Recent advances in SAT-based ATPG: Non-standard fault models, multi constraints and optimization

B Becker, R Drechsler, S Eggersglüß… - 2014 9th IEEE …, 2014 - ieeexplore.ieee.org
… enabling applications far beyond classical ATPG. … we present the conditional multiple-stuck-at
fault model (CMS@) … SATbased test cube minimization and then turn to test compaction. …

SAT-ATPG using preferences for improved detection of complex defect mechanisms

A Czutro, M Sauer, T Schubert, I Polian… - … IEEE 30th VLSI Test …, 2012 - ieeexplore.ieee.org
… a SAT-based ATPGtool that supports the enhanced conditional multiple-stuck-at fault model
… used to express defect behaviour that lies beyond the expression capability of the ECMS@ …

Non-clausal SAT and ATPG

R Drechsler, T Junttila, I Niemelä - Handbook of satisfiability, 2021 - ebooks.iospress.nl
… In this chapter we survey satisfiability checking methods that … In the following we describe a
SAT-based ATPG tool that … from ISCAS89 and consider single stuck-at faults. But this time we …

SAT-based ATPG for reversible circuits

H Zhang, R Wille, R Drechsler - … International Design and Test …, 2010 - ieeexplore.ieee.org
… Later, it was shown that the validity of stuck-at fault model is limited for reversible … SAT-based
ATPG should be applied to further fault models as well as additional constraints beyond

Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG

P Raiola, J Burchard, F Neubauer, D Erb… - … of Electronic Testing, 2017 - Springer
… focus on the two widely used fault models stuck-at [16] and … For the experiments we focus
on the stuck-at fault model, as … beyond simple Boolean logic and toward more complex fault

[PDF][PDF] Applying advanced SAT-based techniques to circuit testing

J Burchard - 2018 - freidok.uni-freiburg.de
… and the proposed algorithm has a clear benefit beyond the current state-of-the art. … by the
SAT-based ATPG algorithms developed for this thesis. For stuck-at faults the faulty line is split …

Diagnostic test generation for transition delay faults using stuck-at fault detection tools

Y Zhang, B Zhang, VD Agrawal - Journal of Electronic Testing, 2014 - Springer
… , we construct a single stuck-at fault ATPG model as shown in Fig. 3. The circuit of Fig. …
generation and a comprehensive compaction of exclusive test patterns is beyond the scope of this …

Structural heuristics for SAT-based ATPG

D Tille, S Eggersglüß, HM Le… - 2009 17th IFIP …, 2009 - ieeexplore.ieee.org
… In this work, the stuck-at fault model [6] is used. To generate a test pattern for a stuck-at fault,
Beyond that limit, instances will be divided into classes based on the number of variables …

Evaluating the effectiveness of D-chains in SAT-based ATPG

J Burchard, F Neubauer, P Raiola… - … Latin American Test …, 2017 - ieeexplore.ieee.org
… , we analyze the two widely used fault models stuck-at [19] and … the inverse of the stuck-at
fault (to ‘1’ for a stuck-at-0 and vice-… beyond simple Boolean logic and towards more complex …

[PDF][PDF] Formal Methods for Test and Reliability

N Deligiannis - 2024 - tesidottorato.depositolegale.it
… While considering permanent hardware faults (stuck-at), we … We assume a stuck-at fault is
present in the output of the D … states during, eg, an SAT-based ATPG process. In the methods …