Chap2 Lect02 Ate - FM
Chap2 Lect02 Ate - FM
Chap2 Lect02 Ate - FM
Agilent 83K
Advantest T6682
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Design Verification & Testing ATE CMPE 418
ALPG
Formatter
Pin Data
Selector PMUs
SCPG
Rate MDC UDC
Timing
Generator
generator
Test
SQPG CUT
controller PE
Timing
Memory
TTB
Waveform
Memory Power
Data fail Supplies
memory Digital
Compare
AFM
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Design Verification & Testing ATE CMPE 418
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Design Verification & Testing ATE CMPE 418
Response checking
Q Pulse train matching: ATE matches bits on 1 channel over 16 cycles or less.
Q Pattern matching mode: ATE matches multiple bits from CUT outputs.
Compares with expected output.
Result of compare can change the sequence of patterns in real time.
Frame processor
Synchronizes the CUT input stimuli (from pattern generators) with sample-and-com-
pare.
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Design Verification & Testing ATE CMPE 418
Test head and membrane (cobra) probe card for probing C4s.
Tester Power Supply
Test Head
Via PCB
Membrane
Probe Pad
Solder Ball (C4)
Multi Layer CUT
Supply Grid
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Design Verification & Testing ATE CMPE 418
Probing
Comparators
Switch Pin
Terminate at
DC Switch POGO pins
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Design Verification & Testing ATE CMPE 418
Probing
Wafer probe: POGO pins interface to Device Interface Board (DIB) and then a probe card.
Package test: POGO pins interface with a package handler and then to a testing socket.
(contactor)
Pins/Channels: ATE has between 128 and 1024 pins, expandable in units of 128.
Voltage Settings: VIH, VIL, VOH, VOL, IH, IL, VT (logic threshold voltage) and both
dynamic clamp voltages for each channel can be independently set.
Mixed-signal test
ATE has additional components including a waveform generator, a digitizer, digital
waveform capture memory, sine wave generator, etc.
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Design Verification & Testing ATE CMPE 418
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Design Verification & Testing ATE CMPE 418
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Design Verification & Testing ATE CMPE 418
Multi-Site Testing
One ATE can test several (usually identical) devices at the same time.
Can be done at wafer probe or package test.
Memory chips frequently tested 32 and 64 at a time because the test times are very long.
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