– 64 – 62305-1 Ó IEC:2010(E)

NOTE 1 For example, if the neutral (N) conductor has multiple earths, the lower impedance of N compared
with phase conductors L 1 , L 2 , and L 3 could result in 50 % of the current flowing through the N conductor with
the remaining 50 % being shared by the other 3 phase conductors (17 % each). If N, L 1 , L 2 , and L 3 have the
same impedance, each conductor will carry approximately 25 % of the current.

· different transformer impedances can influence current sharing (this effect is negligible,
if the transformer is protected by SPDs bypassing its impedance);
· the relation between the conv entional earthing resistances of the transformer and the
items on the load side can influence current sharing (the lower the transformer
impedance, the higher is the surge current flowing into the low voltage system);
· parallel consumers cause a reduction of the effective impedance of the low voltage
system; this may increase the partial lightning current flowing into this system.
NOTE 2 Refer to Annex D of IEC 62305-4:2010 for more information.

E.3 Surges relevant to lines connected to the structure

E.3.1 Surges due to flashes to lines (source of damage S3)

For direct lightning flashes to connected lines, partitioning of the lightning current in both
directions of the line and the breakdown of insulation should be taken into account.

The selection of the I imp value can be based on values given in Tables E.2 and E.3 for low-
voltage systems and Table E.3 for telecommunication systems where the preferred v alues
of I imp are associated with the lightning protection level (LPL).

Table E.2 – Expected surge overcurrents due to lightning flashes

on low-voltage systems

Low-voltage systems

Direct and indirect flashes Flash near Flash to the

to the service the structure a structure a
LPL Source of damage S3 Source of damage S4 Source of damage S2 Source of damage S1
(class) (direct flash) b (indirect flash) c (induced current) (induced current)
Current shape: Current shape: Current shape: d Current shape: d
10/350 ms 8/20 ms 8/20 ms 8/20 ms
kA kA kA kA

III - IV 5 2,5 0,1 5

II 7,5 3,75 0,15 7,5

I 10 5 0,2 10

NOTE All values refer to each line conductor.

a
Loop conductors routing and distance from inducing current affect the values of expected surge overcurrents.
Values in Table E.2 refer to short-circuited, unshielded loop conductors with different routing in large buildings (loop
2
area in the order of 50 m , width = 5 m), 1 m apart from the structure wall, inside an unshielded structure or building
with LPS (k c = 0,5). For other loop and structure characteristics, values should be multiplied by factors K S1 , K S2 ,
K S3 (see Clause B.4 of IEC 62305-2:2010).
b
Values relevant to the case of the strike to the last pole of the line close to the consumer and multiconductor (three
phase + neutral) line.
c
Values referred to overhead lines. For buried lines values can be halved.
d
Loop inductance and resistance affect the shape of the induced current. W here the loop resistance is negligible, the
shape 10/350 ms should be assumed. This is the case where a switching type SPD is installed in the induced
circuit.

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Table E.3 – Expected surge overcurrents due to lightning flashes

on telecommunication systems

Telecommunication systems a

Direct and indirect flashes Flash near Flash to the

to the service the structure b structure b
LPL Source of damage S3 Source of damage S4 Source of damage S2 Source of damage S1
(class) (direct flash) c (indirect flash) d (induced current) (induced current)
Current shape: Current shape: Current shape Current shape:
10/350 ms 8/20 ms 8/20 ms 8/20ms
kA kA kA kA

III - IV 1 0,035 0,1 5

II 1,5 0,085 0,15 7,5

I 2 0,160 0,2 10

NOTE All values refer to each line conductor.

a [6]
Refer to ITU-T Recommendation K.67 for more information.
b
Loop conductors routing and distance from inducing current affect the values of expected surge overcurrents.
Values in Table E.3 refer to short-circuited, unshielded loop conductors with different routing in large buildings (loop
2
area in the order of 50 m , width = 5 m), 1 m apart from the structure wall, inside an unshielded structure or building
with LPS (k c = 0,5). For other loop and structure characteristics, values should be multiplied by factors K S1 , K S2 , K S3
(see Clause B.4 of IEC 62305-2:2010).
c
Values referred to unshielded lines with many pairs. For an unshielded drop wire, values could be 5 times higher.
d
Values referred to overhead unshielded lines. For buried lines values can be halved.

