"Gate-oxide early-life failure identification using delay shifts."

Young Moon Kim et al. (2010)

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DOI: 10.1109/VTS.2010.5469615

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-02

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Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra:
Gate-oxide early-life failure identification using delay shifts. VTS 2010: 69-74

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