"SI-SMART: Functional test generation for RTL circuits using loop ..."

Prateek Puri, Michael S. Hsiao (2015)

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DOI: 10.1109/ICCD.2015.7357082

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Prateek Puri, Michael S. Hsiao:
SI-SMART: Functional test generation for RTL circuits using loop abstraction and learning recurrence relationships. ICCD 2015: 38-45

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