 MHz 20 ps

(125 to 175) ps

10 Hz to 1 MHz 14 ps
(59 to 81) ps

Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Capacitance – Fixed 100 pF 0.059 % Standard capacitors

Points 1 nF to 1 µF 0.016 %

Capacitance – Measure 10 pF to 1.1 µF 0.018 % Gen Rad 1615A

capacitance bridge

DC Current3 – Generate 0.1 nA to 220 µA 130 µA/A + 8 nA Fluke 5700A

(0.22 to 2.2) mA 130 µA/A + 8 nA
(2.2 to 22) mA 130 µA/A + 80 nA
(22 to 220) mA 150 µA/A + 0.8 µA
(0.22 to 2.2) A 200 µA/A + 25 µA

(1.1 to 3) A 0.039 % + 40 µA Fluke 5520A

(3 to 11) A 0.052 % + 0.33 mA
(11 to 20) A 0.1 % + 0.75 mA

DC Current3 – Measure (10 to 100) µA 22 µA/A + 0.8 nA HP 3458A, option II

(0.1 to 1) mA 21 µA/A + 5 nA
(1 to 10) mA 21 µA/A + 50 nA
(10 to 100) mA 35 µA/A + 0.5 µA
(0.1 to 1) A 0.011 % + 10 µA
(1 to 10) A 0.032 % + 0.6 mA HP 3458A w/ Fluke
(10 to 20) A 0.027 % + 3.3 mA Y5020 shunt

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 10 of 24

 Parameter/Equipment Range CMC2, 4, 10 (±) Comments

DC Voltage3 – Measure (0 to 100) mV 5.2 µV/V + 0.3 μV HP 3458A, option II

(0.1 to 1) V 4.1 µV/V + 0.3 μV
(1.0 to 10) V 4.0 µV/V + 0.5 μV
(10 to 100) V 6.2 µV/V + 30 μV
(100 to 1000) V 63 µV/V + 0.1 mV* *Add 12 mV/V·
(Vin/1000)2 for input
>100 V

DC Voltage3 – Generate (0 to 220) mV 18 µV/V + 0.6 µV Fluke 5700A

(0 to 2.2) V 21 µV/V + 1 µV
(2.2 to 11) V 9 µV/V + 3.5 µV
(11 to 22) V 18 µV/V + 6.5 µV
(22 to 220) V 20 µV/V + 80 µV
(220 to 1100) V 12 µV/V + 500 µV

Inductance – Measure
@ 100 Hz 100 µH to 5 H 0.3 % Standard inductor set
Fixed Values with Gen Rad 1632A
bridge as transfer
standard

Inductance – Generate 100 µH to 5.0 H 0.071 % Gen Rad 1482

standard inductors

Resistance3 – Measure (0 to 10) Ω 15 µΩ/Ω + 0.05 mΩ HP 3458A, option II

(10 to 100) Ω 13 µΩ/Ω + 0.50 mΩ
100 Ω to 1 kΩ 10 µΩ/Ω + 5.0 mΩ
(1 to 10) kΩ 10 µΩ/Ω + 50 mΩ
(10 to 100) kΩ 10 µΩ/Ω + 50 mΩ
100 kΩ to 1 MΩ 16 µΩ/Ω + 2.0 Ω
(1 to 10) MΩ 52 µΩ/Ω + 100 Ω
(10 to 100) MΩ 0.051 % + 1.0 kΩ
100 MΩ to 1 GΩ 0.5 % + 10 kΩ

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 11 of 24

 Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Resistance3 – Generate (0 to 11) Ω 46 µΩ/Ω + 0.0010 Ω Fluke 5520A

(11 to 33) Ω 32 µΩ/Ω + 0.0015 Ω
(33 to 110) Ω 30 µΩ/Ω + 0.0015 Ω
(110 to 330) Ω 29 µΩ/Ω + 0.0020 Ω
(0.33 to 1.1) kΩ 29 µΩ/Ω + 0.0020 Ω
(1.1 to 3.3) kΩ 29 µΩ/Ω + 0.020 Ω
(3.3 to 11) kΩ 29 µΩ/Ω + 0.020 Ω
(11 to 33) kΩ 29 µΩ/Ω + 0.2 Ω
(33 to 110) kΩ 29 µΩ/Ω + 0.20 Ω
(110 to 330) kΩ 36 µΩ/Ω + 2.0 Ω
(0.33 to 1.1) MΩ 39 µΩ/Ω + 2.0 Ω
(0.50 to 3.3) MΩ 77 µΩ/Ω + 30 Ω
(3.3 to 11) MΩ 0.016 % + 50 Ω
(11 to 33) MΩ 0.031 % + 2.5 kΩ
(33 to 110) MΩ 0.084 % + 3.0 kΩ
(110 to 330) MΩ 0.33 % + 0.10 MΩ
(330 to 1100) MΩ 1.8 % + 0.50 MΩ

