"Low-capture-power test generation for scan-based at-speed testing."

Xiaoqing Wen et al. (2005)

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DOI: 10.1109/TEST.2005.1584068

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita:
Low-capture-power test generation for scan-based at-speed testing. ITC 2005: 10

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