ISSCC2011Visuals T1

Download as pdf or txt
Download as pdf or txt
You are on page 1of 88

Integrated LC oscillators

Pietro Andreani
Dept. of Electrical and Information Technology
Lund University, Sweden
(also with ST-Ericsson, Lund, Sweden)

ISSCC 2011 Tutorial, S. Francisco, February 20th, 2011

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


Overview

• Popular LC (voltage-controlled) oscillators


– Oscillation frequency, tuning range, gain factor
• Passive components
– Inductors, varactors
• Phase noise
– Linear time-variant analysis
– Phase noise in popular LC oscillators
• Interface circuits
– Voltage regulator
– Buffers

2 2
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Why bother about LC oscillators?

• LC VCO a truly fundamental analog block in radio


transceivers
• More and more bands are being added in cellular
communications  tougher demands on VCOs
• A large amount of total power consumed in VCOs 
attractive for optimization
• Bottlenecks in terms of noise performance and spur
sensitivity

3 3
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Frequency synthesis with PLL

Reference frequency from crystal


oscillator (26MHz / 52MHz)

VCO
fXO PFD LPF fRF

/N
RF frequencies, perhaps over a very
large band (e.g. several GHz)

4 4
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Building an LC oscillator

All losses compacted into a


LC tank
parallel resistance

C
L R ‒Ractive

Z tank ( jω0 ) = R
1 1
ωo ≈ fo ≈
R
LC 2π LC Q= = Rω0C
ω0 L

5 5
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Colpitts oscillator

Classical embodiment with only one active device

L R

Vout
VB
C1

IB C2

6 6
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Start-up conditions – linear analysis

Barkhausen’s criterion: oscillation


if loop gain (LG) is such that
LG ( jω ) = 1
L R
φLG ( jω ) = 0

− g mVs C1 Example: LG = β A
Vs
C2
+ A

7 7
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Start-up conditions

1 C1C2
ωo = C=
LC C1 + C2

L R
Vs'
LG =
Vs 1 1
≡ gm =
Ractive R ⋅ n ⋅ (1 − n )
C1
Vs Vs'
C1
1 n=
g mVs C2 C1 + C2
gm

8 8
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Large-signal regime
Very non-linear  operation in class C
VDD

Vout
L R
VDD
Vout
VB
Itank
C1
t
Itank IB C2

9 9
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Describing function approach

I DS

Iω0
L R ≈ 2I B
t

Vout
Iω0
C1 1 Aout = Iω0 R (1 − n )
ωo =
LC ≈ 2 I B R (1 − n )
Fundamental
C2
C1C2 C1
current harmonic C= n=
C1 + C2 C1 + C2

T. H. Lee, “The Design of CMOS Radio-Frequency Integrated Circuits”, 2003


10 10
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Cross-coupled differential-pair oscillator
Extremely popular family of oscillators
Operation in class B
VDD IB IB

t
V+ V- V-
VDD
V+
N1 N2
t

R 2 2
IB A+ = A− = I B Adiff = IB R
π 2 π

11 11
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Oscillator with complementary switch pair

IB
t
-IB
VDD
V+ V- V+ V-

t
4
Adiff = IB R
π
IB Compared to single-switch-pair 
double amplitude, but also double VDD

12 12
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Current bias – MOS source

• High-impedance source
• 1/f noise upconversion
V+ V-

N1 N2

“Tail” current source


VB IB

13 13
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Current bias – resistor

• Low impedance source


V+ V- • 1/f noise absent

N1 N2

Ismail and Abidi, ISSCC ‘03


14 14
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Two regions of operation

VDD
Vosc
Voltage (supply) limited

Current limited
2
A= IB R
IB π

IB
• Current-limited region  Vosc proportional to IB·R
• Peak oscillation amplitude cannot exceed VDD  voltage
limited  extra losses from MOS pair and tail source
• Operating at the limit between current-limited and voltage-
limited  best performance

15
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Integrated inductors

Nguyen and Meyer, JSSC Aug. 1990 Nguyen and Meyer, JSSC March 1992

In standard nm CMOS, take advantage of the (relatively) thick top


metal layers needed by digital power supply routing!
State of the art: inductances up to a few nH, Q = 10-20 @ 2-5 GHz