Resistance – Generate, 1 and 10 mΩ 4.7 µΩ/Ω L&N reference

Fixed Values resistors

(0.1, 1, 10, 100) Ω 4.7 µΩ/Ω ESI SR1010 reference

(1, 10, 100, 1000) kΩ 4.7 µΩ/Ω resistors

0Ω 4.8 µΩ Copper shorting block

1Ω 120 µΩ Fluke 5700A

1.9 Ω 210 µΩ
10 Ω 340 µΩ
19 Ω 620 µΩ
100 Ω 2 mΩ
190 Ω 3.8 mΩ
1 kΩ 15 mΩ
1.9 kΩ 29 mΩ
10 kΩ 140 mΩ
19 kΩ 270 mΩ
100 kΩ 1.6 Ω
190 kΩ 3.1 Ω
1 MΩ 23 Ω
1.9 MΩ 48 Ω
10 MΩ 480 Ω
19 MΩ 1.1 kΩ
100 MΩ 13 kΩ

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 12 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Electrical Thermocouple3
–

Type C (0 to 150) °C 0.35 °C Fluke 5520A

(150 to 650) °C 0.3 °C
(650 to 1000) °C 0.36 °C
(1000 to 1800) °C 0.58 °C
(1800 to 2316) °C 0.97 °C

Type E (-250 to -100) °C 0.76 °C

(-100 to -25) °C 0.32 °C
(-25 to 350) °C 0.25 °C
(350 to 650) °C 0.26 °C
(650 to 1000) °C 0.31 °C

Type J (-210 to -100) °C 0.31 °C

(-100 to -30) °C 0.19 °C
(-30 to 150) °C 0.16 °C
(150 to 760) °C 0.2 °C
(760 to 1200) °C 0.27 °C

Type K (-200 to -100) °C 0.38 °C

(-100 to -25) °C 0.21 °C
(-25 to 120) °C 0.19 °C
(120 to 1000) °C 0.3 °C
(1000 to 1372) °C 0.46 °C

Type N (-200 to -100) °C 0.46 °C

(-100 to -25) °C 0.25 °C
(-25 to 120) °C 0.22 °C
(120 to 410) °C 0.21 °C
(410 to 1300) °C 0.31 °C

Type R (0 to 250) °C 0.75 °C

(250 to 400) °C 0.48 °C
(400 to 1000) °C 0.38 °C
(1000 to 1767) °C 0.47 °C

Type S (0 to 250) °C 0.54 °C

(250 to 1000) °C 0.42 °C
(1000 to 1400) °C 0.4 °C
(1400 to 1767) °C 0.53 °C

Type T (-250 to -150) °C 0.73 °C

(-150 to 0) °C 0.28 °C
(0 to 120) °C 0.19 °C
(120 to 400) °C 0.16 °C

Type U (-200 to 0) °C 0.65 °C

(0 to 600) °C 0.31 °C

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 13 of 24

 Parameter/Equipment Range CMC2 (±) Comments

Electrical RTD
Simulation3 –

Pt 385, 100 Ω (-200 to -80) °C 0.058 °C Fluke 5520A

(-80 to 0) °C 0.058 °C
(0 to 100) °C 0.085 °C
(100 to 300) °C 0.1 °C
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.12 °C
(630 to 800) °C 0.27 °C

Pt 3926, 100 Ω (-200 to -80) °C 0.058 °C

(-80 to 0) °C 0.058 °C
(0 to 100) °C 0.081 °C
(100 to 300) °C 0.1 °C
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.14 °C

Pt 3916, 100 Ω (-200 to -190) °C 0.29 °C

(-190 to -80) °C 0.046 °C
(-80 to 0) °C 0.058 °C
(0 to 100) °C 0.069 °C
(100 to 260) °C 0.081 °C
(260 to 300) °C 0.092 °C
(300 to 400) °C 0.1 °C
(400 to 600) °C 0.12 °C
(600 to 630) °C 0.27 °C

Pt 385, 200 Ω (-200 to -80) °C 0.046 °C

(-80 to 0) °C 0.046 °C
(0 to 100) °C 0.046 °C
(100 to 260) °C 0.058 °C
(260 to 300) °C 0.14 °C
(300 to 400) °C 0.15 °C
(400 to 600) °C 0.16 °C
(600 to 630) °C 0.18 °C

