"Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA ..."

Wen-Yu Lo, Ming-Dou Ker (2003)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(03)00278-6

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LoK03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LoK03
Wen-Yu Lo, Ming-Dou Ker:
Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC. Microelectron. Reliab. 43(9-11): 1583-1588 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.