"Worst-case delay analysis considering the variability of transistors and ..."

Takayuki Fukuoka, Akira Tsuchiya, Hidetoshi Onodera (2007)

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DOI: 10.1145/1231996.1232006

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Takayuki Fukuoka, Akira Tsuchiya, Hidetoshi Onodera:
Worst-case delay analysis considering the variability of transistors and interconnects. ISPD 2007: 35-42

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