"XID: Don't care identification of test patterns for combinational circuits."

Kohei Miyase, Seiji Kajihara (2004)

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DOI: 10.1109/TCAD.2003.822103

access: closed

type: Journal Article

metadata version: 2020-09-24

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Kohei Miyase, Seiji Kajihara:
XID: Don't care identification of test patterns for combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(2): 321-326 (2004)

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