1078 01

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
& ANSI/NCSL Z540-1-1994
TRESCAL, INC.10
7350 North Teutonia Avenue
Milwaukee, WI 53209
Nathan Thrasher Phone: 414 351 7420
CALIBRATION
Valid To: November 30, 2023 Certificate Number: 1078.01
In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1, 10, 16:
I. Acoustical Quantities
Parameter/Equipment Range CMC2, 8, 14 (±) Comments
Sound Level3
Generate (85 to 140) dB 0.20 dB + 0.032 % Piston phone,

transducer
Measure (Meters) (20 to 140) dB 0.32 dB Sound level calibrator
II. Chemical
Parameter/Equipment Range CMC2 (±) Comments
Conductivity Meters (1 to 10) µS/cm 0.34 µS/cm Conductivity

(50 to 100) µS/cm 0.96 µS/cm solutions
(1000 to 1413) µS/cm 5.5 µS/cm
(5 to 100) mS/cm 750 µS/cm
(150 to 200) mS/cm 1.5 mS/cm
pH Meters3 4 pH 0.011 pH Standard buffers

7 pH 0.011 pH
10 pH 0.012 pH
(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 1 of 50

III. Dimensional
Parameter/Equipment Range CMC2, 4 (±) Comments
Angle Blocks Up to 60° (0.36 + 1.1Ө/20) arcsec Sine bar, gage blocks,
gage amp & probe,
where Ө = angle
Angle Plates3 Up to 48 in 65 µin or (12 µin/in + 30 Gage amp. probe,

µin), whichever is indi-square & test
greater indicator
Articulating Arm3 (CMM) – ASME B89.4.22-2004
Single Point Articulation (2 to 10.5) ft Rsys
Effective Diameter 1 in (25.4 mm) 16 µin + Rsys Rsys is the std. dev. of
repeated UUT test
Volumetric Up to 76 in (3.7L + 14) µin + Rsys results during each
test parameter
Scanner Head 1 in (25.4 mm) 34 µin + Rsys
Bench Center –
Center Parallelism Up to 24 in (68 + 4L) µin Gage amp w/ probe
Base Flatness & Base Up to 24 in (62 +2.5L) µin

Parallelism

Bore Gages3 Up to 12 in 22 µin or 0.6R SIP302M

(whichever is greater)
Box Parallels –
Parallelism 5 in × 10 in × 10 in 28 µin Gage amp w/probe,

Squareness 5 in × 10 in × 10 in 12 µin/in + 38 µin cylindrical square
Calipers3 (Including Intertest,

Oditest, Snap Jaw & Other
OD Calipers) –
Resolution 0.0001 in Up to 2 in 78 µin Gage blocks

(2 to 12) in 70 µin + 4 µin/in
Resolution 0.0005 in Up to 24 in 450 µin

(24 to 60) in 340 µin + 3.7 µin/in

(30 to 100) in 700 µin + 3.4 µin/in
Chamfer Gages/Hole Gages3 Up to 12 in 20 µin + 0.6R Cylindrical rings
Clinometers & Up to 360° 0.18 arcseconds + 37 Sine bar/gage blocks

Inclinometers, & Electronic parts in 106
Levels
CMMs – Imaging (Video XY Diagonal Up to ISO 10360-7

CMMs/Vision Systems)3 36.5 in (Unidirectional)
Length Measurements
EUX, EUY, EUXY Up to 24 in (23 + 2.9L) µin Glass scales
EUV Up to 2 in (15 + 2.9L) µin Glass scales
EZ Up to 8 in (Z-axis) (41 + 3.2L) µin Gage blocks
Squareness – ESQ Up to 8 in (Z-axis) (19 + 130L) µin Ball bar
Probing Performance Diameter

PF2D, PFV2D Measured:
(0.012 to 0.12) in 16 µin Test circles
(0.12 to 0.4) in. 25 µin

CMMs3 –
Length Error (EL) Up to 52 in 38 µin + 5.2 µin/in ASME

B89.4.1.10360.2, ISO
Repeatability Range (R0) Up to 52 in 22 µin + 3 µin/in 10360-2
Coating Thickness 25 µin to 0.5 in 19 µin + 82 µin/in ULM

Shims/Precision Shims
Concentricity Gage N/A 130 µin + 8 μin/in Indicator, bench center
Cylindrical Plugs3 Up to 4 in 4 µin + 5 µin/in ULM, gage blocks

(4 to 20) in 4 µin + 5.4 µin/in
Cylindrical Rings3 (0.1 to 4) in 4 µin + 5 µin/in ULM, gage blocks

(4 to 8.5) in 4 µin + 5.4 µin/in
(8.5 to 18) in 5.2 µin + 5.5 µin/in
(18 to 36) in 50 µin + 3 µin/in
External Spline Gages3 –
Measurement Over Pins Up to 8 in (170 + 28D) µin ULM
Circular Tooth Thickness Up to 8 in (110 + 16L) µin Vision system
Major Diameter Up to 8 in (28 + 12D) µin ULM
Fixed Gaging – Screw Pitch Up to 30 in (110 + 16L) µin Optical comparator,

Gages, Drill Gages, Taper (Length vision system, hand
Gages, Center Gages, Sheet Measures) tools, hand gages
& Wire Gages, Angle
Gages, Radius Gage,
Functional Gages Up to 2 in 110 µin CMM
(2 to 40) in (110 + 5.5L) µin
Up to 360° 54” Vision system

Gage Amplifier &

Probe(s)3
Single Probe Up to 0.025 in 8.9 µin Gage blocks

Dual Probe Up to 0.002 in 2.1 µin Gage blocks
Gage Balls Up to 4 in (32 + 1.5D) µin Universal length

machine (ULM)
Gage Blocks Up to 4 in (3.1 + 3.2L) µin Gage blocks &

(4 to 20) in (3.3 + 3.2L) µin comparator
Height Gage3 Up to 20 in (7 + 4.6H) µin Gage blocks, by

request
Up to 52 in (7.7 + 6.2H) µin
Reference stack, SOP
Height Measures3 Up to 0.0005 in 13 µin Heidenhain Certo

(0.0005 to 2) in (16 + 2.6H) µin
(0 to 24) in (160 + 5.4H) µin Trimos Vertical 3
Indicators3 – Dial & Test, Up to 4 in 35 µin or 0.6R Indicator calibrator

LVDTs (Whichever is Greater)
Indicator Calibrator3 Up to 4 in 12 µin + 0.6R Gage blocks, amp

w/probe
Laser Distance Meters Up to 6.1 m 4.6 µm/m + 120 µm ULM

Length & Thickness

Standards, Feeler Gages3 –
Steel Up to 4 in 4 µin + 5 µin/in ULM, gage blocks

(4 to 20) in 4 µin + 5.4 µin/in
(20 to 120) in 3.7 µin/in + 14 µin
Field Calibration Up to 16 in 5 µin + 14 µin/in + 4 ULM, gage blocks,

µin/in/°C Relative to 20/°C
Levels (Spirit, Bubble, Up to 96 in 5.1 arcseconds + (37 x 10-6) Surface plate & gage
Machinist)3 blocks
Linear Measurement of Up to 20 ft 1.5 μin/in + 0.58 μin Laser

Machine Tools Scales3
Linear Scales/Reticles &

Stage Micrometers –
2D Up to 12 in (120 + 15L) µin Vision system
1D Up to 30 in 11 µin + 1.5 µin/in Gitterperioden

interferometer
Micrometers3 –
Inside Up to 294 in 12 µin + 7 µin /in + 0.2R ULM, gage blocks or

Depth Up to 12 in 18 µin/in + 0.64R rings
Tri-Bores Up to 11 in 18 µin/in + 0.7R
Outside Up to 42 in 18 µin/in + 0.64R
Groove Up to 4 in 18 µin/in + 0.64R
Bench Up to 42 in 18 µin/in + 0.64R
Thread (Screw, Thread, Up to 4 in 18 µin/in + 0.64R
Pitch, Point)
Microscopes3 –
Reticule Up to 25 mm 23 µm Stage micrometer

Magnification Up to 1000x 2.4 %

Optical Comparator3 –
Linear Up to 12 in 0.000 2 in Glass scale

Angle (0 to 360)° 2’ Calibration sphere
Magnification 10x, 20x, 50x, 0.000 12 in Calibration sphere
62.5x, 100x, 200x
Optical Flats –
Flatness Up to 8 in 3.4 µin Reference flat &

monochromatic light
source
Parallelism11 Up to 1.5 in 3.1 µin Gage block

Diameter & 1 in comparator
Thickness
Parallels3 –
Parallelism Up to 72 in 1 µin/in + 20 µin Gage amp w/ probe
Pitch Micrometer Standards –
Length Up to 12 in (22 + 6L) µin UMM
Angle Up to 60° 54” Vision system
Precision Diameter Tapes Up to 38 in 1.3 µin/in + 280 µin Setting discs, ULM
(38 to 54) in 7.5 µin/in + 250 µin
(54 to 780) in 1.4 µin/in + 430 µin
Profilometers3 120 µin Ra 2.8 µin Roughness specimen
Protractor – Digital & (0 to 180)° 0.0076º Sine bar & gage

Mechanical3 blocks
Riser Blocks & Stands Up to 24 in 2 µin/in + 23 µin Gage amplifier w/

probe

Roundness Testers3 –
Coning Error Up to 16 in 11 µin Test ball & riser

cylinder
Axial Error Up to 16 in 11 µin Test ball
Radial Accuracy Up to 16 in 11 µin Test ball
Z-Axis Straightness (0.1 to 12) in (14 + 12H) µin Cylindrical square; in

the CMC
Sine Plates/Bars3 –
Flatness/Parallelism & Up to 20 in 53 µin Gage amp w/ probe,

Parallelism Cylinder to angle blocks & gage
Base blocks
Angle Calibration (0 to 90)º 0.000 45º (1.6 arcsec,

Center of Rolls 16 µin/in)
Up to 20 in 17 µin/in (1.8 arcsec)
Sand Sieves 20 µm to 125 mm (3.2 + 6.9L) µm ASTM E11, vision

system
Snap Gages3 –
Parallelism Up to 20 in 97 µin Box parallel with gage

amp & probe
Linear Accuracy Up to 20 in 1 µin/in + 49 µin
Sphericity Up to 4 in 17 µin Spindle less sphericity

fixture
Squares3 –
Master Squares (Class Up to 48 in 51 µin or (7 µin/in + 21 Indi-square & test

A Grade) µin), Whichever is Greater indicator, gage amp &
probe, gage locks
Granite, Steel, Up to 48 in 65 µin or (12 µin/in + 30
Cylindrical µin), Whichever is Greater

