Abraham Tilahun GSE 6950 15
Abraham Tilahun GSE 6950 15
Abraham Tilahun GSE 6950 15
SUBMITTED BY:
Abraham Tilahun
ID No: GSE/6950/13
SUBMITTED TO:
Dr. Kassu Jilcha (Asst. Prof.)
Jun 1, 2023
Addis Ababa, Ethiopia
Part I’ Discussion Type Questions
1. There are numbers of factors those affect reliability tests. Which factors affect the
reliability of test? List outthem.
Answer
1. The Length of the test,
2. !he expression of the items in the test
3. Homogeneity of the group
4. !he duration of the test
5. Objectivity in scoring
6. !he conditions in making a measurement
7. !he explanation of the test
8. The Characteristics of the items of the test
9. Difficult# of the test
2. Can a test produce scores that are reliable but not valid? Explain briefly why or why not.
Answer
YES: because
A measure can be reliable but not valid, if it is measuring something very consistently
but is consistently measuring the wrong construct.
Example:
3. Can a test produce scores that are valid but not reliable? Explain briefly why or whynot.
Answer
YES: because
A measure can be valid but not reliable if it is measuring the right construct, but not
doing so in a consistent manner. Like from the above example en Q2.
6. The wear out failure modes, such as corrosion and cracking, of a motor can be
accelerated by operating the system under increased temperature, humidity and in
presence of a catalyst. If the failure of motor follows an exponential model, how will
you estimate the mean time to failure at normal operating condition, by knowing the
MTTF under acceleratedconditions?
Answer
Given: Failure rate = number of failures/total uptime
MTTF @ an accelerated condition = T/r where T= cumulative test time and r= total
number of failures
MTTF @ an exponential model = 1/µ, where µ is the mean failure rate
Required: MTTF @normal condition=?
Mean time to failures is the average – or mean time that elapses from one unplanned
breakdown to the next, under normal operating conditions.
Answer
By examining the slope of the Weibull probability distribution we can decide to what degree
the burn-in test should be utilized. Hence there are four different cases
Case 1: Systems with increasing failure rate
Systems of this kind are already in their wear out stage from the start time. In this case, burn-
in will have a negative effect. It would make the systems worse, because systems that do
survive the burn-in will have a greater failure rate than what they had before the test and will
be more likely to fail in the field. Performing a burn-in is not advised in this case.
Case 2: Systems with decreasing failure rate
Systems with decreasing failure rates are ideal candidates for burn-in testing. For such
systems, longer burn-in periods will result in surviving systems that are better than new
systems, but will also result in more discarded weak systems. The burn-in period should be
determined based on a certain criterion (for example, optimizing burn-in time based on a
reliability goal, a failure rate goal or cost of burn-in and future replacements).
In this case we consider that the system follows a period of decreasing failure rate, followed
by an increasing failure rate period (and possibly an intermediary constant failure rate
period). Note that the term bathtub curve is usually used to describe an entire non-
homogeneous population of units. Here, however, we are using it to describe the failure rate
of a single system or each system in a population of systems. We can determine the
appropriate burn-in time for the system that could eliminate the early life problems.
Case 4: System with constant failure rate
for such systems, burn-in makes the population neither better nor worse. In these cases, burn-
in is not recommended because it would be a strategy that is useless and will only result in
increased costs and delays.
8. In industry, statistical tests are extensively used for product quality testing. Do you
know, what is the criterion to accept or reject a null hypothesis?
Answer
The following steps are performed to reject or accept the null hypothesis
Step 1: State the null hypothesis and the alternative hypothesis
Step 2: find the calculated critical value
Step 3: find the critical value from the table
Step 4: Compare the calculated value from the critical value of the table
Step 5: if the calculated value in step 2 is > the critical value in step 3, then reject the
null hypothesis
9. For material subjects to corrosion, the length of time before degradation become
unacceptable is being lengthy. If you know the corrosion rate and the maximum
allowable loss, after which the material is no longer structurally sound, how will you
estimate the time to failure? (Corrosion rate measures the thickness loss of material
per unit oftime)
Answer:
Given:
Corrosion rate
Upper(maximum limit)
Required:
Time to failure=?
g(x )=d-CR.t
d = maximum allowable corrosion depth
CR = corrosion rate
t = duration of wet service
X¯= vector containing all the basic uncertainty variables
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10. Try to discuss and illustrate by example the stages of system lifecycle?
• Analysis-The analysis stage includes gathering all the specific details required for a new
system as well as determining the first ideas for prototypes.
• Design-The design stage is a necessary precursor to the main developer
stage.Developers will first outline the details for the overall application, alongside
specific aspects, such as its:
User interfaces
System interfaces
Network and network requirements
Databases
• Development &testing-The development stage is the part where developers actually
write code and build the application according to the earlier design documents and
outlined specifications.Implementation- it must be tested to make sure that there
aren’t any bugs and that the end-user experience will not negatively be affected at any
point.
During the testing stage, developers will go over their software with a fine-tooth comb,
noting any bugs or defects that need to be tracked, fixed, and later retested.