Pt 385, 500 Ω (-200 to -80) °C 0.047 °C

(-80 to 0) °C 0.058 °C
(0 to 100) °C 0.058 °C
(100 to 260) °C 0.069 °C
(260 to 300) °C 0.093 °C
(300 to 400) °C 0.093 °C
(400 to 600) °C 0.1 °C
(600 to 630) °C 0.13 °C

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 14 of 24

 Parameter/Equipment Range CMC2 (±) Comments

Electrical RTD
Simulation3 (cont) –

Pt 385, 1000 Ω (-200 to -80) °C 0.035 °C Fluke 5520A

(-80 to 0) °C 0.035 °C
(0 to 100) °C 0.046 °C
(100 to 260) °C 0.058 °C
(260 to 300) °C 0.069 °C
(300 to 400) °C 0.081 °C
(400 to 600) °C 0.081 °C
(600 to 630) °C 0.27 °C

PtNi 385, 120 Ω (-80 to 0) °C 0.092 °C

(0 to 100) °C 0.092 °C
(100 to 260) °C 0.16 °C

Cu 427, 10 Ω (-100 to 260) °C 0.35 °C

V. Electrical – RF/Microwave

Parameter/Range Frequency CMC2, 4 (±) Comments

RF Absolute Power3, 5 –
Measure

1 mW Reference 50 MHz 0.45 % HP 8478B sensor w/

HP 432A power
meter and type N
connector

Power meter w/:

(-30 to 10) dBm 100 kHz to 4.2 GHz 1.4 % 8482A power sensor
(4.2 to 18) GHz 1.9 % 8481A power sensor

(10 to 20) dBm 100 kHz to 4.2 GHz 3.7 % 8482A power sensor
(4.2 to 18) GHz 3.9 % 8481A power sensor

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 15 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

RF Absolute Power3, 5 – 50 MHz to 18 GHz 0.10 dB HP 11792A sensor

Measure (cont) w/ HP 8902A,
HP 11793A,
and APC 3.5 mm
connector

RF Absolute Power3, 5 –
Generate

Sine Wave into 50 Ω

(10 to 3) Vp-p (0.001 to 100) kHz 0.12 dB HP 3325 synthesized

100 kHz to 20 MHz 0.37 dB function generator w/
BNC connector
2.99 Vp-p to 1 mVp-p 0.001 Hz to 100 kHz 0.26 dB
100 kHz to 10 MHz 0.60 dB

2.99 Vp-p to 100 mVp-p (10 to 20) MHz 0.60 dB

(99.9 to 1) mVp-p (10 to 20) MHz 0.60 dB

(13.01 to -4.99) dBm 200 Hz to 80 MHz 0.19 dB HP3335A

synthesized
(-6.99 to -44.99) dBm 200 Hz to 80 MHz 0.21 dB level generator in 2
dBm steps, w/ BNC
(-46.99 to -84.99) dBm 200 Hz to 80 MHz 0.29 dB connector

RF Tuned Power –
Measure

(0 to -127) dB (2.5 to 1300) MHz 0.11 dB + 0.000 83 % HP 11722A/11792A

sensors w/ HP
(0 to -127) dB 2.5 MHz to 18 GHz 0.11 dB + 0.004 % 8902A, 11793A
converter and type N
or type APC 3.5 mm
connectors

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 16 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

Amplitude Modulation –
Generate

AM Flatness
Carrier Frequency: Rate Frequency:

(11 to 13.5) MHz 50 Hz to 50 kHz 0.16 % HP 11715A AM/FM

Depth: (0 to 99) % 20 Hz to 100 kHz 0.32 % test source

Amplitude Modulation –
Measure

Carrier Frequency: Rate Frequency:

(0.15 to 10) MHz

Depth: (5 to 99) % 50 Hz to 10 kHz 3.5 % + 1 digit HP 8902A w/ HP
(0 to 99) % 20 Hz to 10 kHz 4.1 % + 1 digit 11722A and
11792A
(10 to 1300) MHz sensors and HP
Depth: (5 to 99) % 50 Hz to 50 kHz 1.6 % + 1 digit 11793A
converter
(1.3 to 18) GHz
Depth: (5 to 99) % 50 Hz to 50 kHz 3.2 % + 1 digit

10 MHz to 18 GHz
Depth: (0 to 99) % 20 Hz to 100 kHz 4.2 % + 1 digit

Frequency Modulation –
Measure

Carrier Frequency: Rate Frequency:

(0.25 to 10) MHz 20 Hz to 10 kHz 2.3 % + 1 digit HP 8902A w/ HP

≤ 40 kHz Peak 11722A and
Deviation 11792A
sensors and 11793A
10 MHz to 18 GHz 50 Hz to 100 kHz 3.0 % + 1 digit converter
≤ 400 kHz Peak 20 Hz to 400 kHz 6.7 % + 1 digit
Deviation