Straightness & Up to 72 in 1 µin/in + 19 µin Gage amplifier w/

Straight Edges3 probe
Step Gages, Step Bars, Up to 50 in (9.7 + 3H) µin Gage amp & probe,
Reference Stacks gage blocks
Surface Plates3 –
Flatness 18 in x 24 in to 8√D µin Electronic levels

72 in x 144 in
Repeatability Up to 72 in x 144 in 34 µin Repeat-o-meter
Surface Roughness3 (15 to 150) µin Ra 3.4 µin Verification of

specimens per ASME
B46.1
Tape Measures, Rulers3 Up to 10 ft 1200 µin + 2.1 µin/in ULM

(10 to 300) ft 220 µin + 6.8 µin/in
Tapered Plugs3 –
Simple Pitch Diameter Up to 18 in (100 + 12D) µin Thread wires/UMM
Notch Height Up to 18 in 13 µin/in + 94 µin Height measuring

machine
Tapered Rings3 –
Taper Up to 18 in 400 µin NPT master plug,

ULM
Standoff & Thickness Up to 18 in 120 µin NPT master plug &

height measuring
Functional Diameter Up to 2 in (300 + 8D) µin machine

Thread Plugs3 –
Simple Pitch Diameter Up to 20 in 82 µin + 6.8 µin/in 3-wire method
Major Diameter Up to 4 in 4 µin + 5 µin/in ULM, gage blocks

(4 to 8.5) in 4 µin + 5.4 µin/in
(8.5 to 20) in 5.2 µin + 5.5 µin/in
Thread Rings3 –
Simple Pitch Diameter Up to 18 in (140 + 9D) µin ULM

Minor Diameter Up to 2 in (70 + 13D) µin
Functional Diameter Up to 18 in (100 + 8D) µin w/ set plug
Thread Wires Up to 0.5 in (8.5 + 7D) µin ULM, gage blocks
Universal Length Up to 4 in 1.5 µin + 1.2 µin/in Gage blocks, force

Machines3 (ULMs) (4 to 24) in 1.3 µin + 1.8 µin/in gage, optical flat,
monochromatic light
source
V-Blocks –
Parallelism Side 8 in × 8 in × 8 in 28 µin Gage amplifier w/

probe
V Parallelism 8 in × 8 in × 8 in 1 µin/in + 28 µin Cylindrical square
Squareness 8 in × 8 in × 8 in 9.7 µin/in + 48 µin Cylindrical plug
Wire Crimpers3 –
Crimp Height Up to 00 Gauge 0.0024 in Micrometer
Crimping Chamber Up to 00 Gauge (10 + 19D) µin Pin
Ratchet Inspection Up to 00 Gauge 120 µin Feeler gage

IV. Electrical – DC/Low Frequency
Parameter/Range Frequency CMC2, 7 (±) Comments
AC Current – Max frequency up to

Generate & Measure3 3 mA is 30 kHz.
Fluke 5790A,
10 µA to 20 A 10 Hz to 50 kHz3 See Table IV.a 5700A/EP, A40s,
standard resistors
(20 to 70) A 10 Hz 85 µA/A Fluke 52120A,

(20 to 100) A 55 Hz 0.013 % A40B-100, DMM
300 Hz 0.012 %
1 kHz 0.012 %
5 kHz 0.036 %
(20 to 80) A 6 kHz 0.039 %
(20 to 50) A 10 kHz 0.092 %
Measure Only3
(100 to 1000) A 60 Hz 0.5 % Current clamp-on

meter
Generate Only–Turn
Amps3
(20 to 120) A (50 to 400) Hz 0.055 % + 0.6 A Fluke 55120A w/

(120 to 6000) A 0.80 % - 1.6 A 52120-3k & 52120-
6k coils
(20 to 120) A 1000 Hz 0.24 % + 0.24 A
AC Current – 50 Turn
Coils
Effective Current 25 Turn Amps, 50 Hz,400 Hz 0.11 % of ratio Comparison to

Transfer Ratio 500 Turn Amps, 50 Hz, 400 Hz 0.12 % of ratio standard coil
800 Turn Amps, 400 Hz 0.14 % of ratio
1000 Turn Amps, 50 Hz 0.14 % of ratio

TABLE IV.a AC Current Generate / Measure3 – CMCs
Current Range 10 Hz 20 Hz 40 Hz
(10 to 300) µA 170 µA/A + 0.03 nA 67 µA/A + 0.03 nA 37 µA/A + 0.03 nA
300 µA to 3 mA 170 µA/A + 0.3 nA 60 µA/A + 0.3 nA 29 µA/A + 0.3 nA
(3 to 10) mA 170 µA/A + 1 nA 69 µA/A + 1 nA 37 µA/A + 1 nA
500 mA to 1 A 170 µA/A + 6 µA 72 µA/A + 6 µA 41 µA/A + 6 µA
(1 to 2) A 170 µA/A + 12 µA 75 µA/A + 12 µA 42 µA/A + 12 µA
Current Range 400 Hz 1 kHz 5 kHz


TABLE IV.a (cont) AC Current Generate / Measure3 - CMCs
Current Range 10 kHz 20 kHz 50 kHz

Parameter/Range Frequency CMC2, 6, 8 (±) Comments
AC Power3 – Generate
PF = 1
(29 to 330) µA (10 to 20) Hz, 0.19 % Fluke 5520A

(0.33 to 3.3) mA 1 mV to 33 V 0.17 %
3.3 mA to 3.3 A 0.15 %
(29 to 330) µA (20 to 45) Hz, 0.15 %

(0.33 to 3.3) mA 1 mV to 33 V 0.11 %
(3.3 to 330) mA 0.080 %
330 mA to 3 A 0.15 %
(29 to 330) µA (45 to 100) Hz, 0.13 %

(0.33 to 3.3) mA 1 mV to 1020 V 0.088 %
(3.3 to 330) mA 0.041 %
330 mA to 1.1 A 0.052 %
(1.1 to 3) A 0.054 %
(3 to 11) A 0.065 %
(11 to 20.5) A 0.12 %

AC Power3 – Generate
PF = 1 (cont)
(29 to 330) µA 100 Hz to 1 kHz, 0.13 % Fluke 5520A

(0.33 to 3.3) mA 1 mV to 1020 V 0.088 %
(3.3 to 33) mA 0.041 %
(33 to 330) mA 0.041 %
330 mA to 1.1 A 0.052 %
(1.1 to 3) A 0.054 %
(3 to 11) A 0.095 %
(3 to 20.5) A 0.14 %
(29 to 330) µA (1 to 5) kHz, 0.28 %

(0.33 to 3.3) mA 1 mV to 1020 V 0.17 %
(3.3 to 33) mA 0.070 %
(33 to 330) mA 0.092 %
330 mA to 1.1 A 0.54 %
(1.1 to 3) A (1 to 5) kHz, 0.26 %

(3 to 11) A 1 mV to 1020 V 2.4 %
(11 to 20.5) A 2.4 %
(29 to 330) µA (5 to 10) kHz, 0.67 %

(0.33 to 3.3) mA 1 mV to 1020 V 0.40 %
(3.3 to 33) mA 0.17 %
(33 to 330) mA 0.18 %
330 mA to 1.1 A 2.3 %
(1.1 to 3) A 2.1 %
(29 to 330) µA (10 to 30) kHz, 1.3 %

(0.33 to 3.3) mA 1 mV to 330 V 0.79 %
(3.3 to 330) mA 0.32 %

AC Voltage – Measure
& Generate3
(0.6 to 2.2) mV (10 to 20) Hz 0.14 % + 1.1 µV Fluke 5790A, 5720A

(20 to 40) Hz 0.062 % + 1.1 µV
40 Hz to 20 kHz 0.040 % + 1.1 µV
(20 to 50) kHz 0.067 % + 1.6 µV
(50 to 100) kHz 0.097 % + 2.0 µV
(100 to 300) kHz 0.19 % + 3.2 µV
(300 to 500) kHz 0.19 % + 6.3 µV
500 kHz to 1 MHz 0.31 % + 6.3 µV
(2.2 to 7) mV (10 to 20) Hz 0.068 % + 1.1 µV

(20 to 40) Hz 0.032 % + 1.1 µV
40 Hz to 20 kHz 0.021 % + 1.1 µV
(20 to 50) kHz 0.034 % + 1.6 µV
(50 to 100) kHz 0.049 % + 2.0 µV
(100 to 300) kHz 0.096 % + 3.2 µV
(300 to 500) kHz 0.11 % + 6.3 µV
500 kHz to 1 MHz 0.19 % + 6.3 µV
(7 to 22) mV (10 to 20) Hz 0.024 % + 1.1 µV

(20 to 40) Hz 0.016 % + 1.1 µV
40 Hz to 20 kHz 0.0096 % + 1.1 µV
(20 to 50) kHz 0.018 % + 1.6 µV
(50 to 100) kHz 0.026 % + 2.0 µV
(100 to 300) kHz 0.066 % + 3.2 µV
(300 to 500) kHz 0.074 % + 6.3 µV
500 kHz to 1 MHz 0.14 % + 6.3 µV
(22 to 70) mV (10 to 20) Hz 0.022 % + 1.2 µV

(20 to 40) Hz 0.012 % + 1.2 µV
40 Hz to 20 kHz 0.0071 % + 1.2 µV
(20 to 50) kHz 0.012 % + 1.6 µV
(50 to 100) kHz 0.025 % + 2.0 µV
(100 to 300) kHz 0.048 % + 3.2 µV
(300 to 500) kHz 0.063 % + 6.3 µV
500 kHz to 1 MHz 0.096 % + 6.3 µV
(70 to 220) mV (10 to 20) Hz 0.017 % + 1.2 µV

(20 to 40) Hz 0.0076 % + 1.2 µV
40 Hz to 20 kHz 0.0037 % + 1.2 µV
(20 to 50) kHz 0.0058 % + 1.6 µV
(50 to 100) kHz 0.013 % + 2.0 µV
(100 to 300) kHz 0.022 % + 3.2 µV
(300 to 500) kHz 0.031 % + 6.3 µV
500 kHz to 1 MHz 0.079 % + 6.3 µV

AC Voltage – Measure
& Generate3 (cont)
(220 to 700) mV (10 to 20) Hz 0.017 % + 1.2 µV Fluke 5790A, 5720A

(20 to 40) Hz 0.0061 % + 1.2 µV
40 Hz to 20 kHz 0.0029 % + 1.2 µV
(20 to 50) kHz 0.0046 % + 1.6 µV
(50 to 100) kHz 0.0063 % + 2.0 µV
(100 to 300) kHz 0.017 % + 4.3 µV
(300 to 500) kHz 0.025 % + 6.3 µV
500 kHz to 1 MHz 0.074 % + 6.3 µV
(0.7 to 2.2) V (10 to 20) Hz 0.018 %

