"Circuit-level NBTI macro-models for collaborative reliability monitoring."

Basab Datta, Wayne P. Burleson (2010)

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DOI: 10.1145/1785481.1785586

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Basab Datta, Wayne P. Burleson:
Circuit-level NBTI macro-models for collaborative reliability monitoring. ACM Great Lakes Symposium on VLSI 2010: 453-458

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