16 16
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Hollow coils

Craninckx and Steyaert, JSSC May ‘97

17 17
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Ground shield

If Rp = 0 or ∞
 maximum Q
Conductive ground shield 
Rp very small

18 18
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Patterned ground shield

Slot
Induced current

Ground strip

Ground strips Slots between strips

No closed loops in the ground shield

Yue and Wong, JSSC May ‘98


19 19
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Effect of ground shield

Aluminum Polysilicon

Q Q

PGS = Patterned ground shield


SGS = Solid ground shield
NGS = No ground shield

20 20
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Can you spot two differently-looking inductors?

M. Nilsson et al, “A 9-Band WCDMA/EDGE Transceiver Supporting HSPA Evolution”, ISSCC ’11, paper 21.2.
21 21
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
8-shaped coil

8-shaped  rejects common-


mode magnetic fields!

clover-shaped  even
higher rejection, but
higher losses
+-
0V
T. Mattsson, US patent #7,151,430 B2, Dec. ‘06
22 22
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Improved robustness at chip level
• Possible to have 2 PLLs working at the same time and
at very similar frequencies (WCDMA)
• No pulling from TX PA

23
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Frequency tuning

• Only one frequency is not enough  a more or less


wide frequency “tuning range” (TR) is needed to
sweep across the targeted communication bands
• Additionally, we need to take into account the
process variation on the value of L and C
• Look for a component having a variable inductance
or variable capacitance
• Variable capacitance  varactor  reverse-
biased diode, or MOS device
• MOS varactor by far the most popular

24 24
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
MOS varactors

PMOS device

CMOS
Strong inversion (p) Accumulation (n)

Moderate/weak
inversion (p)
Depletion (n)

VGB

25 25
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
NMOS in N-well

Avoided!
CMOS Cmax

Cmin
VGB

Soorapanth et al, VLSI Symp. ’98; Svelto et al, VLSI Symp. ’98; Andreani and Mattisson, JSSC June ‘00
26 26
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Varactor trade-off

Cpar
2Cpar Cvar
L
G
Cvar ∝ W·L
D S W
Cpar ∝ W
Rvar ∝ L/W
 Maximum Q and minimum tuning range (TR)
with L=Lmin
L  Trade-off between Q and TR
Cmax/Cmin > 5 and Q > 50 @ 5GHz achievable

27 27
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Discrete tuning
• Continuous tuning covers
only a small fraction of
overall TR
V+ V- • Decouples TR from VCO
gain factor KVCO
ON/ ON/ ∂ω
OFF OFF KVCO =
∂Vctr
• Crucial to keep impact of
thermal noise and spurs
fRF from PLL PFD and LPF
small  large R and
fXO PFD LPF relatively small C in LPF ok
 full PLL integration
/N • Needs calibration before
release in PLL
Kral et al, CICC ‘98
28 28
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Example of discrete overlapping bands

• fosc =1.07-1.42GHz
Frequency [GHz]

• 28% TR
• KVCO only 75MHz/V

Tuning voltage (V)

Berny et al, CICC ‘03


29 29
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Two approaches to discrete tuning

Vctr Vctr
CGD C

CDB

≈ CDB + CGD

Vctr,off Vctr,on Vctr,min Vctr,max

Sjöland, TCAS-II, May ‘02


30 30
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Switched capacitor – trade-off

Vctr
CGD C

CDB

Cpar ∝ W
Rsw ∝ L/W
L  Maximum Q for L=Lmin
W  Trade-off between Q and TR

Berny et al, JSSC Apr. ‘05; Dal Toso et al, ISCAS ‘10
31 31
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Avoiding parasitic switch conduction

Floating nodes must be avoided;


highest possible overdrive when “on”
1.8V

0V
Vth 0V Vth

1.2V
Maximum VGD and VDB 0V
must not be exceeded

Sjöland, TCAS-II, May ’02; Andreani et al, ESSCIRC ‘10


32 32
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
More levels of discrete tuning