(20 to 40) Hz 0.0061 %
40 Hz to 20 kHz 0.0022 %
(20 to 50) kHz 0.004 %
(50 to 100) kHz 0.0057 %
(100 to 300) kHz 0.015 %
(300 to 500) kHz 0.023 %
500 kHz to 1 MHz 0.074 %
(2.2 to 7) V (10 to 20) Hz 0.016 %

(20 to 40) Hz 0.0054 %
40 Hz to 20 kHz 0.0024 %
(20 to 50) kHz 0.0041 %
(50 to 100) kHz 0.0065 %
(100 to 300) kHz 0.018 %
(300 to 500) kHz 0.035 %
500 kHz to 1 MHz 0.097 %
(7 to 22) V (10 to 20) Hz 0.016 %

(20 to 40) Hz 0.0057 %
40 Hz to 20 kHz 0.0030 %
(20 to 50) kHz 0.0039 %
(50 to 100) kHz 0.0065 %
(100 to 300) kHz 0.018 %
(300 to 500) kHz 0.033 %
500 kHz to 1 MHz 0.097 %
(22 to 70) V (10 to 20) Hz 0.016 %

(20 to 40) Hz 0.0058 %
40 Hz to 20 kHz 0.0034 %
(20 to 50) kHz 0.0050 %
(50 to 100) kHz 0.0075 %
(100 to 300) kHz 0.016 %
(300 to 500) kHz 0.032 %
500 kHz to 1 MHz 0.09 %

AC Voltage – Measure &

Generate3 (cont)
(70 to 220) V* (10 to 20) Hz 0.016 % Fluke 5790A, 5720A

(20 to 40) Hz 0.0058 % *Subject to 2.2 x 107
40 Hz to 20 kHz 0.0034 % V-Hz limitation
(20 to 50) kHz 0.0056 %
(50 to 100) kHz 0.0080 %
(100 to 300) kHz 0.017 %
(300 to 500) kHz 0.039 %
(220 to 700) V (10 to 20) Hz 0.016 % Fluke 5790A, 5720A,

(20 to 40) Hz 0.0080 % 5725A
40 Hz to 20 kHz 0.0038 %
(20 to 50) kHz 0.011 %
(50 to 100) kHz 0.040 %
(700 to 1000) V** (10 to 20) Hz 0.016 % ** Measure only

(20 to 40) Hz 0.0080 %
40 Hz to 20 kHz 0.0036 %
(20 to 50) kHz 0.011 %
(50 to 100) kHz 0.040 %
AC High Voltage –
Measure3
(1 to 5) kV (50 to 60) Hz 0.2 % + 1 V Vitrek 4700A

(5 to 35) kV 0.4 % + 65 V
(35 to 75) kV 0.4 % + 49 V
AC High Voltage –
Generate3
(1 to 5) kV 60 Hz 0.24 % + 1 V Assoc. res. 3565D

AC Voltage –
Measure3
≤ 2 MHz
(0 to 10) mV (1 to 40) Hz 0.023 % + 2 µV Agilent/HP 3458A

40 Hz to 1 kHz 0.018 % + 0.74 µV
(1 to 20) kHz 0.026 % + 0.74 µV
(20 to 50) kHz 0.069 % + 0.74 µV
(50 to 100) kHz 0.34 % + 0.74 µV
(100 to 300) kHz 2.7 % + 1.4 µV
(10 to 100) mV (1 to 40) Hz 0.033 % + 2.7 µV

40Hz to 1kHz 0.014 % + 1.4 µV
(1 to 20) kHz 0.019 % + 1.4 µV
(20 to 50) kHz 0.037 % + 1.4 µV
(50 to 100) kHz 0.067 % + 1.4 µV
(100 to 300) kHz 0.22 % + 6.7 µV
300 kHz to 1 MHz 0.68 % + 6.7 µV
(1 to 2) MHz 1.1 % + 6.7 µV
(0.1 to 1) V (1 to 40) Hz 0.0047 % + 27 µV

40 Hz to 1kHz 0.0047 % + 14 µV
(1 to 20) kHz 0.0094 %+ 14 µV
(20 to 50) kHz 0.020 % + 14 µV
(50 to 100) kHz 0.054 % + 14 µV
(100 to 300) kHz 0.20 % + 67 µV
300 kHz to 1 MHz 0.67 % + 67 µV
(1 to 2) MHz 1.1 % + 67 µV
(1 to 10) V (1 to 40) Hz 0.0077 % + 0.27 mV

40 Hz to 1 kHz 0.0062 % + 0.14 mV
(1 to 20) kHz 0.0099 % + 0.14 mV
(20 to 50) kHz 0.021 % + 0.14 mV
(50 to 100) kHz 0.054 % + 0.14 mV
(100 to 300) kHz 0.21 % + 0.67 mV
300 kHz to 1 MHz 0.67 % + 0.67 mV
(1 to 2) MHz 1.1 % + 0.67 mV
(10 to 100) V (1 to 40) Hz 0.025 % + 2.7 mV

40 Hz to 1 kHz 0.016 % + 1.4 mV
(1 to 20) kHz 0.014 % + 1.4 mV
(20 to 50) kHz 0.025 % + 1.4 mV
(50 to 100) kHz 0.082 % + 1.4 mV
(100 to 300) kHz 0.27 % + 6.7 mV
300 kHz to 1 MHz 1.1 % + 6.7 mV
(100 to 700) V (1 to 40) Hz 0.033 % + 27 mV

40 Hz to 1 kHz 0.027 % + 14 mV
(1 to 20) kHz 0.041 % + 14 mV
(20 to 50) kHz 0.081 % + 14 mV
(50 to 100) kHz 0.21 % + 14 mV

Parameter/Range Frequency CMC2, 5, 7, 8 (±) Comments
Capacitance – Measure3
1 pF 1 kHz 11 µF/F AH2500A

10 pF 13 µF/F
100 pF to 1 µF 14 µF/F
(0.7 to 110) mF DC 0.012 % 5700A w/ 3458A, charge

method
10 pF to 0.1 F 12 Hz to 2 MHz See Table IV.b Quad tech 1689M, 7600
Capacitance –
Generate3, Fixed Points
100 pF 100 Hz, 1 kHz 0.054 % Standard capacitors

0.001 µF 0.068 %
0.002 µF 0.048 %
(0.01, 0.02, 0.05) µF 0.055 %
(0.1, 0.5, 1) µF 0.055 %
Table IV.b: CMC (in %) for Capacitance Measured with 1689M & 7600 LCR Meter, Fixed Points
10 100 1 10 100 1 10 100 0.001 0.01 0.1

pF pF nF nF nF µF µF µF F F F
12 Hz 3.1 5 1.5 0.79 0.93 0.14 0.11 0.46 4.5
20 Hz 1.9 3 0.63 0.48 0.49 0.11 0.11 0.76
50 Hz 3.8 0.39 0.47 0.25 0.11 0.16 0.058 0.11 0.94
100 Hz 1.4 0.16 0.21 0.15 0.047 0.067 0.047 0.16 1.4
200 Hz 0.71 0.081 0.12 0.095 0.047 0.047 0.047 0.29 2.8
500 Hz 1.9 0.2 0.035 0.042 0.058 0.035 0.035 0.058 0.48 4.4
1 kHz 0.48 0.058 0.024 0.024 0.024 0.024 0.024 0.058 0.48 4.7
2 kHz 0.71 0.081 0.047 0.035 0.035 0.041 0.035 0.17 1.2
5 kHz 0.66 0.083 0.056 0.047 0.047 0.056 0.08 0.32 2.8
10 kHz 0.42 0.07 0.056 0.055 0.055 0.06 0.11 0.6
20 kHz 0.035 0.024 0.048 0.057 0.058 0.068 0.18 1.3
50 kHz 0.024 0.024 0.066 0.066 0.07 0.11 0.46 4.1
100 kHz 0.024 0.03 0.08 0.081 0.091 0.2 1.2
200 kHz 0.27 0.11 0.11 0.12 0.15 0.46 3.7
500 kHz 0.43 0.4 0.2 0.38 0.38 2.1
1 MHz 0.36 0.35 0.35 0.41 1.1
2 MHz 0.65 0.64 0.66 0.9 3.4

DC Power3 – Generate
33 mV to 1020 V 330 µA to 330 mA 0.068 % Fluke 5520A

330 mA to 3 A 0.07 %
(3 to 20.5) A 0.12 %
DC Current3 –
Generate & Measure (0 to 100) nA 73 µA/A + 0.027 nA Agilent/HP

(0.1 to 1) µA 14 µA/A + 0.027 nA 3458A/HFL, current
(1 to 10) µA 11 µA/A + 0.067 nA source, standard
resistors/current shunts
(10 to 100) µA 5.2 µA/A + 0.01 nA
(0.1 to 1 mA 4.9 µA/A + 0.1 nA
(1 to 10) mA 5.1 µA/A + 1 nA
(10 to 100) mA 5.6 µA/A + 60 nA
(0.1 to 1) A 7.3 µA/A + 6 µA
(1 to 2) A 8.9 µA/A + 12 µA
(2 to 10) A 31 µA/A + 6 µA
(10 to 20) A 31 µA/A + 12 µA
(20 to 100) A 27 µA/A + 18 µA/°C

(100 to 300) A 0.011 % + 18 µA/°C
(300 to 1000) A 0.077 % + 18 µA/°C
Generate Only (20 to 100) A 0.09 % + 970 µA Fluke 52120A w/

Turn Amps (1000 to 3000) A 0.27 % + 470 mA 52120-3k & 52120-6k
(3000 to 6000) A 0.38 % + 340 mA coils
DC Voltage – Generate, 100 mV 0.82 μV/V Fluke 732B, 752A, HP

Fixed Points 34420A
1V 0.63 μV/V Fluke 732B, 752A, HP

34420A
10 V 0.55 μV/V Fluke 732B
19 V 1.1 µV/V Fluke 732B, 720A,

752A, HP 34420A
100 V 0.63 μV/V Fluke 732B, 752A, HP

34420A
1000 V 0.82 μV/V Fluke 732B, 752A, HP

34420A

DC Voltage – Generate (0 to 220) mV 5.6 μV/V + 0.39 μV Fluke 5700A/EP

220 mV to 2.2 V 3.2 μV/V + 0.63 mV
(2.2 to 11) V 2.4 μV/V + 2.4 μV
(11 to 22) V 2.4 μV/V + 3.9 μV
(22 to 220) V 3.2 μV/V + 39 μV
(220 to 1100) V 4.8 μV/V + 390 μV
DC Voltage – Measure3 Up to 100 mV 3.0 μV/V + 0.21 μV Agilent/HP 3458A