For shielded lines, the v alues of the ov ercurrents given in Table E.2 can be reduced by a
factor of 0,5.

NOTE It is assumed that the resistance of the shield is approximately equal to the resistance of all line conductors
in parallel.

E.3.2 Surges due to flashes near the lines (source of damage S4)

Surges from flashes near lines hav e energies much lower than those associated with
flashes to lines (source of damage S3).

Expected overcurrents, associated with a specific lightning protection level (LPL) are given
in Tables E.2 and E.3.

For shielded lines the values of overcurrents giv en in Tables E.2 and E.3 can be reduced by
a factor 0,5.

E.4 Surges due to induction effects (source of damage S1 or S2)

E.4.1 General

Surges due to induction effects from magnetic fields, generated either from nearby lightning
flashes (source S2) or from lightning current flowing in the external LPS or the spatial
shield of LPZ 1 (source S1) have a typical current shape of 8/20 ms. Such surges are to be
considered close to or at the terminal of apparatus inside LPZ 1 and at the boundary of LPZ
1/2.

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E.4.2 Surges inside an unshielded LPZ 1

Inside an unshielded LPZ 1 (e.g. protected only by an external LPS according to IEC 62305-
3 with mesh width greater than 5 m) relatively high surges are to be expected due to the
induction effects from the undamped magnetic field.

Expected overcurrents, associated with a specific lightning protection level (LPL) are given
in Tables E.2 and E.3.

E.4.3 Surges inside shielded LPZs

Inside LPZs with effective spatial shielding (requiring mesh width below 5 m according to
Annex A of IEC 62305-4:2011), the generation of surges due to induction effects from
magnetic fields is strongly reduced. In such cases the surges are much lower than those
giv en in E.4.2.

Inside LPZ 1 the induction effects are lower due to the damping effect of its spatial shield.

Inside LPZ 2 the surges are further reduced due to the cascaded effect of both spatial
shields of LPZ 1 and LPZ 2.

E.5 General information relating to SPDs

[7]
The use of SPDs depends on their withstand capability, classified in IEC 61643-1 for
[8]
power and in IEC 61643-21 for telecommunication systems.

SPDs to be used according to their installation position are as follows:

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a) At the line entrance into the structure (at the boundary of LPZ 1, e.g. at the main
distribution board MB):
· SPD tested with I imp (typical current shape 10/350), e.g. SPD tested according to
Class I;
· SPD tested with I n (typical current shape 8/20), e.g. SPD tested according to Class II.
b) Close to the apparatus to be protected (at the boundary of LPZ 2 and higher, e.g. at a
secondary distribution board SB, or at a socket outlet SA):
· SPD tested with I imp (typical current shape 10/350), e.g. SPD tested according to
Class I for power SPDs);
· SPD tested with I n (typical current shape 8/20), e.g. SPD tested according to Class
II);
· SPD tested with a combination wave (typical current current shape 8/20), e.g. SPD
tested according to Class III.

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Bibliography

[1] IEC 60664-1:2007, Insulation coordination for equipment within low-voltage systems –
Part 1: Principles, requirements and tests

[2] IEC 61000-4-5, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test

[3] BERGER K., ANDERSON R.B., KRÖNINGER H., Parameters of lightning flashes.
CIGRE Electra No 41 (1975), p. 23 – 37

[4] ANDERSON R.B., ERIKSSON A.J., Lightning parameters for engineering application.
CIGRE Electra No 69 (1980), p. 65 – 102

[5] IEEE working group report, Estimating lightning performance of transmission lines-
Analytical models. IEEE Transactions on Power Delivery, Volume 8, n. 3, July 1993

[6] ITU-T Recommendation K.67, Expected surges on telecommunications and signalling

networks due to lightning

[7] IEC 61643-1, Low-voltage surge protective devices – Part 1: Surge protective devices
connected to low-voltage power distribution systems – Requirements and tests

[8] IEC 61643-21 Low-voltage surge protective devices – Part 21: Surge protective
devices connected to telecommunications and signalling networks – Performance
requirements and testing methods

_____________

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