.
.
• fosc =2.55-4.08GHz
Frequency [GHz]

. • 5-bit coarse tuning,


1 coarse
. 5-bit fine tuning
step
. • Small varactor for
continuous tuning
.
.
.
Fine step (5 bits)

Andreani et al, ESSCIRC ‘10


33 33
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
A digression – digitally-controlled oscillator (DCO)

DCO
fXO TDC FIR fRF

/N
• No analog tuning device in DCO, still needs
to tune fRF very finely  extremely small
switchable C needed

Example: for 2kHz resolution at 3.6GHz with


Ctank = 4.5pF and L = 500pH, ∆Ctank = 5aF

This and next two slides courtesy of Prof. A. Liscidini and Dr. Luca Fanori, Univ. Pavia, Italy
34 34
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Small effective capacitances

• Capacitive divider
– Sensitive to mismatches and
parasitic caps

Chen et al, A-SSCC ‘07

Staszewski et al, JSSC Nov. ‘05


• Capacitive ∆Σ dithering
– Standard approach, but: spurs, large
high-frequency quantization noise

35 35
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Very small effective capacitance without dithering

• A large Cs between the sources is


seen by the tank as very much
smaller

For 2ω0CS >> gm 


2
 gm 
Im (Y ) = −ω0CS  
 2ω0CS 

Cs is shrunk!
• Minimum capacitive step beyond
technology limitations!

Fanori, Liscidini, Castello, JSSC Dec. ’10


36 36
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Why bother about phase noise?

Phase noise in transceiver is important for at least three


reasons:
1) in a receiver, it can downconvert a large nearby
signal on top of the desired signal
2) in a transmitter, it can increase the noise floor in the
receive band
3) in both, it can directly corrupt the phase information
in the signal
– Not seldom, the phase noise of the VCO is the bottleneck for the
whole radio performance

37
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise

Phase noise, in dBc/Hz


dBc

f0 f

• The oscillation is modulated by unavoidable noise sources 


the LO signal displays skirts in the frequency domain
• Close to the f0 carrier, amplitude noise is rejected by the
amplitude-stabilizing mechanism intrinsic to the oscillator 
only phase noise is left

38
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Example of phase noise requirements – GSM

RX TX

Hegazi and Abidi, JSSC May ‘03


39
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Frequency down-conversion – ideal

fo
LO IF

Desired signal + Blocker

LO Blocker
Ideal down-
conversion @ BB
Desired
signal

fo fo+ f1 0 f1

40 40
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Frequency down-conversion – real

fo fo+ f1 0 f1

Noise floor raised by mixing of LO phase noise


with blocker (“reciprocal mixing”)

41 41
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Example of reciprocal mixing – GSM

−23dBm Noise floor due to


reciprocal mixing:

−23 −138 = −161 dBm Hz

−99dBm PN @ 3MHz
f f + Δf
3MHz

This should be compared to the RX thermal noise floor:

−174 + NF ≈ −171 dBm Hz

42 42
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
TX-to-RX leakage in WCDMA

Antenna

Duplexer

TX RX TX-to-RX = –40dBc

RX-to-TX = –50dBc

LNA

PA

43 43
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
WCDMA band VIII (GSM)

TX RX

880 915 925 960 f (MHz)

45MHz

44 44
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise requirements – WCDMA

-40dB
-13dBm+PN
+27dBm
LNA
We accept only a very
PA marginal increase of
the RX NF

Margin for 0.5dB


PN at duplex deterioration of NF=3dB
frequency

−13 + PN < −174 + NF − 9 PN < −167 dBc/Hz


TX power leaked RX thermal @ 45MHz
3dB
to RX input noise floor
45 45
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise in ideal LC oscillator – LTI approach

C
L R ‒Ract


Y (ω ) =  G + jωC +
1  (1 − ω 2 LC )
 − Gact =
 jω L  jω L
j (ω0 + Δω ) L ω0 L
Z (ω0 + Δω ) ≈ ≈−j
(
1 − (ω0 + Δω ) LC
2
2
Δω
) ω0
ω0 L ω0 L 1 ω0
Z ( ω 0 + Δω ) = = R⋅ ⋅ = R⋅
Δω R 2 Δω 2QΔω
2
ω0 ω0
46
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise from tank losses

