FISIKA DASAR - FTI UMI - Pertemuan 10 - Gelombang Elektromagnetik

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(FISIKA DASAR - 3 SKS)

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T.

Program Studi Teknik Pertambangan


Fakultas Teknologi Industri
Universitas Muslim Indonesia
1st Semester – 2020/2021
GELOMBANG ELEKTROMAGNETIK

▪ Gelombang Elektromagnetik (GEM) adalah gelombang


yang tidak memerlukan medium untuk merambat

▪ Pembahasan mengenai GEM :


• Teori Maxwell mengenai GEM
• Sifat GEM & Spektrum GEM
• Intensitas GEM
• Radiasi Kalor

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
Teori Maxwell tentang GEM

• Hipotesa Maxwell: Perubahan medan magnetik dapat menimbulkan medan


listrik, demikian juga sebaliknya perubahan medan listrik akan menimbulkan
medan magnetik
• Cepat rambat GEM oleh Maxwell,
c = 1/ √ εo μo
εo = permitivitas hampa = 8,85.10-12 C2/Nm2
μo = permeabilitas hampa = 1,25.10-6 Tm/A
diperolehlah : c = 3.108 m/s
• Medan Listrik maksimum EM dan Medan Magnet maksimum BM saling tegak
lurus, yang mana keduanya juga tegak lurus terhadap arah menjalarnya
gelombang.
• EM dan BM dihubungkan oleh EM = c.BM

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
Sifat GEM

▪ dapat mengalami pemantulan, pembiasan, interferensi, difraksi,


& polarisasi

▪ dapat merambat dalam ruang hampa

▪ tidak dapat dipengaruhi medan listrik atau medan magnetik

▪ merupakan gelombang transversal

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
Spektrum GEM

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
Intensitas GEM

• Intensitas gelombang elektromagnetik adalah energi rata-rata


persatuan waktu persatuan luas
• Persamaan intensitas GEM,
S = EM.BM / 2μo
S = intensitas GEM , W/m2
EM = medan listrik maksimum, N/C
BM = medan magnet maksimum, T
μo = permeabilitas magnet
= 1,25.10-6 Tm/A

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
Radiasi Kalor

• Benda menyerap energi = memancarkan energi


• Stefan-Boltzman menemukan jumlah energi persatuan waktu persatuan
luas sebanding dengan pangkat empat suhu mutlaknya
• W = P/A = e δ T4
W = energi radiasi pancar, W/m2
P = daya yang dipancarkan, watt
A = luas permukaan benda, m2
e = 1 , emisivitas bila benda hitam sempurna
δ = tetapan Boltzman = 5,67.10 -8 W/m2K4
T = suhu mutlak, K

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
TERIMA KASIH

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T.


Jurusan Teknik Pertambangan
Fakultas Teknologi Industri
Universitas Muslim Indonesia
Jl. Urip Sumoharjo km 5
Makassar 90231

HP : +62 (0) 853 96 47 41 12


E-Mail : [email protected] ; [email protected]

Ir. Sitti Ratmi Nurhawaisyah, S.T., M.T. 2020 3KK104 – Fisika Dasar
X-RAY FLUORESCENCE (XRF)
Analysis of ores and minerals

© Malvern Panalytical 2017


WHAT IS XRF ?

X-Ray Fluorescence (XRF) is an analytical method to determine the elemental


composition of all kinds of materials.
The materials that can be analyzed are e.g.
• Solids
• Liquids
• Powders
• Filters
• Thin films etc.
XRF can also sometimes be used to determine the thickness and
composition of layers and coatings.

© Malvern Panalytical 2017


WHAT IS XRF ?
XRF is fast, accurate, non-destructive and usually requires minimum sample
preparation.

Applications are very broad and include the metal, cement,


oil, polymer, plastic, food, soils, rocks & minerals, environmental and waste
materials.

