This article aims to provide a survey of modeling and simulation of single-event effects
(SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the …

In this article, a novel machine learning regression-based single-event transient (SET)
modeling method is proposed. The proposed method can obtain a reasonable and accurate …

In this paper, a physics-based bias-dependent model of single-event transients (SETs) in
double-gate (DG) MOSFET suitable for circuit simulation is presented. The existing …

With the emergence of various battery operated technologies in different computing domains
and the challenge of heating in such technologies, the issue of energy dissipation has …

Static random‐access memory (SRAM) is a cornerstone in modern microprocessors
architecture, as it has high power consumption, large area, and high complexity. Also, the …

With the development of technology, the vulnerability of integrated circuits to Single Event
Effect (SEE) increases, and the sensitivity of flip-flops to soft errors induced by Single Event …

A circuit design methodology for space applications is presented with an 8-bit resistive
digital-to-analog converter (DAC) with XY addressing mode and BiCMOS buffer designed in …

With the rapid development of semiconductor technology, the reduction in device operating
voltage and threshold voltage has made integrated circuits more susceptible to the effects of …

In this paper, a single-event transient model based on the effective space charge for
MOSFETs is proposed. The physical process of deposited and moving charges is analyzed …

In this work, a single-event transient tolerant optical receiver using triple modular
redundancy (TMR) is presented. The TMR method splits a conventional receiver into three …