2
C
in L

2 2
v n2 in2 2  ω0   1 ω0 
= ⋅ Z (ω0 + Δω ) = 4k BTG ⋅  R ⋅  = 4 k B TR  ⋅ 
Δf Δf  2Q Δω   2Q Δω 
• Both amplitude and phase noise, but amplitude noise is rejected
• The phase noise is defined as half the above expression, normalized
to the output signal power (in dB below the carrier per Hertz, dBc/Hz):

 v2 2   2k TR  1 ω 2 
L ( Δω ) = 10 log10  2n  = 10 log10  2B  ⋅ 0  
 Apk 2   Apk 2  2Q Δω  
   

47
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Leeson’s equation

 2k TR   1 ω 2    Δω1 f 3 
L ( Δω ) = 10 log10  F ⋅ 2B 1 +  ⋅ 0    ⋅ 1 + 
 Apk 2   2Q Δω     Δω 
 
L ( Δω )

Up-converted 1/f noise (30dB/dec, 1/f3 region)

Thermal noise (20 dB/dec, 1/f2 region)


Noise floor
Ideal L ( Δω )

Δω1 ω0 log ( Δω )
f3
2Q
48
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Example of phase noise

Notch  artifact of the


measurement technique

1/f3 noise corner

49
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Hajimiri and Lee’s theory of phase noise

The conversion of noise


δ (t −τ ) Vout ( t ) into phase noise is time-
dependent – LTV phase
noise analysis needed!
No phase noise Maximum phase noise
Vout Vout

δ (t −τ ) δ (t −τ )

Hajimiri and Lee, JSSC Feb. ‘98


50
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Impulse sensitivity function (ISF, Γ)

• Current noise source in (φ ) is weighed by associated Γin (φ )


 effective current noise in ,eff (φ ) = in (φ ) ⋅ Γin (φ ) (φ = ω0t )
• ISF  dimensionless, frequency- and amplitude
independent, with period 2π:
c0 ∞
Γ (φ ) = +  cn cos ( nφ + φn )
2 n =1

• We define in2,eff ,rms as



1
in2,eff ,rms  n,eff (φ ) dφ
2
= i
2π 0

51
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
ISF and phase noise
• If in (φ ) is a cyclo-stationary white current noise source, its
contribution to phase noise is
 in2,eff ,rms 
L ( Δω ) = 10 log  
 2 ( CA )2 ( Δω )2 
 pk 

• If in (φ ) is a cyclo-stationary 1/f current noise source, its


contribution is
 in2,eff ,0 
L ( Δω ) = 10 log  
 2 ( CA ) ( Δω )2 
2

 pk 
where in ,eff ,0 is the DC component of the Fourier series of in ,eff (φ )

52
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Examples of ISFs

LC oscillator Ring oscillator


Vout = cos (φ )

φ φ

Γ = − sin (φ )

φ φ

Hajimiri and Lee, JSSC Feb. ’98; Andreani and Wang, JSSC Nov. ‘04
53
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
A particularly simple case

• Parallel RLC resonator again  stationary noise  contribution


of R to phase noise is:
 in2,eff ,rms   in2 Γi2n ,rms 
L ( Δω ) = 10 log   = 10 log  
 2 ( CA ) ( Δω )2 
2
 2 ( CA ) ( Δω )2 
2

 pk   pk 
 
4 k TG ⋅ 1 2
= 10 log  B 
C  2 ( CA ) ( Δω ) 
2 2

i n2 L  pk 
 2
k BTG  ω0  
= 10 log 
 ( Cω A )2  Δω  
 0 pk 
Leeson with F=1  2k TR  1 ω 2 
recovered without any = 10 log  2B  0
 
ad hoc assumptions!
 Apk 2  2Q Δω  
 

54
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise from MOS pair

iN2 1 (φ ) = 4k BT γ n g m, N 1 (φ ) iN2 1,eff (φ ) = iN2 1 (φ ) ⋅ Γ 2N 1 (φ )