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 17 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

Frequency Modulation –
Generate

FM Flatness
Carrier Frequency: Rate Frequency:

(11 to 13.5) MHz DC to 100 kHz 0.33 % HP 11715A AM/FM

(100 to 200) kHz 0.43 % test source

(88 to 108) MHz DC to 100 kHz 0.34 %

(100 to 200) kHz 0.43 %

(352 to 432) MHz DC to 100 kHz 0.34 %

(100 to 200) kHz 0.43 %

Phase Modulation – Measure

Carrier Frequency: Rate Frequency:

(0.15 to 10) MHz 200 Hz to 10 kHz 4.8 % + 1 digit HP 8902A w/ HP

11792A and 11722A
10 MHz to 18 GHz 200 Hz to 20 kHz 4.6 % + 1 digit sensors

RF Volts – Measure,
Fixed Points

3V (1 to 10) MHz 0.091 % HP 11049A thermal

(10 to 30) MHz 0.11 % voltage converter
(30 to 50) MHz 0.19 %
(50 to 70) MHz 0.30 %
(70 to 80) MHz 0.32 %
(80 to 100) MHz 0.38 %

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 18 of 24

VI. Mechanical

Parameter/Equipment Range CMC2, 4, 6, 10 (±) Comments

Torque Wrench (2.5 to 25) in∙lbf 0.32 % of IV from (10 to Larson STWCS
100) % FS

(10 to 3120) in∙lbf 0.24 % of IV

from (10 to 100) % FS

(0 to 1000) in·ozf 0.49 % of IV Futek torque system

(10 to 100) % of range

(0 to 600) ft·lbf 1.8 ft·lbf

(10 to 100) % of range

Torque – Measuring
Equipment

Torque Transducers (0.6 to 42) ft·lbf 0.032 % IV Torque arm/dead

(1.7 to 600) ft·lbf 0.042 % IV weight

Acceleration/Vibration (5 to 2000) Hz 1.3 % IV Back to back

– Measuring Equipment (2 to 10) kHz 1.1 % IV comparison method

Pressure Gauges –
Measuring Equipment

Pneumatic (-5 to 5) psig 0.0065 % IV + 0.0005 psig Pace 6000

(-15 to 50) psig 0.0055 % IV + 0.0033 psig

(-15 to 300) psig 0.0085 % IV + 0.015 psig

(-14.5 to 1000) psig 0.011 % IV + 0.051 psig

Hydraulic (1000 to 10 000) psig 0.041 % Deadweight tester

(0 to 10) inH2O 0.006 in∙H2O Meriam manometer

Absolute Pressure – (9 to 20) psia 0.0058 % IV Pace 6000

Measuring Equipment (0.5 to 80) psia 0.0058 % IV
and Measure (0.5 to 330) psia 0.0063 % IV
(0.5 to 1030) psia 0.0064 % IV

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 19 of 24

 Parameter/Equipment Range CMC2, 4, 6 (±) Comments

Scales and Balances3 – (0.5 to 629) lb 0.01 % + 0.6R ASTM Class 6 weights

Analytical Balances3 (20 to 100) mg 0.031 mg + 0.19 mg/g ASTM Class 1 weights

(100 to 500) mg 0.043 mg + 0.076 mg/g

(1 to 10) g 0.033 mg + 0.002 mg/g

(10 to 100) g 0.03 mg + 0.0023 mg/g

(0.1 to 3) kg 0.0034 % + 0.6R

Force3, 7 – Measuring (0.5 to 500) lbf 0.01 % IV + 0.6R ASTM Class 6 weights
Equipment
(100 to 1000) lbf 0.061 % FS Load cells
(200 to 2000) lbf 0.050 % FS
(500 to 5000) lbf 0.049 % FS
(1000 to 10 000) lbf 0.049 % FS
(2500 to 25 000) lbf 0.056 % FS
(5000 to 50 000) lbf 0.049 % FS
(10 000 to 100 000) lbf 0.064 % FS

(50 000 to 500 000) lbf 0.05 % FS Compression only

Rockwell Hardness3 – HRA: ASTM E18

Indirect Verification of Low 0.54 HRA
Superficial Hardness Medium 0.43 HRA
Testers High 0.32 HRA

HRBW:
Low 0.83 HRBW
Medium 1.0 HRBW
High 0.79 HRBW

HRC:
Low 0.86 HRC
Medium 1.0 HRC
High 0.44 HRC

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 20 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Rockwell Hardness3 – HRRW 1.6 HRRW ASTM E18