100 mV to 1 V 2.1 μV/V + 0.21 μV
(1 to 10) V 2.1 μV/V + 0.34 μV
(10 to 100) V 3.5 μV/V + 21 μV
(100 to 1000) V 3.9 μV/V + 74 μV
DC High Voltage – (1 to 6) kV 0.2 % + 1 V Vitrek 4700A

Measure3 (6 to 35) kV 0.4 % + 26 V
(35 to 100) kV 0.4 % + 140 V
DC High Voltage – (1 to 6) kV 0.21 % + 1.1 V Assoc. res. 3565D

Generate3 monitored with Vitrek
4700A
Edge Characteristics –
Amplitude – Measure (0 to 100) mV 3.0 μV/V + 0.21 μV Agilent/HP 3458A/HFL

(0.1 to 1) V 2.1 μV/V + 0.21 μV
(1 to 10) V 2.1 μV/V + 0.34 μV
(10 to 100) V 3.5 μV/V + 21 μV
Electrical Calibration of
RTD Indicating Devices3 –
Pt 385, 100 Ω (-200 to 0) °C 0.05 °C Fluke 5520A

(0 to 100) °C 0.07 °C
(100 to 300) °C 0.09 °C
(300 to 400) °C 0.1 °C
(400 to 630) °C 0.12 °C
(630 to 800) °C 0.14 °C
Pt 3926, 100 Ω (-200 to 0) °C 0.05 °C

(0 to 100) °C 0.07 °C
(100 to 300) °C 0.09 °C
(300 to 400) °C 0.1 °C
(400 to 630) °C 0.26 °C

RTD Indicating Devices3
(cont) –
PtNi 385, 120 Ω (-80 to 100) °C 0.08 °C Fluke 5520A

(100 to 260) °C 0.16 °C
Pt 385, 200 Ω (-200 to 100) °C 0.04 °C

(100 to 260) °C 0.05 °C
(260 to 300) °C 0.12 °C
(300 to 400) °C 0.13 °C
(400 to 600) °C 0.14 °C
(600 to 630) °C 0.16 °C
Pt 385, 500 Ω (-200 to -80) °C 0.04 °C

(-80 to 100) °C 0.05 °C
(100 to 260) °C 0.06 °C
(260 to 400) °C 0.08 °C
(400 to 600) °C 0.09 °C
(600 to 630) °C 0.11 °C
Pt 385, 1000 Ω (-200 to 0) °C 0.03 °C

(0 to 100) °C 0.04 °C
(100 to 260) °C 0.05 °C
(260 to 300) °C 0.06 °C
(300 to 600) °C 0.07 °C
(600 to 630) °C 0.23 °C
Pt 3916, 100 Ω (-200 to -190) °C 0.25 °C

(-190 to -80) °C 0.04 °C
(-80 to 0) °C 0.05 °C
(0 to 100) °C 0.06 °C
(100 to 260) °C 0.07 °C
(260 to 300) °C 0.08 °C
(300 to 400) °C 0.09 °C
(400 to 600) °C 0.10 °C
(600 to 630) °C 0.23 °C

Thermocouple Indicating
Devices3 –
Type E (-250 to -100) °C 0.5 °C Fluke 5520A

(-100 to -25) °C 0.16 °C
(-25 to 350) °C 0.14 °C
(350 to 650) °C 0.16 °C
(650 to 1000) °C 0.21 °C
Type J (-210 to -100) °C 0.28 °C

(-100 to -30) °C 0.16 °C
(-30 to 150) °C 0.14 °C
(150 to 760) °C 0.17 °C
(760 to 1200) °C 0.23 °C
Type K (-200 to -100) °C 0.34 °C

(-100 to -25) °C 0.18 °C
(-25 to 120) °C 0.16 °C
(120 to 1000) ºC 0.26 °C
(1000 to 1372) °C 0.40 °C
Type S (0 to 250) °C 0.47 °C

(250 to 1000) °C 0.36 °C
(1000 to 1400) °C 0.37 °C
(1400 to 1767) °C 0.46 °C
Type T (-250 to -150) °C 0.63 °C

(-150 to 0) °C 0.24 °C
(0 to 120) °C 0.16 °C
(120 to 400) °C 0.14 °C

High Frequency
Capacitance – Generate,
Fixed Points3 –
1 pF 1 kHz 0.007 % Agilent/HP 16380A

1 MHz 0.01 % series capacitors
2 MHz 0.023 %
3 MHz 0.041 %
4 MHz 0.063 %
5 MHz 0.088 %
10 MHz 0.26 %
13 MHz 0.38 %
10 pF 1 kHz 62 parts in 106

(1, 2) MHz 62 parts in 106
3 MHz 64 parts in 106
10 MHz 0.013 %
13 MHz 0.017 %

4 MHz 0.01 %
5 MHz 0.014 %
10 MHz 0.034 %
13 MHz 0.049 %

2 MHz 0.016 %
3 MHz 0.028 %
4 MHz 0.046 %
5 MHz 0.064 %
10 MHz 0.2 %
13 MHz 0.29 %
0.01 µF (0.12, 1, 10, 100) kHz 63 parts in 106
0.1 µF (0.12, 1, 10, 100) kHz 63 parts in 106
1.0 µF 0.12 kHz 69 parts in 106

(1, 10) kHz 63 parts in 106
100 kHz 85 parts in 106

Inductance3 –
Measure (12 Hz to 0.1 µH to 10 H See Table IV.c LCR meters

2 MHz)
Generate – Fixed 100 µH 0.026 % Standard inductors

Points (1, 5, 10, 100) mH 0.11 %
(1, 2, 5) H 0.11 %
Table IVc: Inductance Measure CMC (in %) Measured with 1689M & 7600 LCR Meters
Freq. 0.1 1 10 100 1 10 100 1 5 10

µH µH µH µH mH mH mH H H H
12 Hz 0.81 1.3 1.1 1.1 1.1
20 Hz 4.8 0.49 0.71 0.58 0.56 0.56
50 Hz 0.97 0.11 0.17 0.26 0.26 0.26
100 Hz 3.6 0.37 0.048 0.069 0.11 0.16 0.16
200 Hz 1.8 0.19 0.048 0.048 0.058 0.11 0.085
500 Hz 4.8 0.49 0.060 0.036 0.036 0.036 0.051 0.036
1 kHz 1.2 0.13 0.024 0.024 0.024 0.024 0.024 0.024
2 kHz 0.90 0.13 0.036 0.042 0.036 0.036 0.048 0.048
5 kHz 3.2 0.37 0.084 0.048 0.062 0.062 0.055 0.079 0.096
10 kHz 1.7 0.22 0.079 0.064 0.062 0.064 0.069 0.097 0.26
20 kHz 0.94 0.15 0.074 0.066 0.066 0.067 0.081 0.030 0.048
50 kHz 4.7 0.54 0.12 0.080 0.075 0.075 0.16 0.50 0.058 0.11
100 kHz 3.4 0.42 0.13 0.095 0.091 0.092 0.21 1.9 0.11 0.20
200 kHz 2.7 0.38 0.15 0.13 0.13 0.13 0.68 4.6
500 kHz 2.4 0.44 0.25 0.23 0.46 0.50 1.9
1 MHz 2.5 0.60 0.41 0.40 0.40 0.96
2 MHz 2.7 0.92 0.75 0.73 0.76 4.3
Phase – Generate
5 Vrms (Voltage Ratio 1 Hz to 1 kHz 6.6 m° Clark-Hess 5500-2

= 1) (1 to 6.25) kHz 5.2 m° Ratio = ratio of the
(6.25 to 50) kHz 13 m° larger voltage divided
(50 to 200) kHz 21 m° by the smaller
voltage
50 mVrms to 100 1 Hz to 1 kHz (6.5 + (0.05 ·Ratio))m°
Vrms (1 to 6.25) kHz (11 + (0.1 · Ratio))m°
(6.25 to 50) kHz (19 + (0.15 · Ratio))m°
(50 to 200) kHz (41 + (0.4 · Ratio))m°

Phase – Generate (cont)
(100 to 120) Vrms 1 Hz to 1 kHz (15 + (0.1 · Ratio)) Clark-Hess 5500-2

(1 to 6.25) kHz m° Ratio = ratio of the
(6.25 to 50) kHz (21 + (0.2 · Ratio)) larger voltage divided
(50 to 200) kHz m° by the smaller
(31 + (0.3 · Ratio)) voltage
m°
(81 + (1 · Ratio)) m°
Phase – Measure
(0.01 to 0.1) Vrms 10 Hz to 10 kHz 0.21° KH 6620 phase meter

(10 to 50) kHz 0.36°
(50 to 100) kHz 0.71°
(0.1 to 120) Vrms 10 Hz to 50 kHz 0.054°

(50 to 100) kHz 0.036°
Oscilloscope Calibration3 –
Squarewave Signal
50 Ω at 1 kHz Source (1 to 110) mV 0.27 % + 42 µV Fluke 5520A/SC1100
110 mV to 2.2 V 0.27 % + 130 µV scope option
(2.2 to 11) V 0.27 % + 1.2 mV
(11 to 1100) V 0.27 % + 12 mV
Squarewave Signal
1 MΩ at 1 kHz Source (1 to 110) mV 0.15 % + 42 µV
110 mV to 2.2 V 0.15 % + 130 µV
(2.2 to 11) V 0.15 % + 1.2 mV
(11 to 1100) V 0.15 % + 12 mV
Leveled Sine Wave
Flatness (Relative to 50 50 kHz to 100 MHz 1.5 % + 110 µV
kHz) (100 to 300) MHz 2 % + 110 µV
(300 to 600) MHz 4 % + 110 µV
(600 to 1100) MHz 5 % + 110 µV
Period 1 ns to 20 ms 2.0 parts in 106

50 ms 59 parts in 106
100 ms 97 parts in 106
200 ms 180 parts in 106
500 ms 410 parts in 106
1s 800 parts in 106
2s 1600 parts in 106
5s 3900 parts in 106

Oscilloscope Calibration3
– (cont)
Rise Time – Generate 12.8 ps 4.3 ps Tektronix 067-1338-00
Rise Time – Measure > 5.4ps 5.4 ps Tektronix TDS8000

with 80E03
Resistance – Generate, 100 µΩ 29 µΩ/Ω Norma 80

Fixed Points3
1 mΩ 14 µΩ/Ω L&N 4222B
10 mΩ 9.5 µΩ/Ω L&N 4223B
0.1 Ω 6.5 µΩ/Ω L&N resistors
1Ω 4.6 µΩ/Ω Fluke 742A, standard
10 Ω 4.2 µΩ/Ω
100 Ω 2.3 µΩ/Ω resistors
1kΩ 2.5 µΩ/Ω
10 kΩ 1.6 µΩ/Ω
19 kΩ 4.7 µΩ/Ω
100 kΩ 3.3 µΩ/Ω
1 MΩ 4.5 µΩ/Ω
10 MΩ 9.0 µΩ/Ω
100 MΩ 22 µΩ/Ω
1 GΩ 27 µΩ/Ω
10 GΩ 0.13 % IET high resistance