Γ N 1 (φ ) ≈ 1

IN2 I N1
V-

V+

N1 N2

IB
−Φ Φ
Two commutations in one oscillation period

55
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Total phase noise – very simple expression
Tank MOS pair

 k BT 
L ( Δω ) = 10 log  2 2 2 (
1 + γ n )
 RAtank C ( Δω ) 

F = 1+ γ n
• Transistors appear only through channel noise factor γn
• Transistor phase noise always proportional to tank noise (60%
from tank, 40% from MOS pair, if γn = 2/3)
• This is because transistor noise is proportional to commutation
time, which is inversely proportional to the oscillation
amplitude, which is proportional to the tank parallel resistance
• A simple-minded LTI analysis would yield very wrong
predictions (i.e., MOS phase noise increases with MOS gm)
Andreani et al., JSSC May ‘05
56
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
MOS phase noise – invariance

1 2I B
i 2
N1 ( φ ) = 4 k BT γ n g m , N 1 ( φ ) Φn =
Atank βn 2 × βn

Two effects balance each other:

1) Larger MOS produces more


noise during current
commutation, and
2) Larger MOS allows a faster
commutation

Result: the two areas are identical

−Φ n −Φ n ,2 β Φ n ,2 β Φn

57
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise from tail current source

η (Φ )

 k BT 
2 (
L ( Δω ) = 10 log  2 2 1 + γ + η ( Φ ) γ n g m ,bias R ) 
 RAtank C ( Δω ) 

Andreani et al., JSSC May ‘05


58
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Choice of inductor

 k BT 
L ( Δω ) = 10 log  2 2 2 (
1 + γ )
 RAtank C ( Δω ) 

• In the low GHz band, inductor loss dominates (although Q is


steadily increasing)
1 1 L2ind L2ind
L ( Δω ) ∝ 2 2
∝ 3 2 2∝ 3 2 = 3
RAtank C R C I B R I B R par , L I B2

• In terms of the series resistance of the inductor 


3
Rser
L ( Δω ) ∝ ,L

L4ind I B2
• The above expression should be minimized

59
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Choice of inductor – II
3
Rser
L ( Δω ) ∝ ,L

L4ind I B2
3
Rser ,L
• 4
decreases with increasing Lind
Lind
• It would seem that Lind should be maximized  C is 100%
parasitic capacitance
• However, a large Lind forces the oscillator to enter the voltage-
limited region for a low I B  phase noise may be too high!
Vosc Voltage limited

Current limited

IB
• A few iterations are needed to find the optimal value of Lind

Approach borrowed from Ham and Hajimiri, JSSC June ‘01


60
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Single-ended Colpitts oscillator

2
iMOS (φ )

Γ MOS (φ )
L R

Vout
VB
C1

IB C2
, eff (φ )
2
iMOS

Noise injected into tank when ISF is near zero  excellent!


Hajimiri and Lee, JSSC Feb. ‘98; Andreani et al., JSSC May ‘05
61
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise of single-ended Colpitts oscillator

 k BT  1 − n 
L ( Δω ) ≈ 10 log  2 3 2 
1+ γ n 
 4 I B R (1 − n ) C ( Δω ) 
2 2
n  

Minimum for:
0.30 for γ n = 2 3

nopt = 1 3 for γ n = 1
0.36 for γ = 1.5
 n

• However, contrary to what was commonly (and


justifiably) believed, Colpitts is more noisy than
differential-pair LC oscillator!

Andreani et al., JSSC May ‘05


62
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Harmonic oscillators – a general result

1) Γ sinusoidal and in quadrature with tank voltage


2) Active devices work as transistors
3) Transistor current noise proportional to gm

Transistor effective noise depends only on


tank loss and topology

J. Bank, ”A harmonic oscillator design methodology based on describing functions”, PhD thesis, Gothenburg, Sweden, 2006
Mazzanti and Andreani, JSSC Dec. ‘08
63
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Double-switch pair vs. single-switch pair
Double-switch-pair (DS) oscillator Single-switch-pair
(SS) oscillator

4 2
ADS = IB R ASS = IB R
π π

V+ V- V+ V-

What phase noise


difference should
we expect?

