Irfz 24 N
Irfz 24 N
IRFZ24N
HEXFET Power MOSFET
l l l l l
Advanced Process Technology Dynamic dv/dt Rating 175C Operating Temperature Fast Switching Fully Avalanche Rated
VDSS = 55V
G S
Description
Fifth Generation HEXFET power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. The TO-220 package is universally preferred for all commercial-industrial applications at power dissipation levels to approximately 50 watts. The low thermal resistance and low package cost of the TO-220 contribute to its wide acceptance throughout the industry.
TO-220AB
Max.
17 12 68 45 0.30 20 71 10 4.5 5.0 -55 to + 175 300 (1.6mm from case) 10 lbfin (1.1Nm)
Units
A W W/C V mJ A mJ V/ns C
Thermal Resistance
Parameter
RJC RCS RJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient
Min.
Typ.
0.50
Max.
3.3 62
Units
C/W
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1
9/13/99
IRFZ24N
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
V(BR)DSS
V(BR)DSS/TJ
RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD LS Ciss Coss Crss
Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance
Max. Units Conditions V VGS = 0V, ID = 250A V/C Reference to 25C, ID = 1mA 0.07 VGS = 10V, ID = 10A 4.0 V VDS = VGS, ID = 250A S VDS = 25V, ID = 10A 25 VDS = 55V, VGS = 0V A 250 VDS = 44V, VGS = 0V, TJ = 150C 100 VGS = 20V nA -100 VGS = -20V 20 ID = 10A 5.3 nC VDS = 44V 7.6 VGS = 10V, See Fig. 6 and 13 VDD = 28V ID = 10A ns RG = 24 RD = 2.6, See Fig. 10 Between lead, 4.5 6mm (0.25in.) nH from package 7.5 and center of die contact 370 VGS = 0V 140 pF VDS = 25V 65 = 1.0MHz, See Fig. 5
VSD trr Q rr
Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge
Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25C, IS = 10A, VGS = 0V TJ = 25C, IF = 10A di/dt = 100A/s
G S
Notes:
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IRFZ24N
100
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
100
10
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
10
4 .5V
4.5V 20 s P U LS E W ID TH TC = 2 5C
0.1 1 10 100
1 0.1 1
2 0 s P U L S E W ID T H T C = 17 5C
10 100
100
3.0
I D = 1 7A
2.5
TJ = 2 5 C T J = 1 7 5 C
2.0
10
1.5
1.0
0.5
1 4 5 6 7
V DS = 2 5V 2 0 s P U L S E W ID TH
8 9 10
V G S = 10 V
T J , Junction T em perature (C )
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IRFZ24N
700
600
C , Capacitance (pF)
500
C iss
400
C oss
300
V GS C is s C rs s C o ss
= = = =
0V , f = 1M H z C g s + C g d , Cd s S H O R T E D C gd C d s + C gd
20
I D = 10 A V D S = 44 V V D S = 28 V
16
12
200
C rss
100
0 1 10 100
0 0 4 8
FO R TE S T C IR C U IT S E E FIG U R E 1 3
12 16 20
100
1000
O P E R A TIO N IN TH IS A R E A L IM ITE D B Y R D S (o n)
T J = 1 75 C TJ = 25 C
10
I D , Drain C urrent (A )
100 10 s
10
100 s
V G S = 0V
1.8
1 1
T C = 25 C T J = 17 5C S ing le P u lse
10
1m s 10m s 100
2.0
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IRFZ24N
VDS
20
RD
VGS RG
16
D.U.T.
+
I D , D rain C u rren t (A m ps )
- VDD
10V
12 Pulse Width 1 s Duty Factor 0.1 %
90%
A
175
TC , C ase T em perature (C )
10% VGS
td(on) tr t d(off) tf
T h erm a l R e s p o n s e (Z th JC )
D = 0.5 0
1
0.1
1 t2
/t
0.01 0.00001
2 . P e a k T J = P D M x Z th J C + T C
A
1
0.0001
0.001
0.01
0.1
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IRFZ24N
L
VDS D.U.T. RG + V - DD
10 V
140
TO P
120
B O TTO M
100
ID 4.2 A 7.2A 1 0A
IAS tp
0.01
80
60
40
20
V D D = 25 V
25 50 75 100 125 150
A
175
IAS
50K
QG
12V
.2F
.3F
10 V
QGS VG QGD
VGS
3mA
D.U.T.
+ V - DS
Charge
IG
ID
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IRFZ24N
Peak Diode Recovery dv/dt Test Circuit
D.U.T
Circuit Layout Considerations Low Stray Inductance Ground Plane Low Leakage Inductance Current Transformer
RG dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test
+ VDD
D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt
VDD
Body Diode
Forward Drop
Ripple 5%
ISD
* VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET power MOSFETs
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IRFZ24N
Package Outline
TO-220AB Dimensions are shown in millimeters (inches)
2.87 (.11 3) 2.62 (.10 3) 10 .54 (.4 15) 10 .29 (.4 05) 3 .7 8 (.149 ) 3 .5 4 (.139 ) -A 6.47 (.25 5) 6.10 (.24 0) -B 4.69 ( .18 5 ) 4.20 ( .16 5 ) 1 .32 (.05 2) 1 .22 (.04 8)
1.15 (.04 5) M IN 1 2 3
L E A D A S S IG NM E NT S 1 - GATE 2 - D R A IN 3 - S O U RC E 4 - D R A IN
3X 3X 1 .4 0 (.0 55 ) 1 .1 5 (.0 45 )
3X
0 .3 6 (.01 4)
D A TE C O D E (Y Y W W ) YY = YEAR W W = W EEK
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936 http://www.irf.com/ Data and specifications subject to change without notice. 9/99
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Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/