Review Wave Optics
Review Wave Optics
Review Wave Optics
Wave Optics
Wave Optics
Introduction
Interference
In destructive interference the amplitude of the resultant wave is less than that of
either individual wave.
All interference associated with light waves arises when the electromagnetic
fields that constitute the individual waves combine.
Constructive Interference
Destructive Interference
Young’s Double-Slit Experiment: Schematic
Section 37.1
Resulting Interference Pattern
The light from the two slits forms a
visible pattern on a screen.
The pattern consists of a series of
bright and dark parallel bands called
fringes.
Constructive interference occurs where
a bright fringe occurs.
Destructive interference results in a
dark fringe.
Interference Patterns
Section 37.1
Interference Patterns, 2
The lower wave has to travel farther
than the upper wave to reach point P.
The lower wave travels one wavelength
farther.
Therefore, the waves arrive in
phase
A second bright fringe occurs at this
position.
Interference Patterns, 3
The upper wave travels one-half of a
wavelength farther than the lower wave
to reach point R.
The trough of the upper wave overlaps
the crest of the lower wave.
This is destructive interference.
A dark fringe occurs.
Section 37.1
Conditions for Interference
To observe interference in light waves, the following two conditions must be met:
The sources must be coherent.
They must maintain a constant phase with respect to each other.
The sources should be monochromatic.
Monochromatic means they have a single wavelength.
Coherent Sources
Two sources are coherent if the waves they emit maintain a
constant phase relation.
Effectively, this means that the waves do not shift relative to one
another as time passes.
Lasers are coherent sources of light, while incandescent light bulbs
and fluorescent lamps are incoherent sources.
Producing Coherent Sources
The bright fringes in the interference pattern do not have sharp edges.
The equations developed give the location of only the centers of the bright
and dark fringes.
We can calculate the distribution of light intensity associated with the double-slit
interference pattern.
Assumptions:
The two slits represent coherent sources of sinusoidal waves.
The waves from the slits have the same angular frequency, ω.
The waves have a constant phase difference, φ.
The total magnitude of the electric field at any point on the screen is the
superposition of the two waves.
Intensity Distribution, Electric Fields
The phase difference between the two waves at P depends on their path
difference.
δ = r2 – r1 = d sin θ
A path difference of λ (for constructive interference) corresponds to a phase
difference of 2π rad.
A path difference of δ is the same fraction of λ as the phase difference φ is of 2π.
This gives
2π 2π
φ δ d sin θ
λ λ
Intensity Distribution, Resultant Field
The magnitude of the resultant electric field comes from the superposition
principle.
EP = E1+ E2 = Eo[sin ωt + sin (ωt + φ)]
This can also be expressed as
φ φ
EP 2Eo cos sin ωt
2 2
EP has the same frequency as the light at the slits.
The magnitude of the field is multiplied by the factor 2 cos (φ / 2).
Intensity Distribution, Equation
The expression for the intensity comes from the fact that the intensity of a wave
is proportional to the square of the resultant electric field magnitude at that point.
The intensity therefore is
πd sin θ 2 πd
I Imax cos2
max
I cos y ( small angles )
λ λL
Light Intensity, Graph
If the thin film is between two different media, one of lower index than the film
and one of higher index, the conditions for constructive and destructive
interference are reversed.
With different materials on either side of the film, you may have a situation in
which there is a 180o phase change at both surfaces or at neither surface.
Be sure to check both the path length and the phase change.
Interference in Thin Film, Soap Bubble Example
Michelson Interferometer
Albert Michelson (1852~1931)
the first American scientist to receive a Nobel
prize, invented the optical interferometer.
The Michelson interferometer has been
widely used for over a century to make
precise measurements of wavelengths and Albert
distances. Michelson
The Michelson Interferometer is a super instrument for measuring the
optical properties of a medium. E.g. refractive index, phase shifts,
visualization of interference.
The interferometer splits light into two parts and then recombines the
parts to form an interference pattern.
History
The interference condition for the two rays is determined by their path length
difference.
M1 is moveable.
As it moves, the fringe pattern collapses or expands, depending on the direction
M1 is moved.
The fringe pattern shifts by one-half fringe each time M1 is moved a distance λ/4.
The wavelength of the light is then measured by counting the number of fringe
shifts for a given displacement of M1.
Michelson Interferometer
Based on interference of waves
In-phase: constructive
Out-of-phase: destrictive
37
Michaelson Interferometer
Beam splitter
Stationary mirror
Moving mirror at constant velocity
He/Ne laser; sampling interval, control mirror velocity
38
Michelson interferometer
• Simplest interferometer
design
• Beamsplitter for dividing
the incoming IR beam into Moving
two parts mirror
39
Interference
• Electromagnetic (EM)
radiation can be
described as sine
destructive interference constructive interference
waves having definite A A
amplitude, frequency
and phase
• When EM-waves
interact, interference is A A
observed
• Depending on the
Interference signal Interference signal
relative phase of the
waves, interference is EM waves with same EM waves with same
amplitude and amplitude and
either destructive or frequency, out of phase frequency, in phase
(OPD = 0)
constructive
40
Mirror movement and interference of single wavelength beam
41
Photograph of the interference fringes
produced by a Michelson
interferometer.
42
Explanation:
Considering a single-frequency component from the IR
source reach the detector where the source is
monochromatic, such as a laser source.
Differences in the optical paths between the two split
beams are created by varying the relative position of
moving mirror to the fixed mirror.
If the two arms of the interferometer are of equal length,
the two split beams travel through the exact same
path length.
The two beams are totally in phase with each other;
thus, they interfere constructively and lead to a
maximum in the detector response.
This position of the moving mirror is called the point of
zero path difference (ZPD).
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When the moving mirror travels in either direction by the
distance l/4, the optical path (beamsplitter–mirror–
beamsplitter) is changed by 2 (l/4), or l/2.
The two beams are 180° out of phase with each other, and
thus interfere destructively.
As the moving mirror travels another l/4, the optical path
difference is now 2 (l/2), or l.
The two beams are again in phase with each other and result in
another constructive interference.
When the mirror is moved at a constant velocity, the intensity
of radiation reaching the detector varies in a sinusoidal
manner to produce the interferogram output.
The interferogram is the record of the interference signal.
It is actually a time domain spectrum and records the detector
response changes versus time within the mirror scan.
44
FTIR seminar
Movable mirror
Fixed mirror
A
Movable mirror
Same-phase interference
wave shape
-2l -l 0 l 2l
Fixed mirror Continuous phase shift
B
Signal strength
I
Movable mirror Opposite-phase (X)
interference
wave shape
Fixed mirror
C
Movable mirror
-2l -l 0 l 2l
Same-phase interference
0 l wave shape D Interference pattern of light
manifested by the optical-path
difference
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Michelson Interferometer – Applications
The Michelson interferometer was used to disprove the idea that the Earth moves
through an ether.
Modern applications include:
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Interferometer Gravitational-Wave Observatory (LIGO)
Section 37.6