IB
IB

Andreani and Fard, JSSC Dec. ‘06


64
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Phase noise of DS oscillator

 k BT  γn +γ p 
LDS ( Δω ) = 10 log  2 2  1+  
 A C ( Δω ) R 
2
2 
 DS

• pMOS and nMOS contribute equally


– Independently of relative strengths
– Assumptions: fast switching, no parasitic capacitances
• 60% from tank, 40% from transistors
– If γn = γp = 2/3

65
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
DS vs. SS – phase noise

 k BT  γn +γ p 
LDS ( Δω ) = 10 log  2 2  1+  
 A C ( Δω ) R 
2
2 
 DS
 k BT 
LSS ( Δω ) = 10 log  2 2 (1+ γ n )
 A C ( Δω ) R
2

 SS 

If IB,DS = IB,SS and γn = γp 

ADS = 2 ASS → LDS = LSS − 6dB

66
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
DS vs. SS – MOS noise

SS
Area (SS) = 2 · Area (DS)

4 DS transistors
make as much noise
as 2 SS transistors!
DS

−Φ n , SS −Φ n , DS Φ n , DS Φ n , SS

67
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
DS and SS – phase noise vs. IB

DS-VCO

SS-VCO
6dB

• 2.15 – 2.35 GHz


• Q ≅ 11

Andreani and Fard, JSSC Dec. ’06


68
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
DS and SS – phase noise vs. power consumption

• If IB,SS = 2IB,DS  ASS = ADS  same phase noise

• In this case, VDD,SS = ½ VDD,DS  same power consumption

• Thus, same maximum achievable “figure-of-merit” (phase


noise for a given power consumption)

69
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Asymmetry between nMOS and pMOS in DS

• If Cpar >> C
– ΓN1, ΓN2 unchanged
– ΓP1, ΓP2  larger

• Cpar large  pMOS noise


Cpar dominates

70
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Asymmetry between nMOS and pMOS in DS – II

• A part of the charge stored


in Cpar discharges through
pMOS  Q deterioration
 further increase in phase
noise
Cpar • If Cpar = 50% of total C 
4.4dB simulated phase
noise deterioration (also
depending on pMOS size)
• SS oscillator insensitive to
Cpar  great advantage

Andreani and Fard, JSSC Dec. ‘06; Murphy, Rael, Abidi, TCAS-I June ‘10
71
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Impact of parasitic tail capacitance in SS/DS

• Ctail,par + cross-coupled MOS


entering linear region 
phase noise deterioration
• Distortion of oscillation
waveform, MOS ISF
increases, even by a large
amount

Ctail,par • Ctail,par good for filtering


noise from bias MOS

72 72
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Possible solution – noise filter

• Noise filter: Ctail,par resonates with


Ltail at 2 ω 0  tail at high impedance
• CBIG filters bias noise
• CBIG includes CDB of MOS bias 
long and large MOS, low 1/f noise
• Drawback: narrow-band, extra Ltail
needed
Ltail Ctail,par

CBIG

Hegazi, Sjöland, Abidi, JSSC Dec. ‘01


73 73
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
More on tail filter

CBIG
• Many variations on the
same theme
• In voltage-limited designs,
effective in diminishing the
losses introduced by the
MOS pair
• Popular technique

Ltail Ctail,par

Hegazi, Sjöland, Abidi, JSSC Dec. ’01; Murphy, Rael, Abidi, TCAS-I June ‘10
74 74
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Class-C LC oscillator

V+ V- Ctail turns class-B operations


into class-C  optimal
convergence of two topologies:
1) classical diff-pair LC oscillator
N2 N1
2) differential Colpitts oscillator

Ctail However, there are drawbacks


IB as well

Mazzanti and Andreani, JSSC Dec. ’08


75
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Advantage of class-C
• Same effective noise as in diff-pair LC oscillator
• However, class-C operation  higher oscillation
amplitude
• Ideally, 3.9 dB phase noise improvement
Idrain Ibias
Iω0≈ I bias
I N1 I N2
class-C

