"Reduction of SOC test data volume, scan power and testing time using ..."

Anshuman Chandra, Krishnendu Chakrabarty (2002)

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DOI: 10.1145/513918.514090

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Anshuman Chandra, Krishnendu Chakrabarty:
Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. DAC 2002: 673-678

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