Indirect Verification of
Superficial Hardness HR15N:
Testers (cont) Low 0.99 HR15N
Medium 0.80 HR15N
High 0.97 HR15N

HR30N:
Low 0.49 HR30N
Medium 0.78 HR30N
High 0.38 HR30N

HR15TW:
Low 0.52 HR15TW
Medium 0.59 HR15TW
High 0.48 HR15TW

HR30TW:
Low 0.97 HR30TW
Medium 0.77 HR30TW
High 0.57 HR30TW

Universal Testing (0.5 to 500) lbf 0.011 % IV ASTM E4, load cells
Machine, Compression (100 to 1000) lbf 0.061 % FS and dead weights
Testing Machines, (200 to 2000) lbf 0.050 % FS tension and
Tension Testing (500 to 5000) lbf 0.058 % FS compression
Machines3 (1000 to 10 000) lbf 0.049 % FS

(2500 to 25 000) lbf 0.056 % FS Compression only

(5000 to 50 000) lbf 0.056 % FS
(10 000 to 100 000) lbf 0.056 % FS
(50 000 to 500 000) lbf 0.056 % FS

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 21 of 24

VII. Thermodynamics

Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Temperature3 – (-40 to 150) °C 0.014 °C + 42 μ°C/°C Fluke 1502 w/ 5628 PRT

Measuring Equipment in bath

(-50 to 660) °C 0.036 °C + 0.16 m°C/°C Fluke 1502 w/ 5609 PRT

Infrared Temperature3 – (25 to 400) °C 1.9 °C + 0.001 °C/°C Black body

Measure

Temperature3 – (-50 to 660) °C 0.031 °C + 72 μ°C/°C Fluke 1502 w/ 5628 PRT

Measure
(93 to 649) °C 1.4 °C + 3.3 m°C/°C Type N thermocouple

Thermocouples –

Types B, C, E, J, K (-50 to 660) °C 0.23 °C + 0.12 m°C/°C Fluke 5520A/

N, R, S, T, U Fluke 1502A/5628

RTDs – (-50 to 660) °C 0.038 °C HP3458A/Hart 1502A/

5628

Relative Humidity – (10 to 95) % RH 0.7 % RH Thunder Scientific 2500

Measuring Equipment
Relative Humidity3 – 11.3 % RH 1.6 % RH Vaisala HMK15
Measuring Equipment 33 % RH 1.6 % RH
75.5 % RH 2.0 % RH
97.7 % RH 2.6 % RH

Relative Humidity3 – (11.3 to 90) % RH 1.9 % RH Vaisala MI70/HMP77B

Measure (90 to 97.7) % RH 2.5 % RH

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 22 of 24

VIII. Time & Frequency

Parameter/Equipment Range CMC2, 10 (±) Comments

Frequency – Measuring 10 MHz 5.7 x 10-12 Hz/Hz NOVAS WR 2410

Equipment GPS receiver

Frequency – Measure 0.01 Hz to 18 GHz 1.6 x 10-9 Hz/Hz NOVAS WR 2410 GPS
receiver with Frequency
Counter

Period – Measure 1 μs to 1000 s 1.2 x 10-9 s/s NOVAS WR 2410 GPS

receiver with Frequency
Counter

Stopwatches 24 hr 33 ms NIST RP 960-12

(2 to 120) s 0.039 s/day Timometer
____________________________________________

1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General
Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations.
Please note the actual measurement uncertainties achievable on a customer's site can normally be
expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such
as the environment at the place of calibration and for other possible adverse effects such as those caused
by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced
by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result
in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4
In the statement of CMC, the value is defined as the percentage of reading unless otherwise indicated; IV
represents Indicated Value and FS represents Full Scale.
5
The CMCs do not include mismatch.
6
In the statement of CMC, L represents the length of the unit under test in inches or millimeters, where
appropriate; R represents the resolution of the unit under test.
7
Greater than 100 kN, field service available only.
8
Repeatability of the Unit Under Test has not been utilized in the calculation of the CMC value for this
measurement parameter.
9
This scope meets A2LA’s P112 Flexible Scope Policy.

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 23 of 24

10
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.

11
This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for
the types of dimensional tests listed above and is considered equivalent to that of a calibration.

(A2LA Cert. No. 1277.01) Revised 01/31/2020 Page 24 of 24

 Accredited Laboratory
A2LA has accredited

NOVASTAR METROLOGY
Livonia, MI
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSL
Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 10th day of April 2019.

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1277.01
Valid to March 31, 2021
Revised January 31, 2020

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.