100 GΩ 0.22 % standard
1 TΩ 0.34 %
10 TΩ 1.2 %
Resistance – Measure, DC 100 µΩ 85 μ Ω/Ω + 0.48 nΩ Stable current source,

100 µΩ to1 mΩ 12 μΩ/Ω + 4.8 nΩ 3458A/HFL, standard
(1 to 10) mΩ 9.2 μ Ω/Ω + 4.8 nΩ resistors
(10 to 100) mΩ 5.4 μ Ω/Ω + 48 nΩ
(0.1 to 1) Ω 2.6 μ Ω/Ω + 0.48 μΩ
(0 to 2) Ω 3.4 μΩ/Ω + 4.4 μΩ Fluke 8508A & standard

(2 to 20) Ω 2.1 μΩ/Ω + 15 μΩ resistors
(20 to 200) Ω 2.6 μΩ/Ω + 33 μΩ
200 Ω to 2 kΩ 2.5 μΩ/Ω + 0.33 mΩ
(2 to 20) kΩ 1.5 μΩ/Ω + 3.3 mΩ
(20 to 200) kΩ 2.3 μΩ/Ω + 33 mW
200 kW to 2 MΩ 4.4 μΩ/Ω + 1.1 Ω
(2 to 20) MΩ 4.4 μΩ/Ω + 11 Ω
(20 to 200) MΩ 8.3 μΩ/Ω + 110 Ω
200 MΩ to 2 GΩ 28 μΩ/Ω + 110 kΩ
(2 to 20) GΩ 0.21 % + 1.1 MΩ

Resistance – Measure, DC 100 MΩ to 1 GΩ 0.081 % 6500A

(cont) (1 to 10) GΩ 0.12 %
(10 to 100) GΩ 0.24 %
100 GΩ to 1 TΩ 0.35 %
(1 to 10) TΩ 0.59 %
(10 to 100) TΩ 1.2 %
Resistance – Measure, AC 10 Hz to 2 MHz See Table IV.d LCR meters
Table IV.d: AC Resistance Measure CMC (in %) Measured with LCR Meters
0.1 1 10 100 1 10 100 200 500 1

Ω Ω Ω Ω kΩ kΩ kΩ kΩ kΩ MΩ
12 Hz 0.60 0.11 0.11 0.11 0.11 0.11 1.7
20 Hz 0.60 0.11 0.11 0.11 0.11 0.11 0.85 2.8 4.6
50 Hz 3.1 0.31 0.058 0.058 0.058 0.058 0.058 0.38 1.3 2.0
100 Hz 2.3 0.23 0.047 0.047 0.047 0.047 0.047 0.23 0.70 1.2
200 Hz 2.3 0.23 0.047 0.047 0.047 0.047 0.047 0.15 0.44 0.70
500 Hz 1.5 0.16 0.035 0.035 0.035 0.035 0.035 0.10 0.29 0.44
1 kHz 0.77 0.09 0.024 0.024 0.024 0.024 0.024 0.082 0.24 0.35
2 kHz 1.0 0.15 0.035 0.035 0.035 0.035 0.047 0.075 0.21 0.31
5 kHz 0.90 0.14 0.047 0.047 0.047 0.047 0.063 0.072 0.20 0.30
10 kHz 1.0 0.14 0.062 0.055 0.055 0.055 0.063 0.073 0.21 0.30
20 kHz 1.1 0.16 0.066 0.057 0.057 0.057 0.067 0.077 0.22 0.33
50 kHz 1.4 0.19 0.077 0.066 0.065 0.066 0.31 0.37 1.1 1.7
100 kHz 1.9 0.26 0.10 0.081 0.079 0.081 0.40 0.47 1.5 2.2
200 kHz 3.0 0.39 0.14 0.11 0.11 0.12 0.56 0.68 2.2 3.4
500 kHz 0.79 0.26 0.20 0.20 0.26 1.1 1.4 4.2
1 MHz 1.5 0.45 0.35 0.35 0.70 1.9 2.4
2 MHz 2.8 0.85 0.65 0.64 1.4 3.5 4.5

V. Electrical – RF/Microwave
Amplitude Modulation3 –
AM Accuracy:
(0.15 to 10) MHz
(5 to 40) % AM Depth Rate:50 Hz to 10 kHz 2.3 % + 0.012 % AM Measuring receiver
Rate: 20 Hz to 10 kHz 3.5 % + 0.012 % AM
(40 to 99) % AM Depth Rate 50 Hz to 10 kHz 2.3% + 0.12 % AM

Rate: 20 Hz to 10 kHz 3.5 % + 0.12 % AM
(10 to 1300) MHz

(5 to 40) % AM Depth Rate: 50 Hz to 50 kHz 1.2 % + 0.012 % AM
Rate: 20 Hz to 100 kHz 3.5 % + 0.012 % AM
(40 to 99) % AM Depth Rate: 50 Hz to 50 kHz 1.2 % + 0.12 % AM

Rate: 20 Hz to 100 kHz 3.5 % + 0.12 % AM
(1.3 to 26.5) GHz

(5 to 40) % AM Depth Rate: 50 Hz to 50 kHz 1.7 % + 0.012 % AM Measuring
Rate: 20 Hz to 100 kHz 3.5 % + 0.012 % AM receiver, down
converter & local
(40 to 99) % AM Depth Rate: 50 Hz to 50 kHz 1.7 % + 0.12 % AM oscillator
Rate: 20 Hz to 100 kHz 3.5 % + 0.12 % AM
AM Distortion:
150 kHz to 1.3 GHz <50 % AM Depth 1.1 dB
(50 to 95) % AM 2.1 dB Measuring receiver
& distortion
(1.3 to 26.5) GHz <50 % AM Depth 1.1 dB analyzer
(50 to 95) % AM 2.1 dB
AM Flatness:
(0.01 to 26.5) GHz Rate: 90 Hz to 10 kHz 0.31 %
(20 to 80) % AM Depth Measuring receiver
Distortion Accuracy –
Measure3
(0 to -70) dB (2 to 20) Hz 0.43 dB Low frequency
signal analyzer
(-7 to -99.9) dB 20 Hz to 20 kHz 1.1 dB Distortion analyzer
(-7 to -99.9) dB (20 to 100) kHz 2.1 dB

Frequency Modulation3 –
FM Accuracy Rate:
(0.15 to 10) MHz
<4 kHz FM peak Dev. 20 Hz to 10 kHz 2.4 % + 1.2 Hz Measuring receiver
<40 kHz FM peak Dev. 20 Hz to 10 kHz 2.4 % + 12 Hz
(10 to 1300) MHz

<400 kHz FM pk Dev. 50 Hz to 100 kHz 1.3 % + 120 Hz
20 Hz to 200 kHz 5.8 % + 240 Hz
(1.3 to 26.5) GHz

<400 kHz FM pk Dev. 50 Hz to 100 kHz 1.3 % + 120 Hz Measuring receiver
20 Hz to 200 kHz 5.8 % + 240 Hz & distortion
analyzer
β (0 to 0.5)
Rate: (1 to 3) Hz
Peak Dev: 1 Hz to 1.3 1 Hz to 2.6 GHz 1.6 % 89441A
GHz
Rate: 3 Hz to 6.7 GHz 3 Hz to 13.2 GHz 1.6 %

Peak Dev: 3 Hz to 6.7 E4445A
GHz
β 0.5 to 2 1 Hz to 2.6 GHz 2.1 %

Rate: (1 to 3) Hz 89441A
Peak Dev: 1 Hz to 1.3
GHz 3 Hz to 13.2 GHz 1.9 %
E4445A
Rate: 3 Hz to 6.7 GHz
GHz 1 Hz to 2.6 GHz 1.2 %
89441A
β 2 to 10
Rate: 1 Hz to 3 Hz 3 Hz to 13.2 GHz 1.1 %
Peak Dev: 1 Hz to 1.3 E4445A
GHz

GHz

(cont)
β 10 to 100
Rate: 1 Hz to 3 Hz
GHz

Peak Dev: 3 Hz to 6.7 3 Hz to 13.2 GHz 0.36 % E4445A
GHz
β 100 to 200
Rate: 1 Hz to 3 Hz
GHz

Peak Dev: 3 Hz to 6.7 3 Hz to 13.2 GHz 0.09 % E4445A
GHz
β 200 to 500
Rate: 1 Hz to 13 MHz
GHz
Rate: 1 Hz to 7 MHz
Peak Dev: 1 Hz to 700 (2.6 to 18) GHz 0.24 % 89441A w/ mixer
MHz
β 500 to 5000
GHz
Rate: 1 Hz to 7 MHz
MHz
β 5000 to 6 000 000

GHz
Rate: 1 Hz to 7 MHz
MHz

(cont)
FM Distortion Measuring receiver

400 kHz to 10 MHz < 10 kHz FM 0.15 %
Rate: 20 Hz to 10 kHz Deviation
10 MHz to 26.5 GHz < 100 kHz FM 0.15 %

Rate: 20 Hz to 100 kHz Deviation
Residual FM
Carrier Frequency (ƒ) Bandwidth:
<100 MHz 50 Hz to 3 kHz 1 Hz (rms)
(100 to 1300) MHz 50 Hz to 3 kHz 0.4 Hz + (6 x 10-9)
(1.3 to 6.2) GHz 50 Hz to 3 kHz ƒ
(6.2 to 12.4) GHz 50 Hz to 3 kHz 17 Hz
(12.4 to 18) GHz 50 Hz to 3 kHz 33 Hz
(18 to 26.5) GHz 50 Hz to 3 kHz 49 Hz
65 Hz
Single Sideband Phase Noise –

Measure
CF = 5 MHz
Range: Offset
-110 dBc/Hz 20 Hz 1.6 dB Agilent E8251A
-126 dBc/Hz 1 kHz 1.3 dB Agilent E4408B
-131 dBc/Hz 20 kHz 1.0 dB
-133 dBc/Hz 100 kHz 1.3 dB HP 89441A w/
-139 dBc/Hz 1 MHz 1.3 dB PMSSBPNMS
-140 dBc/Hz 5 MHz 1.4 dB
CF = 225 MHz
Offset
-101 dBc/Hz 20 Hz 1.3 dB
-140 dBc/Hz 100 kHz 1.1 dB