• Documentation-Documentation is any communicable material that is used to describe,
explain or instruct regarding some attributes of an object, system or procedure, such
as its parts, assembly, installation, maintenance and use
• Evaluation-measuring the final system against its initial performance goals as well as
performing ongoing testing to see that the system continues to meet those goals.
11. Discuss the product testing types, reliability life testing and factors to be considered in
reliability testing?
Safety Test -To find hazards ,catastrophic occurrences ,loss of life or economic loss
by generating faulty actions.
o Duration of test
Solution:
n
TypeI multiply: =∑ ti+ ( n−r−k ) t∗¿
ti=1
whwer :
MTTF = T / r
Given
n = nbr on test=20
k = nbr multiplycensors=2
r = nbr failures=8-2=6
So the
n
TypeI multiply: =∑ ti+ ( n−r−k ) t∗¿
ti=1
For Type I testing T=10.8 + 12.6 + 15.7 + 28.1 + 30.5 + 36.0 + 42.1+48.2 + (20 - 6 -
2) 50
= 824 hours
This is Type II testing. Since the length of test is MTTF *TTFr, nthen,
TTF8, n=72 /55=1.31
TTFr, 11 = 48 /55=0.872
So TTF7, 11=0.937
TTF6, 11 =0.737
Then the failure is 6 units
3. The reliability testing has shown that a ground power unit used to supply DC power
to aircraft has a Weibull distribution with β= 0.5.0 and α= 45000 operating hours.
Determine burn- in period necessary to obtain a required reliability specification of
R(1000)=0.90.
Solution:
First of all checked weather it is necessary y to find the bur in period that means
R(1000)=e(1000/45000)0.5=0.89 <1
And then β<1 Therefore, the burn-period is necessary. Numerically solving
¿¿
(𝑡|𝑇0)= e =0.90
T= 126 hr.
Then R (1000/126)=0.90
4. Test thehypothesis
H0 :R0= 0.90
H1:R1= 0.85.0
With α= 0.05 and β= 0.10
Solution:
R0=0.90 R1=0.85 α=0.05 β=0.10
A= = 0.1/(1-0.05)= 0. 10526
B= (1-0.1)/0.05=18
D= ln[(R0(1-R1)/(R0(1-R1)]=ln[(0.85(1-0.90)/(0.90(1-0.85)]=-0.4626
Slope of the accept/reject lines is, ln( 0.15/0.10)/ D 0.876
Then, ln(B /) D-0.6 2478 and ln(A /) D = 4 .866 . The acceptance region is - 6.2478 +
0.876n < yn < 4.866 +0.876n and H0 will be rejected if ynfalls below the lower
bounds, and accepted if ynexceeds the upper bound. A graph of the regions is shown
below. The minimum number of test cases to reject H0is 8 (where the reject line first
crosses the horizontal axis),whereas the minimum number needed to accept H0is 40.
Below 40, the number of survivors needed to accept H0 is more than the number at risk.
5. An automotive part was tested at an accelerated cycling level of 100 cycles per hour.
The resulting failure data were found to have a Weibull distribution, with β= 5.2 and
α= 1000hrs. If the normal cycle time is 5 per hour, what is the normal cycle
characteristic life andreliability?
Solution:
xn=5/hr.= normalcycle
Xα
αn= a= (100/5)*1000
xn
=20000hr.
( )
β
t
Rn(t)= e−
αn
=e [-(t/20000)5.2] =
But there is no given time
6. An electronic component has a normal operating temperature of 294 K (about 21 0C).
Under stress testing at 430K a Weibull distribution was obtained with ɵ=
254hrs, and at 450k, a Weibull distribution was obtained with ɵ= 183hrs.The shape
parameter didn’t change with β=1.72. Compute the acceleration factor to be applied at
the normal stress temperature. What is the characteristic life at normal
operatingtemperature?
Solution:
Arrhenius equation (for reliability)
AF= exp [(Eaa/k) (1/T1 - 1/T2)]
Eaa =is the apparent activation energy (eV)
AF= acceleration factor
Therefore, the acceleration factor to be applied at the normal stress temperature,
T1=430k ,T2=450k ,ϴ1=254hrs. ,ϴ2=183hrs.
Eaa is the apparent activation energy (eV)=
254
lnAF ln ( )
183
Eaa=
( 1
−
T1 T2
1
)= ( 1
−
1
430 450 )
=3172
Given:
ϴ1=100
ϴ0=150
α=0.1
β=0.1
d=150/100=1.5
8. For constant failure rate (CFR) model mean time to failure was found to be 235hrs and the
cumulative test time was given as 55 hours for the total test number of 500units.
a. What was the total numbers of failures in this test timelength?
b. What is expected mean time tofailure?
c. Whatisthetestfactortime(TTRr,500)?
d. What is the estimated test time if failure units are replaced and r units are there ontest?
Solution:
MTTF=235 hr.
T=55 hr.
n=500 units
a) MTTF= T/r
r= T / MTTF =55/235
=0.23
b) E
c) (TTRr,500)=?
E(test time)=MTTF x TTRr,n,
TTRr,500) =MTTF/E= 235/0.108=2,175.92
d) =E(test time)=MTTF* (r/n) 235/(0.23/500)= 0.108 hr.