Spectrometer systems can be divided into two main groups: Wavelength


Dispersive systems (WD-XRF) and Energy Dispersive systems (ED-XRF)

© Malvern Panalytical 2017


Elemental Analysis

TYPE OF XRF

EDXRF Epsilon 1 EDXRF Epsilon 4 WDXRF Zetium WDXRF Axios Fast

© Malvern Panalytical 2017


EPSILON 4
Technical specifications

Epsilon 4 Epsilon 4
10W 15W
Max power (Watt) 10 15
Max current (mA) 2 3
Max excitation (kV) 50 30 50
SDD detector area
10 mm2 Be 30 mm2 Be SDDultra
(mm2) + window
Elemental range F – Am F – Am C – Am
Max input count
1500 1500
rate (kcps)

15 Title of the presentation © Malvern Panalytical 2017 09 July 2020


X-RAY DIFFRACTION (XRD)
Analysis of ores and minerals

© Malvern Panalytical 2017


ANALYTICAL TECHNIQUES
Elements and minerals

Wet chemistry

XRF

Fe SiO2 Al2O3 MgO CaO S


1 26.5 22.2 0.4 17.9 2.1 4.0
Neutron analysis 2 57.9 6.1 0.8 3.9 1.9 4.9
3 34.5 23.1 2.0 12.5 4.4 2.1 Elements

100%
XRD 90%
Pyr
Mag
80%

NIR 70%
Dio
Minerals
60% Tre

50% Cal
Qua
Process
Electron microprobe 40%
30% Sca patameters
Alb
20%
Tal
MLA, QEMSCAN 10%
Liz
0%
1 2 3 4 5 6 7 8 9 10 11

Microscopy
29 © Malvern Panalytical 2017
PHASE ANALYSES

lab-based portable on-line

X-rays Near-infrared
multi-purpose XRD

Halo

QualitySpec

powder XRD
Thin film metrology
TerraSpec

© Malvern Panalytical 2017


X-RAY DIFFRACTION
(XRD)
TECHNIQUE

© Malvern Panalytical 2017


X-RAY DIFFRACTION
How does it work ?

• Identification and quantification of crystalline phases and amorphous content


• Monitoring of process parameters

18 Title of the presentation © Malvern Panalytical 2017 09 July 2020


CRYSTALLOGRAPHY
Crystal structure

c
b 


a a b c - side
   - angles

19 Title of the presentation © Malvern Panalytical 2017 09 July 2020


CRYSTALLOGRAPHY
Lattice planes
c

b
a
d100 d200

(100) (200) (110)

(110) (111) (102)

20 Title of the presentation © Malvern Panalytical 2017 09 July 2020


HOW DOES XRD EXPERIMENT WORK?

X-ray tube detector


I

2
© Malvern Panalytical 2017
HOW DOES XRD EXPERIMENT WORK?

I Lattice planes 1

n = 2dsin

2d

© Malvern Panalytical 2017


HOW DOES XRD EXPERIMENT WORK?

I Lattice planes 2

n = 2dsin

2d

© Malvern Panalytical 2017


HOW DOES XRD EXPERIMENT WORK?

I Lattice planes 3

n = 2dsin

2d

© Malvern Panalytical 2017


XRD PATTERN
Difratograma
Counts

1) CsCl

0 11
2000

1500

1 12
1000

0 01
500

0 12
0 02
1 11
0
300
200
100
0
-100
-200
-300
20 30 40 50
º2Thet
º2Theta
a

39 Title of the presentation © Malvern Panalytical 2017 09 July 2020


WHAT CAN WE LEARN FROM XRD PATTERN?

Phase composition

Amorphous content
width
Crystallite size/microstrain

Structural information
Peak position
Process parameters

Solutions for automotive © Malvern Panalytical 2017 7/9/2020


X-RAY DIFFRACTION
Data evaluation

Counts

40000 Barite 22.9 %


Hematite, syn 21.8 %
Quartz 5.9 %
Goethite 29.7 %
fluorapatite, syn 5.3 %
Synchysite-(Ce) 2.7 %
30000
Duplicated_Barite 11.6 %

20000

10000

0
10 20 30 40 50 60
Position [°2Theta] (Copper (Cu))

6000
4000
2000
0
-2000
-4000
-6000

41 Title of the presentation © Malvern Panalytical 2017 09 July 2020

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