Single Sideband Phase Noise

– Measure (cont)
CF = 1 GHz
Range: Offset
-89 dBc/Hz 20 Hz 1.6 dB Agilent E8251A
-134 dBc/Hz 100 kHz 1.1 dB HP 89441A w/
-145 dBc/Hz 1 MHz 1.4 dB PMSSBPNMS
CF = 5 GHz
Offset
-76 dBc/Hz 20 Hz 1.9 dB
-119 dBc/Hz 100 kHz 1.0 dB
CF = 9.6 GHz
Offset
-70 dBc/Hz 20 Hz 1.1 dB
-116 dBc/Hz 100 kHz 1.0 dB
CF = 15 GHz
Offset
-66 dBc/Hz 20 Hz 1.8 dB
-110 dBc/Hz 100 kHz 1.0 dB

Single Sideband Phase Noise –

Measure (cont)
CF = 18 GHz
Range: Offset
-64 dBc/Hz 20 Hz
-76 dBc/Hz 1 kHz 1.5 dB Agilent E8251A
-109 dBc/Hz 100 kHz 0.9 dB
1.0 dB HP 89441A w/
-136 dBc/Hz 1 MHz PMSSBPNMS
3.0 dB
Phase Modulation3 –
(0.15 to 10) MHz

<40 Radians (Peak) Rate: 200 Hz to 10 kHz 4.7 % + 0.012 rad Measuring receiver
<400 Radians (Peak) 4.7 % + 0.12 rad
(10 to 1300) MHz
<4 Radians (Peak) Rate: 200 Hz to 20 kHz 3.8 % + 0.0012 rad
<40 Radians (Peak) 3.5 % + 0.012 rad
<400 Radians (Peak) 3.5 % + 0.12 rad
(1.3 to 26.5) GHz

<4 Radians (Peak) Rate: 200 Hz to 20 kHz 3.7 % + 0.0012 rad Measuring
<40 Radians (Peak) 3.5 % + 0.012 rad receiver, down
<400 Radians (Peak) 3.5 % + 0.12 rad converter & local
oscillator
Range Calibration (Power

Meters)3 –
Zero Set (0.03 to 10) mW 0.25 % + 6.2 nW Range calibrator,

Instrument Accuracy 3 µW 1.6 % Agilent 11683A or
10 µW 0.46 % Agilent 8477A
30 µW 0.28 %
(100, 300) µW 0.26 %
(1, 2) mW 0.28 %
(10, 30, 100) mW 0.30 %

RF Power Level3 –
Generate/Measure
Absolute 0 dBm @ 50 MHz 0.36 % Signal generator,

power splitter,
(+20 to -128) dBm See Table Vc & Vd attenuator,
0.9 MHz to 26.5 GHz standard sensors,
& power meter
Relative (+20 to -128) dBm See Table Va & Vb E9304A, N8481A,

0.9 MHz to 26.5 GHz 8485A, E4445A
E8244A
Relative 9 kHz 1% Power sensors,

(Power Sensor Calibration 30 kHz 1% splitters, meters
Factors) 100 kHz 1%
300 kHz 1%
1 MHz 1%
3 MHz 1%
10 MHz 0.79 %
30 MHz 0.67 %
100 MHz 0.62 %
300 MHz 0.67 %
1 GHz 0.68 %
2 GHz 0.68 %
3 GHz 0.73 %
4 GHz 0.73 %
5 GHz 0.72 %
6 GHz 0.73 %
7 GHz 0.82 %
8 GHz 0.9 %
9 GHz 0.92 %
10 GHz 0.95 %
11 GHz 0.95 %
12 GHz 0.95 %
13 GHz 1.0 %
14 GHz 1.0 %
15 GHz 1.1 %
16 GHz 1.1 %
17 GHz 1.2 %
18 GHz 1.0 %
19 GHz 1.9 %
20 GHz 2.2 %
21 GHz 2.1 %
22 GHz 2.1 %
23 GHz 2.1 %
24 GHz 2.1 %
25 GHz 2.2 %
26 GHz 2.1 %
26.5 GHz 2.1 %

Table V.a Power Measurement Relative (CMC in dBm, K=2)
FREQUENCY
9 kHz 10 MHz >50 MHz >8 GHz >13.2 GHz 18 GHz

to to 50 MHz to to to to
<10 MHz <50 MHz 8 GHz 13.2 GHz 18 GHz 26.5 GHz
+20 dBm 0.007 0.006 0.008 0.007 0.007 0.010 0.008
+10 dBm 0.007 0.005 0.006 0.006 0.006 0.010 0.006
0 dBm --- ref --- --- ref --- --- ref --- --- ref --- --- ref --- --- ref --- --- ref ---
-10 dBm 0.006 0.006 0.005 0.005 0.006 0.005 0.006
Change From Reference
-20 dBm 0.006 0.006 0.006 0.006 0.006 0.006 0.005

-30 dBm 0.007 0.007 0.007 0.006 0.007 0.006 0.006
-40 dBm 0.008 0.007 0.006 0.006 0.008 0.005 0.006
-50 dBm 0.008 0.007 0.006 0.006 0.008 0.007 0.006
-60 dBm 0.009 0.008 0.007 0.008 0.009 0.008 0.008
-70 dBm 0.010 0.009 0.008 0.009 0.011 0.009 0.008
-80 dBm 0.010 0.009 0.008 0.008 0.009 0.007 0.008
-90 dBm 0.011 0.010 0.010 0.011 0.011 0.009 0.010
-100 dBm 0.016 0.013 0.012 0.013 0.014 0.012 0.010
-110 dBm 0.015 0.011 0.013 0.035 0.031 0.012 0.014
-120 dBm 0.025 0.013 0.019 0.090 0.040 0.014 0.045
-128 dBm 0.041 0.020 0.053 0.11 0.17 0.056 0.095
Table V.b Power Source Relative (CMC in dBm, K=2)

FREQUENCY

+20 dBm 0.009 0.007 0.011 0.010 0.010 0.014 0.011
+10 dBm 0.008 0.006 0.006 0.006 0.008 0.015 0.008
0 dBm --- ref --- --- ref --- --- ref --- --- ref --- --- ref --- --- ref --- --- ref ---
-10 dBm 0.007 0.006 0.006 0.006 0.008 0.005 0.007
-20 dBm 0.008 0.007 0.007 0.008 0.007 0.006 0.006

-30 dBm 0.009 0.009 0.009 0.007 0.008 0.007 0.007
-40 dBm 0.011 0.010 0.008 0.007 0.011 0.006 0.007
-50 dBm 0.012 0.010 0.008 0.007 0.012 0.009 0.007
-60 dBm 0.012 0.011 0.009 0.010 0.014 0.010 0.010
-70 dBm 0.013 0.011 0.010 0.013 0.015 0.011 0.010
-80 dBm 0.013 0.012 0.010 0.010 0.012 0.008 0.009
-90 dBm 0.013 0.011 0.011 0.013 0.014 0.010 0.012
-100 dBm 0.023 0.017 0.016 0.017 0.018 0.015 0.012
-110 dBm 0.024 0.015 0.020 0.064 0.055 0.017 0.022
-120 dBm 0.042 0.018 0.030 0.17 0.073 0.021 0.081
-128 dBm 0.073 0.032 0.096 0.20 0.33 0.10 0.18

Table V.c Power Measurement Absolute (CMC in dBm, K=2)
FREQUENCY

+20 dBm 0.11 0.079 0.055 0.062 0.079 0.082 0.12
+10 dBm 0.11 0.076 0.047 0.055 0.077 0.077 0.12
0 dBm 0.10 0.076 0.047 0.054 0.078 0.078 0.12
-10 dBm 0.10 0.076 0.048 0.055 0.078 0.078 0.12
-20 dBm 0.10 0.076 0.048 0.055 0.078 0.078 0.12

-30 dBm 0.10 0.077 0.048 0.055 0.078 0.078 0.12
-40 dBm 0.10 0.077 0.048 0.055 0.078 0.078 0.12
-50 dBm 0.10 0.077 0.048 0.055 0.078 0.078 0.12
-60 dBm 0.10 0.077 0.048 0.055 0.079 0.078 0.12
-70 dBm 0.10 0.077 0.048 0.055 0.079 0.078 0.12
-80 dBm 0.10 0.077 0.048 0.055 0.079 0.078 0.12
-90 dBm 0.11 0.077 0.048 0.055 0.079 0.078 0.12
-100 dBm 0.11 0.077 0.049 0.056 0.079 0.078 0.12
-110 dBm 0.11 0.077 0.049 0.065 0.084 0.079 0.12
-120 dBm 0.11 0.077 0.051 0.105 0.088 0.083 0.12
-128 dBm 0.12 0.079 0.071 0.12 0.19 0.088 0.15
Table V.d Power Source Absolute (CMC in dBm, K=2)

FREQUENCY

+20 dBm 0.11 0.080 0.056 0.067 0.089 0.094 0.12
+10 dBm 0.11 0.078 0.048 0.060 0.089 0.089 0.12
0 dBm 0.11 0.078 0.049 0.059 0.091 0.090 0.12
-10 dBm 0.11 0.077 0.048 0.055 0.080 0.078 0.12
-20 dBm 0.11 0.078 0.049 0.056 0.080 0.079 0.12

-30 dBm 0.11 0.079 0.050 0.056 0.080 0.079 0.12
-40 dBm 0.11 0.079 0.049 0.056 0.081 0.078 0.12
-50 dBm 0.11 0.079 0.049 0.056 0.082 0.080 0.12
-60 dBm 0.11 0.080 0.050 0.057 0.083 0.081 0.12
-70 dBm 0.11 0.079 0.050 0.059 0.083 0.081 0.12
-80 dBm 0.11 0.080 0.050 0.056 0.081 0.079 0.12
-90 dBm 0.11 0.078 0.050 0.058 0.081 0.079 0.12
-100 dBm 0.11 0.082 0.052 0.060 0.084 0.081 0.12
-110 dBm 0.11 0.081 0.056 0.094 0.11 0.084 0.12
-120 dBm 0.12 0.082 0.062 0.19 0.12 0.090 0.16
-128 dBm 0.15 0.090 0.12 0.21 0.35 0.14 0.24

S-Parameters3 –
Reflection S11/22
3.5 mm 9 kHz to 26.5 GHz:
Magnitude (0 to 1.0) lin (± 0.008 to ± 0.062) lin 8510C or

E5080A network
Phase (0.00 to 0.01) lin (± 53 to ± 180) º analyzer, 85052D
(0.01 to 1.00) lin (± 0.86 to ± 19) º calibration kit
7 mm 9 kHz to 6.0 GHz:
Magnitude (0 to 1) lin (± 0.002 to ± 0.009) lin 8753ES or

E5080A network
Phase (0.00 to 0.01) lin (± 9.7 to ± 32) º analyzer, 85031B
(0.01 to 1.00) lin (± 0.14 to ± 2.9) º calibration kit
Type-N 9 kHz to 18 GHz:
Magnitude (0 to 1.0) lin (± 0.003 to ± 0.042) lin 8510C, 8753ES

or E5080A
Phase (0.00 to 0.01) lin (± 1.9 to ± 180) º network analyzer,
(0.01 to 1.00) lin (± 0.3 to ± 12) º 85054D or
85032B
calibration kit

