Module 4 - Microwave Semiconductor and Sources
Module 4 - Microwave Semiconductor and Sources
Module 4 - Microwave Semiconductor and Sources
MODULE 4 -MICROWAVE
SEMICONDUCTOR AND SOURCES
“Do not forsake wisdom, and she will protect you; love her, and she
will watch over you. Wisdom is supreme” Provbs 3:1
Microwave semiconductor devices and
sources
Semiconductor diodes and sources
Gunn diode
IMPACT –TRAPATT and BARITT diodes
PIN Diode
Tubes sources
Klystron
Magnetron
Semiconductor diodes and sources
• Gunn diode
• IMPACT –TRAPATT and BARITT
diodes
• PIN Diode
PIN Diode
PIN diode Structure:
PIN diode:
The structure of PIN diode consists of heavily doped P-
reign and heavily doped n-region separated by a
layer of highly resistive material that is nearly intrinsic.
The current in the i-layer depends on its length ‘W’, and
the injected electron concentration which in turn
depends on the forward bias. The effect of controlling
the current density on forward bias is known as
conductivity modulation. Electronically controlled PIN
diodes and their use amplitude modulation depends on
the phenomena of conductivity modulation.
The PIN diodes are also as microwave switches. The
performance of a switch depends on two
parameters, the insertion loss and isolation. Insertion
loss is the ratio (dB) of the power incident to the
power transmitted by the switch, when in ON
conduction. Isolation is measure of power
transmitted when the switch is in the OFF condition.
Pin diodes and control circuits
Pin diode V-I characters has a good RF switching element.
When reverse biased, a small series junction capacitance leads to
relatively high diode impedance.
In forward bias current removes the junction capacitance and leaves the
diode impedance, while a forward bias current removes the junction
capacitance and leaves the diode in low impedance state.
Series
Parallel
IL=1+[Zin-Z0/Zin+Zo]
Example:
Solution:
SPDT (single pole and double
through)
SPDT - Series switch
Gunn-Oscillation
The current waveform was produced by applying a voltage pulse of 59V and 10ns
Duration
• Drift velocity of electrons decrease when electric field excess certain value
• Threshold electric field about 3000V/cm for n-type GaAs.
The are two valley in the conduction band of Gunn diode:
J = e(µlnl+µunu)E (µu>µl)
σ = e(µlnl+µunu)
Gunn Oscillator:
Modes of Operation
Modes of operation
Approximate analytic solutions for the TRAPATT mode in p+ -n-n+ diodes have been
developed by Clorfeine et al. [8] and DeLoach [9] among others. These analyses have shown
that a high-field avalanche zone propagates through the diode and fills the depletion layer
with a dense plasma of electrons and holes that become trapped in the low-field region
behind the zone. A typical voltage waveform for the TRAPATT mode of an avalanche p+ -n-
n+ diode operating with an assumed squarewave current drive is shown in Fig. 8-3-1. At
point A the electric field is uniform throughout the sample and its magnitude is large but less
than the value required for avalanche breakdown.
where Es is the semiconductor dielectric permittivity of the diode. (8-3- l) At the instant of time at point A, the
diode current is turned on. Since the only charge carriers present are those caused by the thermal generation, the
diode initially charges up like a linear capacitor, driving the magnitude of the electric field above the breakdown
voltage. When a sufficient number of carriers is generated, the particle current exceeds the external current and
the electric field is depressed throughout the depletion region, causing the voltage to decrease. This portion of the
cycle is shown by the curve from point B to point C. During this time interval the electric field is sufficiently
large for the avalanche to continue, and a dense plasma of electrons and holes is created. As some of the electrons
and holes drift out of the ends of the depletion layer, the field is further depressed and "traps" the remaining
plasma. The voltage decreases to point D. A long time is required to remove the plasma because the total plasma
charge is large compared to the charge per unit time
BARITT DIODES
BARITT diodes, meaning barrier injected transit-time diodes, are the latest
addition to the family of active microwave diodes. They have long drift
regions similar to those of IMPATT diodes. The carriers traversing the drift
regions of BARITT diodes, however, are generated by minority carrier
injection from forward-biased junctions instead of being extracted from the
plasma of an avalanche region. Several different structures have been
operated as BARITT diodes, including p-n-p, p-n-v-p, p-n-metal, and
metal-n-metal. For a p-n-v-p BARITT diode, the forward-biased p-n
junction emits holes into the v region. These holes drift with saturation
velocity through the v region and are collected at the p contact. The diode
exhibits a negative resistance for transit angles between 1T and 27T. The
optimum transit angle is approximately 1.67r. Such diodes are much less
noisy than IMPATT diodes. Noise figures are as low as 15 dB at C-band
frequencies with silicon BARITT amplifiers. The major disadvantages of
BARITT diodes are relatively narrow bandwidth and power outputs
limited to a few milliwatts.
Principles of Operation
A crystal n-type silicon wafer with 11 H-cm resistivity and 4 x 1014 per cubic
centimeter doping is made of a 10-µm thin slice. Then then-type silicon wafer is
sandwiched between two PtSi Schottky barrier contacts of about 0.1 µm thickness.
A schematic diagram of a metal-n-metal structure is shown in Fig. 8-4-l(a). The
energy-band diagram at thermal equilibrium is shown in Fig. 8-4-l(b), where n1 and
n2 are the barrier heights for the metal-semiconductor contacts, re-
Part-II