2
Iω0≈ ⋅ I bias
“diff-pair” π

76
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
More on class-C oscillator

• Diff-pair must not enter the linear


region
V+ V-
• Shift of MOS DC gate voltage
necessary
• RC bias should not load tank
• Transformer feedback also an option
VB • Ctail  from foe to friend (class-C +
bias noise filtering)
Ctail
• Ctail includes CDB of MOS bias 
long and large MOS, low 1/f noise

77
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Drawbacks of class-C

• An extra (low-noise) bias voltage VB is needed


• MOS transistors must not enter the linear region 
maximum oscillation amplitude Amax is
VDD − VB + Vth
Amax =
2

 lower than with standard LC oscillator, where Amax = VDD


• If MOS enters linear region  severe phase noise
penalty
• If Ctail larger than a limit value  instability of the
oscillation amplitude (“squegging”)

78
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Example of class-C VCO
• 4.90 GHz < fc< 5.65GHz
3

• VDD= 1V, IB=1.4 mA

fosc= 5.52 GHz

-130 dBc/Hz
fosc = 4.90 GHz

Mazzanti and Andreani, JSSC Dec. ’08


79
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
On the upconversion of 1/f noise

No upconversion from cross-coupled transistors if:


1) PSD of 1/f noise current of cross-coupled transistors is
2
proportional to g m
– E.g., square-law MOS with 1/f noise proportional to drain
current
2) And, common source of cross-coupled transistors sees
a very high impedance at low frequencies
• A few 2nd-order effects cause 1/f noise upconversion,
especially from tail current source and power supply:
– Change in bias point and AM-to-PM conversion in non-linear
varactors and parasitic capacitors
– Possibly, Groszkowski’s effect (frequency shift induced by a
change in the current harmonics flowing into the tank)
Mazzanti and Andreani, TCAS-I Oct. ’09; Andreani et al., unpublished; Levantino et al., JSSC Aug. ‘02;
Hegazi and Abidi, JSSC June ‘03; Rael and Abidi, CICC ’00; Bevilacqua and Andreani, ISCAS ‘11
80 80
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Pushing from power supply

VDD

• Non-linear capacitances
• Groszkowski’s effect

Andreani et al, ESSCIRC ’10


81 81
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE
Voltage regulator

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


VCO-regulator co-design

• Pushing + regulator noise  phase noise


• Regulator must be co-designed with VCO  target is
negligible phase noise deterioration
• Usually achievable with moderate power consumption
(compared to VCO)

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


LO distribution
3.4 mm

• Large chip  long


distance between PLL
2nd RXFE Main RXFE and mixers / dividers
RX • Long routings would
PLL load the VCO tank
• Possibly, several blocks
driven by PLL (maybe
not at the same time)
• Buffers needed!
• It is a good idea to
isolate the VCO anyway

M. Nilsson et al, “A 9-Band WCDMA/EDGE Transceiver Supporting HSPA Evolution”, ISSCC ’11, paper 21.2

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


Possible buffer configurations

Very long routings or


many routings in parallel
 convenient to add
one more buffer stage

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


Inverters as buffers

C
• Pseudo-differential
• Low noise

Vout Noise
window
Large C and narrow
noise window 
large inverter 
high power consumption

t
Δt

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


Phase noise floor

L Noise floor from buffers


1/f noise

Thermal noise

f
TX-to-RX leakage
in WCDMA Large offset and low
phase noise  buffer
noise floor dominates
TX RX

© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE


Summary

• Popular LC VCOs
– Colpitts, cross-coupled pair (single-pair and double-pair),
noise filter, class-C
• Passive components
– MOS varactor, switched linear capacitor
– Inductors: hollow, differential, with ground shield, 8-shaped
• Phase noise
– Impact in radio transceivers
– Hajimiri and Lee’s theory – the Impulse Sensitivity Function
– Phase noise equations for all treated oscillators
• Interface circuits
– Voltage regulator, pushing from power supply
– Buffers: inverters, cascaded inverters, noise floor

88
© 2011 IEEE IEEE International Solid-State Circuits Conference © 2011 IEEE

You might also like