S-Parameters3 –
Transmission S12/21
3.5 mm 9 kHz to 26.5 GHz:
Magnitude (10 to -70) dB (± 0.018 to ± 5.2) dB 8510C or E5080A

network analyzer,
9 kHz to 6 GHz: 85052D
(-70 to -90) dB (± 0.33 to ± 2.5) dB calibration kit
Phase 9 kHz to 26.5 GHz:

(10 to -50) dB (± 0.19 to ± 28) º
(-50 to -70) dB (± 0.57 to ± 20) º
7 mm 9 kHz to 6 GHz:
Magnitude (10 to -70) dB (± 0.09 to ± 0.31) dB 8753ES or

(-70 to -90) dB (± 0.32 to ± 2.5) dB E5080A network
analyzer, 85031B
Phase 9 kHz to 6.0 GHz: calibration kit
(10 to -50) dB (± 0.07 to ± 0.27) º

(-50 to -90) dB (± 0.51 to ± 20) º
Type-N 9 kHz to 18 GHz:
Magnitude (10 to -70) dB (± 0.01 to ± 1.1) dB 8510C or E5080A

network analyzer,
9 kHz to 9 GHz: 85054D or
(-70 to -90) dB (± 0.32 to ± 2.5) dB 85032B
calibration kit
Phase (10 to -50) dB (± 0.11 to ± 1.3) º
(-50 to -90) dB (± 0.52 to ± 20) º
VI. Fluid Quantities
Viscosity3 –
Dynamic (Meter) (0 to 100 000) cP 0.83 % Standard viscosity
Kinematic (Cups) (0 to 100 000) cP 0.24 % + 0.84 s fluids, PRT,
stopwatch
Flow Meters3 2 sccm to 650 slm 0.26 % Mass flow system

Hydrometers – Specific Gravity:
Baume 1.00 0.0058 % + 0.6R Distilled water

Lighter than Water
(80.5 to 57) (0.66 to 0.75) 0.0072 % + 0.6R Petroleum based

API (81 to 57) solutions
(57 to 10) (0.75 to 1) 0.006 % + 0.6R Alcohol solutions

API (57 to 10)
Heavier than Water
(0.72 to 21) (1 to 1.17) 0.0058 % + 0.6R Sulfuric acid &/or

API (10 to -11) glycerine solutions
(0.72 to 67) (1 to 1.85) 0.0058 % + 0.6R Sulfuric acid

solutions
Volumetric Calibration Up to 250 mL 0.08 % Rdg + 50 µL Gravimetric method

(>250 to 1200) mL 330 µL
(>1.2 to 8.2) L 0.001 % Rdg + 920 µL
(>8.2 to 32) L 0.002 % Rdg + 780 µL

VII. Foundry-Industry Specific Calibrations
AFS Clay Tester9 300 s 0.42 s Stopwatch
Mold Strength Tester9 (0 to 50) psi 0.20 % + 0.6R Mold strength tester
& balances
Moisture Teller9 (100 to 300) °F 2.0 °F Temperature

calibrator
Permmeter9 25 perms 1.6 perms Perm standard

90 perms 5.3 perms
160 perms 9.4 perms
Sand Rammer9 (0.6 to 0.9) inches 0.0066 in + 0.6R Impact rings w/

(Compactability Tester) caliper
Sand Specimen Tube3 2.0 in 0.0014 in Bore gage
Sand (Green) Strength (0 to 500) psi 0.93 % + 0.82 psi Master force
Machine9 proving gage
Welders3 (1 to 50) V 1.0 % Loadbank & DMM

(1 to 750) A 1.0 %

VIII. Mechanical
Accelerometers – Shear (5 to 2000) Hz 2.0 % Reference

& Charge3 (2 to 10) kHz 2.7 % accelerometer, back-
to-back comparison
method
Air Velocity (100 to 4000) ft/min 0.48 % + 5.5 ft/min Flowkinetics

(4000 to 7400) ft/min 0.48 % + 40 ft/min manometer
Cable Tensiometers/ (0 to 1000) lb 1.1 lb + 0.6R Deadweights

Wire Tension Meters
Durometers3 – Types A, B, C, D, E, O & ASTM D2240

DO
Indenter Shape & Pressure foot orifice 3.2 µm

Extension diameter
Indenter Extension Length 3.2 µm Gage blocks

Cone Angle 1 arcmin Vision system
Tip Radius 3.2 µm
Indenter Thickness 3.2 μm
Durometer Spring Up to 45 N 36 mN Durometer calibrator

Display Linearity (0.001 to 0.2) in 37 µin or 0.6R, Gage blocks
whichever is greater
Durometer Calibrator Scales A, B, E, O & C, D, 0.20 % Scale & CMM

DO

Indirect Verification of
Brinell Hardness
Testers at Test
Condition(s)3 –
(3000, 1500, 500) kg 10 mm/500 kg

(50 to 70) HBW 0.13 HBW ASTM E10
(71 to 90) HBW 0.38 HBW
(91 to 109) HBW 1.1 HBW
10 mm/1500 kg
(50 to 99) HBW 0.35 HBW
(100 to 200) HBW 0.56 HBW
(201 to 345) HBW 1.4 HBW
10 mm/3000 kg
(100 to 199) HBW 0.80 HBW
(200 to 499) HBW 1.6 HBW
(500 to 650) HBW 3.7 HBW
Indirect Verification of HLD: ASTM A956

Leeb Hardness Testers Low 8 HLD
Medium 9 HLD
High 10 HLD
Indirect Verification of
Microindentation Vickers, ≤1 kg
Hardness Testers (100 to 240) HV 11 HV ASTM E384
(Knoop & Vickers)3 – (241 to 600) HV 11 HV
(600 to >650) HV 11 HV
Knoop, ≤ 1 kg
(100 to 250) HK 5.3 HK
(251 to 650) HK 5.6 HK
(650 to >650) HK 5.2 HK

Indirect Verification of HRA:

Rockwell Hardness & Low 0.29 HRA ASTM E18
Rockwell Superficial Mid 0.56 HRA
Hardness Testers3 High 0.24 HRA
HRBW:
Low 0.94 HRB
Mid 0.69 HRB
High 0.62 HRB
HRC:
Low 0.78 HRC
Mid 0.92 HRC
High 0.39 HRC
HRE:
Low 0.92 HRE
Mid 1.1 HRE
High 0.89 HRE
HR15N:
Low 0.76 HR15N
Mid 0.75 HR15N
High 1.1 HR15N
HR30N:
Low 0.55 HR30N
Mid 0.48 HR30N
High 0.46 HR30N
HR45N:
Low 0.68 HR45N
Mid 0.72 HR45N
High 0.66 HR45N
HR15T:
Low 0.79 HR15T
Mid 0.52 HR15T
High 0.61 HR15T
HR30T:
Low 0.70 HR30T
Mid 0.61 HR30T
High 0.42 HR30T
HR45T:
Low 0.98 HR45T
Mid 0.78 HR45T
High 0.81 HR45T
Load Cells & (0 to 3325) lbf 0.01 % Dead weights,

Transducers – Load comparison to
Cells, Force Gauges, Up to 2 000 lbf 0.036 % + 0.60 lbf master load cell
Force Rings, & (2 to 5.5) klbf 0.028 % + 1.9 lbf
Dynamometers (5.5 to 10) klbf 0.028 % + 4.0 lbf
(10 to 50) klbf 0.21 % + 19 lbf

Mass 1 mg 0.000 87 mg Mass by

2 mg 0.0010 mg substitution
3 mg 0.000 94 mg comparison using
5 mg 0.0012 mg NIST SOP 4 &
10 mg 0.0011 mg NIST SOP 7.
20 mg 0.001 mg
30 mg 0.0011 mg ASTM E617-18
50 mg 0.0013 mg Classes 3 to 7.
100 mg 0.0013 mg NIST Class F.
200 mg 0.0012 mg
300 mg 0.0016 mg
500 mg 0.0014 mg
1g 0.0014 mg
2g 0.0016 mg
3g 0.0022 mg
5g 0.0033 mg
10 g 0.0064 mg
20 g 0.0065 mg
30 g 0.0082 mg
50 g 0.013 mg
100 g 0.022 mg
200 g 0.055 mg
300 g 0.039 mg
500 g 0.043 mg
1 kg 0.06 mg
2 kg 0.28 mg
3 kg 0.56 mg
5 kg 0.84 mg
10 kg 1.1 mg
20 kg 11 mg
30 kg 24 mg
32 kg 24 mg
Pressure/Vacuum Up to 1 inH2O 0.0006 inH2O Pressure

Gauges & Transducers3 (>1 to 5) inH2O 0.0031 inH2O calibrators &
(>5 to 10) inH2O 0.0061 inH2O sensors
(>10 to 100) inH2O 0.0016 % + 0.0058 inH2O
(>100 to 400) inH2O 0.0015 % + 0.0015 inH2O
(-15 to 1500) psig Greater of (0.0092 % RDG +
0.014 psig) or 0.075 psig
(>1500 to 3000) psig 0.004 % + 0.242 psig
(>3000 to 6000) psig 0.0007 % + 0.656 psig
(>6000 to 10 000) 0.0038 % + 0.745 psig
Barometric psig
0.0033 % + 0.0039 psia
(8 to 17) psig
Refractometers3 (0 to 100) % 0.02 % + 0.6R Standard solutions

Scales, Balances, & (0 to 32) kg 1.2R Direct comparison

Weighing Instruments (0 to 2500) lbs 1.2R to ASTM Class 0,
with display resolutions of 1, 3, 4 & NIST
0.0001 g to 10 g.3, 12, 13 Class F mass
reference
standards.
Tachometers3 –
Non-Contact Up to 180 000 rpm 0.8R Calibrator, LED
Contact Up to 5000 rpm 0.024 % + 1.4 rpm Tachometer

(5000 to 15 000) rpm 0.032 % + 0.84 rpm calibrator
Torque
Wrenches, Watches, & Up to 1.5 lbf∙in 0.0076 lbf∙in Torque calibrator
Indicators >1.5 to 10 lbf∙in 0.17 % + 0.013 lbf∙in
>10 to 100 lbf∙in 0.25 % + 0.008 lbf∙in
>100 to 145 lbf∙in 0.38 lbf∙in
>145 to 3000 lbf∙in 0.28 % + 0.0058 lbf∙in
>3000 to 24 000 lbf∙in 0.25 % + 3 lbf∙in
Testers, Analyzers & Up to 2000 lbf∙ft 0.05 % Weights, loading

Transducers arms
Ultrasonic Thickness (0 to 10) in 25 uin/in + 850 uin Standard thickness

Testers3 specimen
IX. Optical Quantities
Gloss Meters3 20° 0.73 GU Gloss standards;

GU represents
60°, 85° 0.54 GU gloss units.

