"An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters."

Sheng-Hung Hsieh, Ming-Jun Hsiao, Tsin-Yuan Chang (2002)

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DOI: 10.1109/ATS.2002.1181722

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sheng-Hung Hsieh, Ming-Jun Hsiao, Tsin-Yuan Chang:
An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters. Asian Test Symposium 2002: 266-

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