"Combining Low-Power Scan Testing and Test Data Compression for ..."

Anshuman Chandra, Krishnendu Chakrabarty (2001)

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DOI: 10.1145/378239.378396

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Anshuman Chandra, Krishnendu Chakrabarty:
Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. DAC 2001: 166-169

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