X. Thermodynamics
Parameter/Equipment Range CMC2, 4. 14 (±) Comments
Dew Point (-20 to 60) °C -0.44 °C + 0.6R Thunder Scientific

humidity chamber
Infrared (-15 to 120) °C 0.57 ᵒC + 0.0017 °C/°C Fluke 418x Series

Thermometers3 (35 to 500) °C 0.47 ᵒC + 0.0047 °C/°C
(150 to 1200) °C 3.3 ᵒC + 0.0049 °C/°C Isotech Pegasus
Temperature -80 °C, (-30 to 300) 0.006 % Rdg + 0.017 °C Temperature

Measuring Equipment °C 0.007 % Rdg + 0.039 °C source, SPRT
– Indicators, RTD’s, (300 to 650) °C 0.018 % Rdg + 0.41 °C
Thermocouples3 (650 to 1100) °C but no less than 0.02 °C
Relative Humidity –
Measure (5 to 95) % RH 0.9 % Rdg + 0.072 % RH Chilled mirror, RH

but Not Less Than 0.13 % RH Systems 973
0.57 % Rdg Pressure &

temperature method
Generate (5 to 95) % RH 0.28 % Rdg + 0.44 % RH Thunder Scientific

but Not Less Than 0.5 % RH 2500ST
Psychrometers (5 to 35) °C 0.1 °C + 0.84R Comparison to

SPRT in temp bath
XI. Time & Frequency
Frequency – Measuring 10 MHz 3 parts in 1011 GPS

Equipment & Measure
0.01 Hz to 6 GHz 3.1 parts in 1011 Function generator,
(6 to 26.5) GHz 6.7 parts in 1011 + 1 Hz signal generator,
frequency counter or
spectrum analyzer with
ext. GPS timebase
Stopwatches & Timers3 10 s to 72 hr 28 ms + 18 µs/s Function generator,

frequency counter
(2 to 960) s 0.037 s/day Timometer

SATELLITE FACILITY
TRESCAL, INC.
2951 S. Oakwood Rd
Oshkosh, WI 54904
Dainna Lowrance Phone: 414 351 7420
CALIBRATION
I. Acoustical Quantities
Sound Level3
Measure (Meters) (20 to 140) dB 0.33 dB Sound level
calibrator
II. Dimensional
Bore Gages3 Up to 12 in 21 µin/in + 0.6R SIP302M

(Whichever is Greater)
Calipers3 (Including Intertest,

Oditest, Snap Jaw & Other
OD Calipers) –
Resolution 0.0001 in Up to 2 in 78 µin Gage blocks
(2 to 12) in 70 µin + 4 µin/in
(24 to 60) in 340 µin + 3.7 µin/in
(30 to 100) in 700 µin + 3.4 µin/in
Chamfer Gages/Hole Gages3 Up to 12 in (20 + 0.6R) μin Cylindrical rings
Indicators3 – Dial & Test, Up to 4 in 35 µin or 0.6R Indicator calibrator

LVDTs (Whichever is Greater)
Height Gage3 Up to 48 in 10 µin/in + 0.6R Gage blocks

Micrometers3 –
Depth Up to 12 in 18 µin/in + 0.64R ULM, gage blocks,
Outside Up to 42 in 18 µin/in + 0.64R rings
III. Mechanical
Torque Wrenches Up to 1000 lbf∙in 0.6 % + 0.6R Torque calibrator

Up to 250 lbf∙ft 0.6 % + 0.1 lbf∙ft
______________________________________
1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length in inches; R is the resolution of
the unit under test; D is the diameter in inches; H is the height of the unit under test (except where noted);
and fs represents full scale. Ra is the numerical value of the nominal roughness of the surface measured
in micrometer roughness, except where noted; the value is defined as the percentage of reading, unless
otherwise noted.
5
CMC for calibrations performed in the laboratory with the Agilent/HP 3458A/HFL is based upon 90-day
specifications. CMC for calibrations performed field with the Agilent/HP 3458A is based upon 1-year
specifications. The measurands stated are generated with the Agilent/HP 3458A. This capability is
suitable for the calibration of the devices intended to measure the stated measurand in the ranges
indicated. CMC are expressed as either a specific value that covers the full range or as a fraction of the
reading plus a fixed floor specification. Unless otherwise noted, percentages are defined as percent of
reading.

6
CMC for calibrations performed with the Fluke 5520A is based upon 1-year specifications. CMC for
calibrations performed with the Fluke 5720A/EP is based upon 90-day specifications. The measurands
stated are generated with the Fluke 5500, 5700 and 732B series of instruments. This capability is suitable
for the calibration of the devices intended to measure the stated measurand in the ranges indicated. CMC
are expressed as either a specific value that covers the full range or as a fraction of the reading plus a
fixed floor specification. Unless otherwise noted, percentages are defined as percent of reading.
7
CMC for calibrations performed with the Fluke 5790A is based upon 1-year specifications. The
measurands stated are generated with the Fluke 5700 series of instruments. This capability is suitable for
the calibration of the devices intended to measure the stated measurand in the ranges indicated. CMCs
are expressed as either a specific value that covers the full range or as a fraction of the reading plus a
fixed floor specification. Unless otherwise noted, percentages are defined as percent of reading.
8
In the statement of CMC, the value is defined as the percentage of reading, unless otherwise noted.
9
This calibration is offered for “Field Service” only.
10
This accreditation covers calibrations performed at the main laboratory listed above, and the following
satellite laboratory located at 2591 S. Oakwood Road, Oshkosh, WI 54904.
11
Parallelism measurements apply only to optical parallels; calibrated for flatness and parallelism.
12
Balance resolution is not included in the CMC. The uncertainty stated on the Certificate of Calibration
will be larger than the CMC due to the resolution of the balance being included in the reported expanded
uncertainty.
13
Balances and scales are typically calibrated at the place of use. If a balance or scale is not calibrated at
the place of use, the user is responsible to account for any gravitational or air buoyancy errors that may
result.
14
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.
15
The measurands stated are generated using the indicated instrument (see Comments). This capability is
suitable for the calibration of the devices intended to measure the measurand in the ranges indicated.
CMCs are expressed as either a specific value that covers the full range or as a fraction of the reading
plus a fixed floor specification.
16
This scope meets A2LA’s P112 Flexible Scope Policy.

Accredited Laboratory
A2LA has accredited
TRESCAL, INC.
Milwaukee, WI
for technical competence in the field of
Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of
ANSI/NCSL Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation
demonstrates technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
Presented this 27th day of December 2021.
_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1078.01
Valid to November 30, 2023
Revised October 20, 2023
For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.

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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

Valid To: November 30, 2023 Certificate Number: 1078.01

Parameter/Equipment Range CMC2, 8, 14 (±) Comments

Generate (85 to 140) dB 0.20 dB + 0.032 % Piston phone,

Measure (Meters) (20 to 140) dB 0.32 dB Sound level calibrator

Parameter/Equipment Range CMC2 (±) Comments

Conductivity Meters (1 to 10) µS/cm 0.34 µS/cm Conductivity

pH Meters3 4 pH 0.011 pH Standard buffers

(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 1 of 50

Parameter/Equipment Range CMC2, 4 (±) Comments

Angle Plates3 Up to 48 in 65 µin or (12 µin/in + 30 Gage amp. probe,

Articulating Arm3 (CMM) – ASME B89.4.22-2004

Single Point Articulation (2 to 10.5) ft Rsys

Center Parallelism Up to 24 in (68 + 4L) µin Gage amp w/ probe

Base Flatness & Base Up to 24 in (62 +2.5L) µin

(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 2 of 50

Bore Gages3 Up to 12 in 22 µin or 0.6R SIP302M

Parallelism 5 in × 10 in × 10 in 28 µin Gage amp w/probe,

Calipers3 (Including Intertest,

Resolution 0.0001 in Up to 2 in 78 µin Gage blocks

Resolution 0.0005 in Up to 24 in 450 µin

Resolution 0.001 in Up to 30 in 840 µin

Chamfer Gages/Hole Gages3 Up to 12 in 20 µin + 0.6R Cylindrical rings

Clinometers & Up to 360° 0.18 arcseconds + 37 Sine bar/gage blocks

CMMs – Imaging (Video XY Diagonal Up to ISO 10360-7

EUV Up to 2 in (15 + 2.9L) µin Glass scales

EZ Up to 8 in (Z-axis) (41 + 3.2L) µin Gage blocks

Squareness – ESQ Up to 8 in (Z-axis) (19 + 130L) µin Ball bar

Probing Performance Diameter

(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 3 of 50

Length Error (EL) Up to 52 in 38 µin + 5.2 µin/in ASME

Coating Thickness 25 µin to 0.5 in 19 µin + 82 µin/in ULM

Concentricity Gage N/A 130 µin + 8 μin/in Indicator, bench center

Cylindrical Plugs3 Up to 4 in 4 µin + 5 µin/in ULM, gage blocks

Cylindrical Rings3 (0.1 to 4) in 4 µin + 5 µin/in ULM, gage blocks

External Spline Gages3 –

Measurement Over Pins Up to 8 in (170 + 28D) µin ULM

Circular Tooth Thickness Up to 8 in (110 + 16L) µin Vision system

Major Diameter Up to 8 in (28 + 12D) µin ULM

Fixed Gaging – Screw Pitch Up to 30 in (110 + 16L) µin Optical comparator,

Up to 360° 54” Vision system

(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 4 of 50

Gage Amplifier &

Single Probe Up to 0.025 in 8.9 µin Gage blocks

Gage Balls Up to 4 in (32 + 1.5D) µin Universal length

Gage Blocks Up to 4 in (3.1 + 3.2L) µin Gage blocks &

Height Gage3 Up to 20 in (7 + 4.6H) µin Gage blocks, by

Height Measures3 Up to 0.0005 in 13 µin Heidenhain Certo

(0 to 24) in (160 + 5.4H) µin Trimos Vertical 3

Indicators3 – Dial & Test, Up to 4 in 35 µin or 0.6R Indicator calibrator

Indicator Calibrator3 Up to 4 in 12 µin + 0.6R Gage blocks, amp

Laser Distance Meters Up to 6.1 m 4.6 µm/m + 120 µm ULM

(A2LA Cert. No. 1078.01) Revised 10/20/2023 Page 5 of 50

Length & Thickness

Steel Up to 4 in 4 µin + 5 µin/in ULM, gage blocks

Field Calibration Up to 16 in 5 µin + 14 µin/in + 4 ULM, gage blocks,

Linear Measurement of Up to 20 ft 1.5 μin/in + 0.58 μin Laser